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1.发明授权
公开(公告)号：US5982656A
公开(公告)日：1999-11-09
申请号：US813767
申请日：1997-03-07
申请人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
发明人： Douglas J. Cutter , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
摘要： Method and apparatus are disclosed for checking the resistance of programmable circuits in an integrated circuit where each programmable circuit includes a programmable element, such as an antifuse. A precharged node is connected to the programmable element and the voltage at the node discharges based on the resistance of the programmable element. An output signal is produced whose binary value is based on the voltage at the node after a sufficient time has elapsed to allow the initial voltage to discharge based on the resistance of the programmable element.
摘要翻译： 公开了用于检查集成电路中的可编程电路的电阻的方法和装置，其中每个可编程电路包括诸如反熔丝的可编程元件。 预充电节点连接到可编程元件，并且节点处的电压基于可编程元件的电阻而放电。 产生输出信号，其二进制值基于经过足够时间之后的节点处的电压，以允许初始电压基于可编程元件的电阻放电。
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2.发明授权公开(公告)号：US06185705B2
公开(公告)日：2001-02-06
申请号：US08813525
申请日：1997-03-07
申请人： Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
发明人： Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
IPC分类号： G11C2900
CPC分类号： G11C17/18
摘要： Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
摘要翻译： 公开了用于检查集成电路中的反熔丝元件的电阻的方法和装置。 将基于反熔丝元件的电阻的电压与基于已知电阻的电压进行比较，并且生成其二进制值表示反熔丝元件的电阻是否高于或低于已知电阻值的输出信号。 该方法和装置在验证反熔丝元件的编程方面是有用的。
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3.发明授权公开(公告)号：US06983404B2
公开(公告)日：2006-01-03
申请号：US09777036
申请日：2001-02-05
申请人： Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
发明人： Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
IPC分类号： G11C29/00
CPC分类号： G11C17/18
摘要： Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
摘要翻译： 公开了用于检查集成电路中的反熔丝元件的电阻的方法和装置。 将基于反熔丝元件的电阻的电压与基于已知电阻的电压进行比较，并且生成其二进制值表示反熔丝元件的电阻是否高于或低于已知电阻值的输出信号。 该方法和装置在验证反熔丝元件的编程方面是有用的。
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公开(公告)号：US6154410A
公开(公告)日：2000-11-28
申请号：US795531
申请日：1997-02-05
申请人： Douglas J. Cutter , Kurt D. Beigel , Adrian E. Ong , Fan Ho , Patrick J. Mullarkey , Dien Luong , Brett Debenham , Kim Pierce
发明人： Douglas J. Cutter , Kurt D. Beigel , Adrian E. Ong , Fan Ho , Patrick J. Mullarkey , Dien Luong , Brett Debenham , Kim Pierce
CPC分类号： G11C17/18
摘要： Method and apparatus are disclosed for reducing antifuse programming time by connecting the programming voltage to the electrode of the antifuse element that has roughened polysilicon.
摘要翻译： 公开了通过将编程电压连接到具有粗糙多晶硅的反熔丝元件的电极来减少反熔丝编程时间的方法和装置。
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5.发明授权公开(公告)号：US06365421B2
公开(公告)日：2002-04-02
申请号：US09531023
申请日：2000-03-20
申请人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
发明人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
IPC分类号： H01L2166
CPC分类号： H01L27/112 , G01R31/31702 , G01R31/3181 , G11C17/10 , G11C17/18
摘要： An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.
摘要翻译： 集成电路存储器件具有多个非易失性可编程元件，用于在测试序列中存储所选择的里程碑处的通过/失败状态位。 在测试过程的选定点，元件可以被编程以指示设备已经通过与该过程中的所选点相关联的测试。 在对设备执行进一步测试之前，读取该元素以验证其在测试过程中通过先前的测试。 如果没有编写适当的元素，则设备被拒绝。 可以根据先前的测试步骤重新测试被拒绝的设备。 激光熔丝，电可编程熔丝或反熔丝用于存储测试结果。 使用电可写非易失性存储器元件允许在器件被封装之后对元件进行编程。
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6.发明授权公开(公告)号：US06194738B1
公开(公告)日：2001-02-27
申请号：US09032417
申请日：1998-02-27
申请人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
发明人： Brett Debenham , Kim Pierce , Douglas J. Cutter , Kurt Beigel , Fan Ho , Patrick J. Mullarkey , Dien Luong , Hua Zheng , Michael Shore , Jeffrey P. Wright , Adrian E. Ong , Todd A. Merritt
IPC分类号： H01L2358
CPC分类号： H01L27/112 , G01R31/31702 , G01R31/3181 , G11C17/10 , G11C17/18
摘要： An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.
摘要翻译： 集成电路存储器件具有多个非易失性可编程元件，用于在测试序列中存储所选择的里程碑处的通过/失败状态位。 在测试过程的选定点，元件可以被编程以指示设备已经通过与该过程中的所选点相关联的测试。 在对设备执行进一步测试之前，读取该元素以验证其在测试过程中通过先前的测试。 如果没有编写适当的元素，则设备被拒绝。 可以根据先前的测试步骤重新测试被拒绝的设备。 激光熔丝，电可编程熔丝或反熔丝用于存储测试结果。 使用电可写非易失性存储器元件允许在器件被封装之后对元件进行编程。
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7.发明申请公开(公告)号：US20050005208A1
公开(公告)日：2005-01-06
申请号：US09777036
申请日：2001-02-05
申请人： Douglas Cutter , Adrian Ong , Fan Ho , Kurt Beigel , Brett Debenham , Dien Luong , Kim Pierce , Patrick Mullarkey
发明人： Douglas Cutter , Adrian Ong , Fan Ho , Kurt Beigel , Brett Debenham , Dien Luong , Kim Pierce , Patrick Mullarkey
CPC分类号： G11C17/18
摘要： Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
摘要翻译： 公开了用于检查集成电路中的反熔丝元件的电阻的方法和装置。 将基于反熔丝元件的电阻的电压与基于已知电阻的电压进行比较，并且生成其二进制值表示反熔丝元件的电阻是否高于或低于已知电阻值的输出信号。 该方法和装置在验证反熔丝元件的编程方面是有用的。
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