摘要:
A non-volatile memory device includes a word line voltage generator circuit for generating a word line voltage to be supplied to a selected row in response to step control signals and a program controller for sequentially activating the step control signals during a program cycle. During the program cycle, the word line voltage generator circuit controls the increment of the word line voltage differently according to the mode of operation, namely, a test mode or a normal mode. Thus test time can be shortened.
摘要:
A method for programming multi-level non-volatile memory. A plurality of multi-bit storage cells capable of storing different levels of charge usable to represent data represented by a least significant bits (LSBs) and a most significant bits (MSBs) are programmed first with LSBs and then with MSBs. The programmed storage cells have a threshold voltage lower than a voltage VR1 to store a first value, greater than VR1 and lower than a voltage VR2 to store a second value, and greater than VR2 and lower than a voltage VR3 to store a third value. Each of the cells has a threshold voltage greater than a voltage VR3 when it is desired that the storage cell store a fourth value. VR1 is less than VR2 which is less than VR3. The flag cell is programmed to have a threshold voltage greater than VR3 to indicate that the MSBs have been programmed.
摘要:
Flash memory devices include a memory array having a plurality of NAND strings of EEPROM cells therein. A word line driver is provided to improve programming efficiency. The word line driver is electrically coupled to the memory array by a plurality of word lines. The word line driver includes a plurality of pass voltage switches. These switches have outputs electrically coupled by diodes to the plurality of word lines. Methods of programming flash memory devices include applying a pass voltage to a plurality of unselected word lines in a non-volatile memory array while simultaneously applying a sequentially ramped program voltage to a selected word line in the non-volatile memory array. The sequentially ramped program voltage has a minimum value that is clamped by a word line driver to a level not less than a value of the pass voltage.
摘要:
Flash memory devices include a memory array having a plurality of NAND strings of EEPROM cells therein. A word line driver is provided to improve programming efficiency. The word line driver is electrically coupled to the memory array by a plurality of word lines. The word line driver includes a plurality of pass voltage switches. These switches have outputs electrically coupled by diodes to the plurality of word lines. Methods of programming flash memory devices include applying a pass voltage to a plurality of unselected word lines in a non-volatile memory array while simultaneously applying a sequentially ramped program voltage to a selected word line in the non-volatile memory array. The sequentially ramped program voltage has a minimum value that is clamped by a word line driver to a level not less than a value of the pass voltage.
摘要:
Flash memory devices include a memory array having a plurality of NAND strings of EEPROM cells therein. A word line driver is provided to improve programming efficiency. The word line driver is electrically coupled to the memory array by a plurality of word lines. The word line driver includes a plurality of pass voltage switches. These switches have outputs electrically coupled by diodes to the plurality of word lines. Methods of programming flash memory devices include applying a pass voltage to a plurality of unselected word lines in a non-volatile memory array while simultaneously applying a sequentially ramped program voltage to a selected word line in the non-volatile memory array. The sequentially ramped program voltage has a minimum value that is clamped by a word line driver to a level not less than a value of the pass voltage.
摘要:
Disclosed is a voltage dividing circuit reducing effects of a parasitic capacitance and a wordline voltage generating circuit including that. The voltage dividing circuit according to an aspect of the present invention includes a first resistor, a plurality of second resistors, and a selection means. The first resistor is connected between an output voltage node and a dividing voltage node. The plurality of second resistors are connectable between the dividing voltage node and a ground. The second resistors are sequentially selected in response to a step control signal and connected to ground. In order to reduce the sum of a parasitic capacitance existing in the second resistors, the resistors are arranged in groups, and the selection means connects only that group that contains a selected resistor to the dividing voltage node.
摘要:
A non-volatile memory device includes a word line voltage generator circuit for generating a word line voltage to be supplied to a selected row in response to step control signals, and a program controller for generating the step control signals so that an increment of the word line voltage is varied according to the mode of operation, namely, a test mode or normal mode. Thus test time can be shortened.
摘要:
Flash memory devices include a memory array having a plurality of NAND strings of EEPROM cells therein. A word line driver is provided to improve programming efficiency. The word line driver is electrically coupled to the memory array by a plurality of word lines. The word line driver includes a plurality of pass voltage switches. These switches have outputs electrically coupled by diodes to the plurality of word lines. Methods of programming flash memory devices include applying a pass voltage to a plurality of unselected word lines in a non-volatile memory array while simultaneously applying a sequentially ramped program voltage to a selected word line in the non-volatile memory array. The sequentially ramped program voltage has a minimum value that is clamped by a word line driver to a level not less than a value of the pass voltage.
摘要:
A non-volatile memory device includes a word line voltage generator circuit for generating a word line voltage to be supplied to a selected row in response to step control signals and a program controller for sequentially activating the step control signals during a program cycle. During the program cycle, the word line voltage generator circuit controls the increment of the word line voltage differently according to the mode of operation, namely, a test mode or a normal mode. Thus test time can be shortened.
摘要:
A method for programming multi-level non-volatile memory including at least one flag cell and a plurality of multi-bit storage cells. Each storage cell stores data of a least significant bit (LSB) and a most significant bit (MSB). The cells are programmed with LSB data such that programmed storage cells have a threshold voltage greater than VR1. The threshold voltage is modified to have a threshold voltage greater than VR2 for a third or fourth value. The cells are programmed with MSB data for a threshold voltage lower than a VR1 for a first value greater than VR1 and lower than VR2 for a second value, greater than VR2 and lower than VR3 for a third value, and greater than VR3 for a fourth value. VR1 is less than VR2 which is less than VR3. The flag cell is programmed to signal whether MSB data has been programmed.