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公开(公告)号:US11745306B2
公开(公告)日:2023-09-05
申请号:US16724504
申请日:2019-12-23
Applicant: Ebara Corporation
Inventor: Tomoko Owada , Makoto Fukushima , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Satoru Yamaki , Yoshikazu Kato
IPC: B24B49/04 , B24B41/047
CPC classification number: B24B49/045 , B24B41/047
Abstract: A polishing apparatus includes a rotatable head body having a pressing surface, a retainer ring configured to press a polishing surface while rotating together with the head body, a stationary ring, local load applying devices configured to apply a local load to the stationary ring, and a controller. The local load applying devices include a first pressing member and a second pressing member connected to the stationary ring. The first pressing member is disposed in the upstream side of the retainer ring in the traveling direction of the polishing surface, and the second pressing member is disposed in the downstream side. The controller calculates the inclination angle of the stationary ring based on a measured value of the height of at least one of the first pressing member and the second pressing member.
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公开(公告)号:US20220168864A1
公开(公告)日:2022-06-02
申请号:US17419029
申请日:2019-10-16
Applicant: EBARA CORPORATION
Inventor: Yoshikazu Kato , Makoto Fukushima , Keisuke Namiki , Shingo Togashi
IPC: B24B37/005 , G06N20/20 , G06K9/62
Abstract: An information processing apparatus is an information processing apparatus that determines a polishing recipe based on area response data acquired by changing a pressure for each area in a polishing head, the apparatus including an irregularity-presence-or-absence estimation unit that estimates and outputs whether an irregularity is present using new area response data as an input, a screening unit estimates and outputs, when the irregularity-presence-or-absence estimation unit estimates that an irregularity is present, area response data after the removal of the irregularity using area response data estimated that an irregularity is present as an input, and a simulation unit that determines a polishing recipe by simulation based on area response data estimated by the irregularity-presence-or-absence estimation unit that no irregularity is present or a response for each area after the removal of the irregularity estimated by the screening unit.
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公开(公告)号:US20210335650A1
公开(公告)日:2021-10-28
申请号:US17371518
申请日:2021-07-09
Applicant: EBARA CORPORATION
Inventor: Satoru Yamaki , Makoto Fukushima , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Tomoko Owada , Yoshikazu Kato
IPC: H01L21/687 , B24B37/30 , B24B37/10 , B24B7/04
Abstract: An elastic membrane to be used for a polishing head includes a contact portion configured to come into contact with a wafer, an annular side wall provided to stand on an outer peripheral end of the contact portion, a first partition wall linearly extending inward in a radial direction in sectional view from the side wall, and a second partition wall linearly extending inward and upward in the radial direction in sectional view from an outer peripheral end portion of the contact portion, wherein the first partition wall, the second partition wall, and the side wall constitute an edge pressure chamber for pressing an edge of the wafer.
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公开(公告)号:US20200206868A1
公开(公告)日:2020-07-02
申请号:US16724504
申请日:2019-12-23
Applicant: Ebara Corporation
Inventor: Tomoko Owada , Makoto Fukushima , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Satoru Yamaki , Yoshikazu Kato
IPC: B24B49/04 , B24B41/047
Abstract: A polishing apparatus includes a rotatable head body having a pressing surface, a retainer ring configured to press a polishing surface while rotating together with the head body, a stationary ring, local load applying devices configured to apply a local load to the stationary ring, and a controller. The local load applying devices include a first pressing member and a second pressing member connected to the stationary ring. The first pressing member is disposed in the upstream side of the retainer ring in the traveling direction of the polishing surface, and the second pressing member is disposed in the downstream side. The controller calculates the inclination angle of the stationary ring based on a measured value of the height of at least one of the first pressing member and the second pressing member.
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公开(公告)号:USD813180S1
公开(公告)日:2018-03-20
申请号:US29580339
申请日:2016-10-07
Applicant: EBARA CORPORATION
Designer: Makoto Fukushima , Hozumi Yasuda , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Satoru Yamaki
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公开(公告)号:USD794585S1
公开(公告)日:2017-08-15
申请号:US29560291
申请日:2016-04-05
Applicant: EBARA CORPORATION
Designer: Osamu Nabeya , Hozumi Yasuda , Makoto Fukushima , Keisuke Namiki , Shingo Togashi , Satoru Yamaki
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公开(公告)号:US20170057049A1
公开(公告)日:2017-03-02
申请号:US15248112
申请日:2016-08-26
Applicant: Ebara Corporation
Inventor: Makoto Fukushima , Hozumi Yasuda , Shingo Togashi
IPC: B24B37/005
Abstract: A polishing apparatus includes a polishing table for supporting a polishing pad and a substrate holding device for pressing a substrate against the polishing pad. The substrate holding device includes an elastic film to form multiple pressure chambers to press the substrate, and a pressure control unit controlling pressure of the pressure chambers. The pressure control unit includes a first flow path connected to a first pressure chamber, and first and second pressure regulation mechanisms. The pressure control unit performs switching control from first pressure regulation mechanism to second pressure regulation mechanism when a set pressure within first pressure chamber reaches a first threshold value. Then, the pressure control unit performs switching control from second pressure regulation mechanism to first pressure regulation mechanism when the set pressure within the first pressure chamber reaches a second threshold value lower than the first threshold value.
Abstract translation: 抛光装置包括用于支撑抛光垫的抛光台和用于将基板压靠在抛光垫上的基板保持装置。 基板保持装置包括形成多个压力室以按压基板的弹性膜,以及控制压力室压力的压力控制单元。 压力控制单元包括连接到第一压力室的第一流路,以及第一和第二压力调节机构。 当第一压力室内的设定压力达到第一阈值时,压力控制单元执行从第一压力调节机构到第二压力调节机构的切换控制。 然后,当第一压力室内的设定压力达到低于第一阈值的第二阈值时,压力控制单元进行从第二压力调节机构到第一压力调节机构的切换控制。
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公开(公告)号:USD770990S1
公开(公告)日:2016-11-08
申请号:US29489477
申请日:2014-04-30
Applicant: EBARA CORPORATION
Designer: Makoto Fukushima , Hozumi Yasuda , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Satoru Yamaki
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公开(公告)号:US12068189B2
公开(公告)日:2024-08-20
申请号:US17371518
申请日:2021-07-09
Applicant: EBARA CORPORATION
Inventor: Satoru Yamaki , Makoto Fukushima , Keisuke Namiki , Osamu Nabeya , Shingo Togashi , Tomoko Owada , Yoshikazu Kato
IPC: H01L21/687 , B24B7/04 , B24B37/10 , B24B37/30
CPC classification number: H01L21/68707 , B24B7/04 , B24B37/107 , B24B37/30
Abstract: An elastic membrane to be used for a polishing head includes a contact portion configured to come into contact with a wafer, an annular side wall provided to stand on an outer peripheral end of the contact portion, a first partition wall linearly extending inward in a radial direction in sectional view from the side wall, and a second partition wall linearly extending inward and upward in the radial direction in sectional view from an outer peripheral end portion of the contact portion, wherein the first partition wall, the second partition wall, and the side wall constitute an edge pressure chamber for pressing an edge of the wafer.
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公开(公告)号:US11478895B2
公开(公告)日:2022-10-25
申请号:US16655639
申请日:2019-10-17
Applicant: Ebara Corporation
Inventor: Shingo Togashi , Hozumi Yasuda , Makoto Fukushima , Osamu Nabeya
Abstract: Provided is a substrate holding device used in a substrate polishing apparatus that polishes a substrate using a polishing pad. The substrate holding device includes: a retainer ring configured to hold a peripheral edge of the substrate; and a drive ring fixed to the retainer ring so as to rotate together with the retainer ring. The surface of the retainer ring at the polishing pad side has a convex portion at a position other than an innermost circumference following a shape of the drive ring.
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