摘要:
The invention relates to a measuring device for thread-like test samples (3), comprising a measuring slit (2) exhibiting measuring areas (6, 7) for measuring characteristics of a test sample which moves longitudinally, said measuring areas being associated to a measuring device. A coating (8) made of an abrasion-resistant material is applied over the whole measuring slit and its measuring areas (6, 7) in order to define more freely the dimensions of said measuring slit and especially to obtain a narrower measuring slit.
摘要:
A method is disclosed for correcting transfer errors of an analog amplifier that occur following a jump in the amplifier input signal caused by switching. A measuring device includes at least one sensor as well as a signal-processing unit connected to the sensor and analog amplifier. The signal-processing unit includes at least one modulator and/or a multiplexer, an analog amplifier and at least one processing stage following the analog amplifier in the circuit chain. The processing stage, dependent on the point in time when the switching jump occurs, is separated from the latter during a predetermined timeout phase duration by means of a switch that is arranged between the analog amplifier and the processing stage and is controlled by a timeout controller, and/or dependent on the point in time when the switching jump occurs, said processing stage is blocked by a timeout controller during a predetermined timeout phase duration.
摘要:
A method and apparatus for cutting yarn (9) on a textile machine having a blade (6) which is supplied with kinetic energy via a drive (2, 3, 4). To be able to generate at all times a sufficient yet not excessive cutting power the kinetic energy is delivered in doses and rated in accordance with properties of the yarn and/or device. The drive thus comprises a device (14) for rating the kinetic energy of the blade.
摘要:
The invention relates to a yarn sensor for scanning a yarn (2), which is moving in its longitudinal direction in a measuring gap (3), with a light beam from a light source (4), having a first receiver (7) for directly transmitted light, at least one second receiver (5, 6) for light reflected by the yarn and one element each (8, 9, 10, 11) for transmitting the light between the measuring gap, the light source and a receiver. To keep the overall size and the external dimensions as small as possible, the optical axes (12-15) of the elements for transmitting the light are disposed together in one plane lying at least approximately at right angles to the yarn.
摘要:
A multiple force-measuring device, especially a multiple weighing device has at least two force-measuring modules. Each force-measuring module includes a force-measuring cell and a power delivery means. The power delivery means of at least one of the force-measuring modules in this arrangement is connected, directly or through a junction element, to a control cable that is connected to a power supply unit. The force-measuring modules are connected directly to each other through a module-connection cable that transfers electrical power therebetween.
摘要:
A method is disclosed for correcting transfer errors of an analog amplifier that occur following a jump in the amplifier input signal caused by switching. A measuring device includes at least one sensor as well as a signal-processing unit connected to the sensor and analog amplifier. The signal-processing unit includes at least one modulator and/or a multiplexer, an analog amplifier and at least one processing stage following the analog amplifier in the circuit chain. The processing stage, dependent on the point in time when the switching jump occurs, is separated from the latter during a predetermined timeout phase duration by means of a switch that is arranged between the analog amplifier and the processing stage and is controlled by a timeout controller, and/or dependent on the point in time when the switching jump occurs, said processing stage is blocked by a timeout controller during a predetermined timeout phase duration.
摘要:
A force-measuring device (100) with at least one housing (20) has an interior space and at least one force-measuring cell (110) installed therein. At least one parameter characterizing an existing high-frequency electromagnetic field is determined by a sensor (50) arranged in the interior space or a sensor arranged outside of the housing, the sensor being adapted for detecting high-frequency electromagnetic fields. After an electromagnetic field is detected and compared to a threshold value, a response action of the force-measuring device is triggered if the detected parameter value exceeds the threshold value.
摘要:
A modular force-measuring cell is disclosed which includes a force transducer equipped with sensors that measure changes occurring in the state of the force transducer as a result of a force or temperature. The force-measuring cell also includes a memory module for storing compensation data associated with the modular force-measuring cell. The memory module and at least one converter circuit for the conversion of the signals delivered by the sensors are arranged in a circuit module that is mechanically and thermally coupled to the force transducer.
摘要:
A multiple force-measuring device, especially a multiple weighing device has at least two force-measuring modules. Each force-measuring module includes a force-measuring cell and a power delivery means. The power delivery means of at least one of the force-measuring modules in this arrangement is connected, directly or through a junction element, to a control cable that is connected to a power supply unit. The force-measuring modules are connected directly to each other through a module-connection cable that transfers electrical power therebetween.
摘要:
An electrical circuit to minimize the damage to internal electronics in the event of a lightning strike or power surge that may flow into the unit through the home run cable used to supply power to device loads, for example load cells and weigh terminals. The circuitry can not only protect, but it can also detect and distinguish from several overvoltage and undervoltage conditions that can occur.