公开(公告)号：US20210318611A1

公开(公告)日：2021-10-14

申请号：US17226721

申请日：2021-04-09

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Soh UENOYAMA ,  Hiroki KAMEI ,  Kazuyoshi HIROSE

IPC: G03F7/00 ,  G02B27/00

Abstract: A method for producing an optical element includes: forming a resist layer on a main surface of a substrate; forming a pattern region in the resist layer; forming a groove; forming a dielectric layer covering the pattern region; and forming an optical functional portion. The pattern region is formed in the resist layer. The groove is formed in a portion corresponding to a periphery of the pattern region as viewed in a direction orthogonal to the main surface. A dielectric is deposited to form the dielectric layer. After the dielectric layer covering the pattern region is formed, the resist layer is removed to form the optical functional portion at a position where the pattern region is disposed on the main surface. The optical functional portion is made of the dielectric.

公开(公告)号：US20240162679A1

公开(公告)日：2024-05-16

申请号：US18283894

申请日：2022-03-02

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Koyo WATANABE ,  Hiroki KAMEI

IPC: H01S5/026 ,  G02B5/32

CPC classification number: H01S5/026 ,  G02B5/32

Abstract: A light-emitting device is an S-iPM laser of M-point oscillation including a phase modulation layer. Four-direction in-plane wavenumber vectors each including a wavenumber spread corresponding to an angular spread of light output from the light-emitting device are formed on a reciprocal lattice space of the phase modulation layer. The magnitude of at least one of the in-plane wavenumber vectors is smaller than 2π/λ. A predetermined phase distribution included in the phase modulation layer includes an element for focusing the light output.

公开(公告)号：US20210262787A1

公开(公告)日：2021-08-26

申请号：US17175059

申请日：2021-02-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Hiroki KAMEI ,  Takahiro SUGIYAMA ,  Akiyoshi WATANABE

IPC: G01B11/25 ,  G06K9/20 ,  G06T7/521

Abstract: A three-dimensional measurement device includes one or a plurality of light source units configured to irradiate the object to be measured SA with measurement light having a predetermined pattern, one or a plurality of image capture units configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured on the basis of results of image capture performed by the image capture units. The light source units are constituted by an S-iPMSEL of M-point oscillation.

公开(公告)号：US20240364079A1

公开(公告)日：2024-10-31

申请号：US18683035

申请日：2022-05-19

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Koyo WATANABE ,  Hiroki KAMEI

IPC: H01S5/183 ,  H01S5/042 ,  H01S5/062 ,  H01S5/22

CPC classification number: H01S5/18302 ,  H01S5/0427 ,  H01S5/06246 ,  H01S5/18305 ,  H01S5/222

Abstract: A method for designing a phase modulation layer of a light emitting element as an iPMSEL including a light emitting portion and the phase modulation layer optically coupled to the light emitting portion includes a generation step for generating a design pattern of the phase modulation layer. The phase modulation layer includes a base layer and a plurality of different refractive index regions having different refractive indices from the base layer and distributed two-dimensionally in a plane perpendicular to a thickness direction of the phase modulation layer.

公开(公告)号：US20240195150A1

公开(公告)日：2024-06-13

申请号：US18286149

申请日：2022-03-02

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Masahiro HITAKA ,  Hiroki KAMEI ,  Takahiro SUGIYAMA

IPC: H01S5/183 ,  H01S5/042 ,  H01S5/11 ,  H01S5/323

CPC classification number: H01S5/18308 ,  H01S5/04252 ,  H01S5/04256 ,  H01S5/11 ,  H01S5/323

Abstract: A surface-emitting laser device includes a first electrode, a lower cladding layer, an active layer, an upper cladding layer, a relaxation layer, a contacting layer having a bandgap different from that of the upper cladding layer, a second electrode, and a photonic crystal layer provided between the lower cladding layer and the active layer or between the active layer and the upper cladding layer, including a basic region and a plurality of different refractive index regions that differ in refractive index from the basic region and are distributed two-dimensionally in a plane perpendicular to a thickness direction to form a resonance mode of light in the plane. The relaxation layer has a bandgap that is between a bandgap of the upper cladding layer and a bandgap of the contacting layer.

公开(公告)号：US20230369825A1

公开(公告)日：2023-11-16

申请号：US18029141

申请日：2021-09-28

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Hiroki KAMEI ,  Takahiro SUGIYAMA

IPC: H01S5/183 ,  H01S5/11

CPC classification number: H01S5/18305 ,  H01S5/18302 ,  H01S5/11

Abstract: A semiconductor laser element of the present disclosure reducing one-dimensional local oscillation includes a substrate, an active layer, and a phase modulation layer. The phase modulation layer includes a base layer and modified refractive index regions two-dimensionally placed on a reference surface. In a virtual square lattice on the reference surface, the gravity center of each modified refractive index region is placed away from the corresponding lattice point, and an angle of a vector connecting the corresponding lattice point to the gravity center is set individually. A lattice spacing and a light emission wavelength of the active layer satisfy a Γ-point oscillation condition. The gravity center of each modified refractive index region is placed such that the absolute value of the Fourier coefficient of an annular or a circular shape obtained by rotating each modified refractive index region with the corresponding lattice point is 0.01 or less.

公开(公告)号：US20230273015A1

公开(公告)日：2023-08-31

申请号：US18195508

申请日：2023-05-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kazuyoshi HIROSE ,  Hiroki KAMEI ,  Takahiro SUGIYAMA ,  Akiyoshi WATANABE ,  Seiichiro MIZUNO

IPC: G01B11/25

CPC classification number: G01B11/2513

Abstract: A three-dimensional measurement device includes a plurality of light source units configured to irradiate the object to be measured with measurement light having predetermined patterns, an image capture unit configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured based on results of image capture performed by the image capture unit. The predetermined patterns of the measurement light include stripe patterns, respectively. The stripe patterns radiated from the plurality of light source units have respective patterns different from each other. The plurality of light source units are arrayed in a direction parallel to stripes in the stripe patterns. The measurement unit measures the three-dimensional shape of the object to be measured based on a three-dimensional shape measurement method using the stripe pattern.

公开(公告)号：US20210318466A1

公开(公告)日：2021-10-14

申请号：US17226662

申请日：2021-04-09

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Soh UENOYAMA ,  Hiroki KAMEI ,  Kazuyoshi HIROSE

IPC: G02B1/00 ,  G02B3/08

Abstract: A method for producing an optical element includes: disposing a joint layer on a substrate; forming a first portion and a second portion in a second surface of the joint layer; and forming a plurality of structural bodies, which are made of a dielectric, on the second surface of the joint layer. The joint layer has a first surface facing the substrate, and the second surface located on a side opposite the first surface. The first portion is covered with a resist layer, and the second portion is exposed from the resist layer. After the dielectric is laminated on at least the second portion, the resist layer is removed to form the plurality of structural bodies on the second surface.