Single ended sense amplifier with current pulse circuit

    公开(公告)号:US12243614B2

    公开(公告)日:2025-03-04

    申请号:US18046961

    申请日:2022-10-17

    Abstract: Embodiments of the disclosure provide memory circuit, a sense amplifier and associated method for reading a resistive state in a memory device. The sense amplifier includes a bit cell configurable to a high or low resistance state; a sensing circuit that detects a voltage drop across the bit cell in response to an applied read current during a read operation and generates a high or low logic output at an output node; and a pulse generation circuit that increases the applied read current with an injected current pulse when a low to high transition of the resistive state of the bit cell is detected.

    MULTI-RAIL SENSE CIRCUIT WITH PRE-CHARGE TRANSISTORS AND MEMORY CIRCUIT INCORPORATING THE SENSE CIRCUIT

    公开(公告)号:US20240282373A1

    公开(公告)日:2024-08-22

    申请号:US18170925

    申请日:2023-02-17

    CPC classification number: G11C13/004 G11C11/1673 G11C2013/0054

    Abstract: Disclosed are a sense circuit and memory structure incorporating the sense circuit. The sense circuit is connected to voltage rails at VDD1 and VDD2, respectively, where VDD2˜½*VDD1. During a sensing operation, VDD1 provides power to develop a voltage differential between Vdata and Vref on sense nodes. A voltage comparator samples Vdata and Vref and, based on a detectable voltage differential (minVdiff), outputs a data output value. To increase the speed at which minVdiff is reached, an equalization process is performed at the initiation of the sensing operation and includes using pre-charge transistors to quickly equalize the sense nodes to VDD2. Following equalization, Vdata and Vref only need to be pulled up or down from VDD2. Thus, minVdiff is reached faster and sampling by the voltage comparator can be performed earlier in time, reducing the overall time required for performing the sensing operation and for powering the sense circuit.

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