Infrared direct illumination machine vision technique for semiconductor processing equipment
    1.
    发明授权
    Infrared direct illumination machine vision technique for semiconductor processing equipment 有权
    半导体加工设备的红外直接照明机视觉技术

    公开(公告)号:US08570516B2

    公开(公告)日:2013-10-29

    申请号:US12977229

    申请日:2010-12-23

    申请人: Gang Liu Lei Wang

    发明人: Gang Liu Lei Wang

    IPC分类号: G01B11/00

    摘要: A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs infrared light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

    摘要翻译: 提供了一种视觉系统,用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。 源将红外光引导通过压板中的孔以照亮半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。 摄像机使用从压板孔接收的光产生图像,其中一些所接收的光被晶片反射。 图像中的半导体晶片的边缘由暗/光转变很好地限定。

    System and method for automatically tracking a contact lens in a wearer's eye
    2.
    发明授权
    System and method for automatically tracking a contact lens in a wearer's eye 有权
    用于在佩戴者眼睛中自动跟踪隐形眼镜的系统和方法

    公开(公告)号:US08740382B1

    公开(公告)日:2014-06-03

    申请号:US13250328

    申请日:2011-09-30

    IPC分类号: A61B3/14 A61B3/10 A61B3/00

    摘要: A system and method for automated determination of position and movement of a contact lens with respect to a subject wearer's eye based upon a complimentary pair of images, acquired in rapid succession, in which one image of the pair is acquired using light that allows viewing of the pupil and/or limbus through the lens and the other image is acquired using light that is absorbed by the lens to generate an opaque image with a defined edge relative to the surrounding sclera. The images of the pair are acquired in close enough temporal proximity to ensure that eye movement in the interval therebetween is insignificant and both images are in the same approximate reference frame. Thus, the location of the pupil and limbus in one image can be accurately compared with the location of the contact lens edge in the other image.

    摘要翻译: 一种系统和方法,用于基于快速连续获取的互补图像,自动确定隐形眼镜相对于被摄体佩戴者的眼睛的位置和运动,其中使用允许观看 通过透镜和另一图像的瞳孔和/或角膜通过被透镜吸收的光来获得,以产生具有相对于周围巩膜的限定边缘的不透明图像。 以足够接近的时间获取该对的图像,以确保其间的间隔中的眼睛移动是无关紧要的,并且两个图像在相同的近似参考系中。 因此,可以将一个图像中的瞳孔和角膜缘的位置与另一图像中的隐形眼镜边缘的位置精确地比较。

    Code and part associating method and apparatus
    3.
    发明授权
    Code and part associating method and apparatus 有权
    代码和部件关联方法和装置

    公开(公告)号:US08733656B2

    公开(公告)日:2014-05-27

    申请号:US13477351

    申请日:2012-05-22

    IPC分类号: G06K7/10

    摘要: An apparatus for associating codes on parts with part spaces on a conveyor wherein each part has a leading edge and a trailing edge that define a part space and each part is to be marked with at least one code, the apparatus comprising an area scan camera having a two dimensional field of view (FOV), the camera supported adjacent the conveyor so that parts conveyed by the conveyor pass through the FOV, a processor linked to the area scan camera, the processor programmed to perform the steps of receiving images from the area scan camera, identifying the locations of codes on parts in at least one of the images wherein a code located is a located code, identifying the locations of leading and trailing edges of parts wherein the leading and trailing edges define part spaces and associating each located code with a part space that includes the location of the located code.

    摘要翻译: 一种用于将部件上的代码与输送机上的部分空间相关联的装置,其中每个部件具有限定部分空间的前缘和后缘,并且每个部分将被标记有至少一个代码,该装置包括区域扫描相机, 二维视场(FOV),相机支撑在输送机附近,使得由输送机输送的部分通过FOV,连接到区域扫描摄像机的处理器,被编程为执行从该区域接收图像的步骤的处理器 扫描相机,识别至少一个图像中的部件上的代码的位置,其中定位的代码是定位的代码,标识部件的前边缘和后缘的位置,其中前边缘和后边缘定义部分空间并且将每个定位的代码 其中包含位置代码的位置的部分空间。

    Direct illumination machine vision technique for processing semiconductor wafers
    4.
    发明授权
    Direct illumination machine vision technique for processing semiconductor wafers 有权
    用于处理半导体晶片的直接照明机器视觉技术

    公开(公告)号:US08189194B2

    公开(公告)日:2012-05-29

    申请号:US12209248

    申请日:2008-09-12

    IPC分类号: G01B11/00

    摘要: A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

    摘要翻译: 提供了一种视觉系统,用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。 光源通过压板中的孔引导紫外光照射半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。 摄像机使用从压板孔接收的光产生图像,其中一些所接收的光被晶片反射。 图像中的半导体晶片的边缘由暗/光转变很好地限定。

    DIRECT ILLUMINATION MACHINE VISION TECHNIQUE FOR PROCESSING SEMICONDUCTOR WAFERS
    5.
    发明申请
    DIRECT ILLUMINATION MACHINE VISION TECHNIQUE FOR PROCESSING SEMICONDUCTOR WAFERS 有权
    直接照明机器视觉技术处理半导体波形

    公开(公告)号:US20100065757A1

    公开(公告)日:2010-03-18

    申请号:US12209248

    申请日:2008-09-12

    IPC分类号: G01N23/00 G01B11/00 G02B27/30

    摘要: A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

    摘要翻译: 提供了一种视觉系统,用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。 光源通过压板中的孔引导紫外光照射半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。 摄像机使用从压板孔接收的光产生图像,其中一些所接收的光被晶片反射。 图像中的半导体晶片的边缘由暗/光转变很好地限定。

    CODE AND PART ASSOCIATING METHOD AND APPARATUS
    6.
    发明申请
    CODE AND PART ASSOCIATING METHOD AND APPARATUS 有权
    代码和零件相关方法和装置

    公开(公告)号:US20130313312A1

    公开(公告)日:2013-11-28

    申请号:US13477351

    申请日:2012-05-22

    IPC分类号: G06F17/00

    摘要: An apparatus for associating codes on parts with part spaces on a conveyor wherein each part has a leading edge and a trailing edge that define a part space and each part is to be marked with at least one code, the apparatus comprising an area scan camera having a two dimensional field of view (FOV), the camera supported adjacent the conveyor so that parts conveyed by the conveyor pass through the FOV, a processor linked to the area scan camera, the processor programmed to perform the steps of receiving images from the area scan camera, identifying the locations of codes on parts in at least one of the images wherein a code located is a located code, identifying the locations of leading and trailing edges of parts wherein the leading and trailing edges define part spaces and associating each located code with a part space that includes the location of the located code.

    摘要翻译: 一种用于将部件上的代码与输送机上的部分空间相关联的装置,其中每个部件具有限定部分空间的前缘和后缘,并且每个部分将被标记有至少一个代码,该装置包括区域扫描相机, 二维视场(FOV),相机支撑在输送机附近,使得由输送机输送的部分通过FOV,连接到区域扫描摄像机的处理器,被编程为执行从该区域接收图像的步骤的处理器 扫描相机,识别至少一个图像中的部件上的代码的位置,其中定位的代码是定位的代码,标识部件的前边缘和后缘的位置,其中前边缘和后边缘定义部分空间并且将每个定位的代码 其中包含位置代码的位置的部分空间。

    System and method for automatically tracking a contact lens in a wearer's eye

    公开(公告)号:US09883797B1

    公开(公告)日:2018-02-06

    申请号:US14277139

    申请日:2014-05-14

    摘要: A system and method for automated determination of position and movement of a contact lens with respect to a subject wearer's eye based upon a complimentary pair of images, acquired in rapid succession, in which one image of the pair is acquired using light that allows viewing of the pupil and/or limbus through the lens and the other image is acquired using light that is absorbed by the lens to generate an opaque image with a defined edge relative to the surrounding sclera. The images of the pair are acquired in close enough temporal proximity to ensure that eye movement in the interval therebetween is insignificant and both images are in the same approximate reference frame. Thus, the location of the pupil and limbus in one image can be accurately compared with the location of the contact lens edge in the other image.

    INFRARED DIRECT ILLUMINATION MACHINE VISION TECHNIQUE FOR SEMICONDUCTOR PROCESSING EQUIPMENT
    8.
    发明申请
    INFRARED DIRECT ILLUMINATION MACHINE VISION TECHNIQUE FOR SEMICONDUCTOR PROCESSING EQUIPMENT 有权
    半导体加工设备的红外直接照明机器视觉技术

    公开(公告)号:US20110157352A1

    公开(公告)日:2011-06-30

    申请号:US12977229

    申请日:2010-12-23

    申请人: Gang LIU Lei Wang

    发明人: Gang LIU Lei Wang

    IPC分类号: H04N7/18

    摘要: A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs infrared light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

    摘要翻译: 提供了一种视觉系统,用于确定压板上的半导体晶片与半导体晶片的远离压纸台的诸如印刷屏幕的处理机器上的元件之间的位置关系。 源将红外光引导通过压板中的孔以照亮半导体晶片并将阴影投射到与半导体晶片的边缘相邻的元件上。 摄像机使用从压板孔接收的光产生图像,其中一些所接收的光被晶片反射。 图像中的半导体晶片的边缘由暗/光转变很好地限定。

    Methods for Improving Efficiency of Cell Electroporation Using Dielectrophoreses
    9.
    发明申请
    Methods for Improving Efficiency of Cell Electroporation Using Dielectrophoreses 审中-公开
    提高细胞电穿孔效率的方法

    公开(公告)号:US20090000948A1

    公开(公告)日:2009-01-01

    申请号:US12097409

    申请日:2007-01-04

    IPC分类号: G01N27/26 G01N27/00

    摘要: The present invention provides methods for enhancing the efficiency of cell electroporation using dielectrophoresis-assisted cell localization and uses thereof in a microfluidic biochip system. Cells are first subject to dielectrophoresis and localized to regions where the electric field intensity is high enough to render cells electroporated. The invention enhances the efficiency of in situ cell electroporation on a traditional microfluidic biochip.

    摘要翻译: 本发明提供使用介电电泳辅助细胞定位提高细胞电穿孔效率的方法及其在微流体生物芯片系统中的用途。 细胞首先进行介导电泳,并定位于电场强度足以使细胞电穿孔的区域。 本发明增强了传统微流体生物芯片上原位细胞电穿孔的效率。

    SLOW RELEASE APPARATUS FOR SLOWLY RELEASING COMPOUND IN NASAL PASSAGE

    公开(公告)号:US20240009411A1

    公开(公告)日:2024-01-11

    申请号:US18470632

    申请日:2023-09-20

    申请人: Lei Wang

    发明人: Lei Wang

    IPC分类号: A61M15/08

    CPC分类号: A61M15/08

    摘要: A slow release apparatus for slowly releasing a compound in a nasal passage. The apparatus comprises a connection mechanism, two expansion mechanisms, and two release mechanisms; two ends of the connection mechanism are respectively integrally or detachably connected to the two expansion mechanisms that are symmetrically arranged in nasal passages at two sides; and the two release mechanisms are symmetrically arranged, and each release mechanism is correspondingly provided in one of the expansion mechanisms. The slow release apparatus is convenient to carry, and capable of slowly releasing a compound in the nasal passage and synchronously expanding the nasal passage to ensure smooth breathing, while considering functionality, practicability and comfort.