METHOD OF PRODUCING BONDED WAFER STRUCTURE WITH BURIED OXIDE/NITRIDE LAYERS
    1.
    发明申请
    METHOD OF PRODUCING BONDED WAFER STRUCTURE WITH BURIED OXIDE/NITRIDE LAYERS 审中-公开
    用氧化铝/氮化物层生产粘结的结构的方法

    公开(公告)号:US20110180896A1

    公开(公告)日:2011-07-28

    申请号:US12692983

    申请日:2010-01-25

    IPC分类号: H01L29/06 H01L21/762

    CPC分类号: H01L21/76256

    摘要: A method of forming a bonded wafer structure includes providing a first semiconductor wafer substrate having a first silicon oxide layer at the top surface of the first semiconductor wafer substrate; providing a second semiconductor wafer substrate; forming a second silicon oxide layer on the second semiconductor wafer substrate; forming a silicon nitride layer on the second silicon oxide layer; and bringing the first silicon oxide layer of the first semiconductor wafer substrate into physical contact with the silicon nitride layer of the second semiconductor wafer substrate to form a bonded interface between the first silicon oxide layer and the silicon nitride layer. Alternatively, a third silicon oxide layer may be formed on the silicon nitride layer before bonding. A bonded interface is then formed between the first and third silicon oxide layers. A bonded wafer structure formed by such a method is also provided.

    摘要翻译: 形成接合晶片结构的方法包括:在第一半导体晶片衬底的顶表面上提供具有第一氧化硅层的第一半导体晶片衬底; 提供第二半导体晶片衬底; 在所述第二半导体晶片衬底上形成第二氧化硅层; 在所述第二氧化硅层上形成氮化硅层; 并且使第一半导体晶片衬底的第一氧化硅层与第二半导体晶片衬底的氮化硅层物理接触以在第一氧化硅层和氮化硅层之间形成键合界面。 或者,可以在接合之前在氮化硅层上形成第三氧化硅层。 然后在第一和第三氧化硅层之间形成键合界面。 还提供了通过这种方法形成的接合晶片结构。

    SOLAR CELL CLASSIFICATION METHOD
    4.
    发明申请
    SOLAR CELL CLASSIFICATION METHOD 审中-公开
    太阳能电池分类方法

    公开(公告)号:US20120160295A1

    公开(公告)日:2012-06-28

    申请号:US13167792

    申请日:2011-06-24

    CPC分类号: H02S50/10

    摘要: A method for characterizing the electronic properties of a solar cell to be used in a photovoltaic module comprises the steps of performing a room temperature IV curve measurement of the solar cell and classifying the solar cell based on this IV curve measurement. In order to take stress-related effects into account, the solar cells are reclassified depending on the result of an additional measurement conducted on the solar cells under stress. This stress-related measurement may be gained from light induced thermography (LIT) yielding information on diode shunt areas within the solar cell.

    摘要翻译: 用于表征在光伏模块中使用的太阳能电池的电子特性的方法包括以下步骤:基于该IV曲线测量,执行太阳能电池的室温IV曲线测量并对太阳能电池进行分类。 为了考虑应力相关的影响,太阳能电池根据在应力下对太阳能电池进行的额外测量的结果重新分类。 该应力相关测量可以从光诱导热成像(LIT)获得,产生关于太阳能电池内的二极管分流区域的信息。

    Silicon solar cell manufacture
    8.
    发明授权
    Silicon solar cell manufacture 有权
    硅太阳能电池制造

    公开(公告)号:US08735212B2

    公开(公告)日:2014-05-27

    申请号:US12866737

    申请日:2009-01-13

    IPC分类号: H01L31/0224

    摘要: A silicon solar cell is manufactured by providing a carrier plate, and by applying a first contact pattern to the carrier plate. The first contact pattern includes a set of first laminar contacts. The silicon solar cell is further manufactured by applying a multitude of silicon slices to the first contact pattern, and by applying a second contact pattern to the multitude of silicon slices. Each first laminar contact of the set of first laminar contacts is in spatial laminar contact with maximally two silicon slices. The second contact pattern includes a set of second laminar contacts. Each second laminar contact of the set of second laminar contacts is in spatial laminar contact with maximally two silicon slices.

    摘要翻译: 硅太阳能电池通过提供载体板并且通过向载体板施加第一接触图案来制造。 第一接触图案包括一组第一层状接触。 硅太阳能电池进一步通过将多个硅片施加到第一接触图案并且通过向多个硅片施加第二接触图案而制造。 该组第一层状接触件的每个第一层状接触件与最多两个硅片片层叠接触。 第二接触图案包括一组第二层状接触。 该组第二层状接触件的每个第二层状接触件与最多两个硅片片层叠接触。

    Silicon-on-insulator substrate and method of forming
    10.
    发明授权
    Silicon-on-insulator substrate and method of forming 失效
    绝缘体上硅衬底及其成型方法

    公开(公告)号:US08536035B2

    公开(公告)日:2013-09-17

    申请号:US13363603

    申请日:2012-02-01

    IPC分类号: H01L21/425

    CPC分类号: H01L21/76254

    摘要: Silicon-on-insulator (SOI) structures and related methods of forming such structures. In one case, a method includes providing a silicon-on-insulator (SOI) handle substrate having: a substantially uniform resistivity profile along a depth of the handle substrate; and an interstitial oxygen (Oi) concentration of less than approximately 10 parts per million atoms (ppma). The method further includes counter-doping a surface region of the handle, causing the surface region to have a resistivity greater than approximately 3 kOhm-cm, and joining the surface region of the handle substrate with a donor wafer.

    摘要翻译: 绝缘体上硅(SOI)结构和形成这种结构的相关方法。 在一种情况下,一种方法包括提供绝缘体上硅(SOI)手柄衬底,其具有:沿着手柄衬底的深度的基本均匀的电阻率分布; 和间隙氧(Oi)浓度小于约10ppm(ppma)。 所述方法还包括对所述手柄的表面区域进行反掺杂,使所述表面区域具有大于约3kOhm-cm的电阻率,并且将所述手柄衬底的表面区域与施主晶片接合。