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    THREE-DIMENSIONAL MEASUREMENT DEVICE
    1.
    发明申请
    THREE-DIMENSIONAL MEASUREMENT DEVICE 有权

    公开(公告)号：US20210262787A1

    公开(公告)日：2021-08-26

    申请号：US17175059

    申请日：2021-02-12

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Kazuyoshi HIROSE ,  Hiroki KAMEI ,  Takahiro SUGIYAMA ,  Akiyoshi WATANABE

    IPC: G01B11/25 ,  G06K9/20 ,  G06T7/521

    Abstract: A three-dimensional measurement device includes one or a plurality of light source units configured to irradiate the object to be measured SA with measurement light having a predetermined pattern, one or a plurality of image capture units configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured on the basis of results of image capture performed by the image capture units. The light source units are constituted by an S-iPMSEL of M-point oscillation.

    TWO-DIMENSIONAL PHOTONIC CRYSTAL SURFACE EMITTING LASER
    4.
    发明申请
    TWO-DIMENSIONAL PHOTONIC CRYSTAL SURFACE EMITTING LASER 审中-公开

    公开(公告)号：US20200028327A1

    公开(公告)日：2020-01-23

    申请号：US16585948

    申请日：2019-09-27

    Applicant: KYOTO UNIVERSITY ,  ROHM CO., LTD. ,  HAMAMATSU PHOTONICS K.K. ,  MITSUBISHI ELECTRIC CORPORATION

    Inventor： Susumu NODA ,  Hitoshi KITAGAWA ,  Yong LIANG ,  Akiyoshi WATANABE ,  Kazuyoshi HIROSE

    IPC: H01S5/183 ,  H01S5/042

    Abstract: To provide a two-dimensional photonic crystal surface emitting laser capable of improving characteristics of light to be emitted, in particular, optical output power. The two-dimensional photonic crystal surface emitting laser includes: a two-dimensional photonic crystal including a plate-shaped base member and modified refractive index regions where the modified refractive index regions have a refractive index different from that of the plate-shaped base member and are two-dimensionally and periodically arranged in the base member; an active layer provided on one side of the two-dimensional photonic crystal; and a first electrode and a second electrode provided sandwiching the two-dimensional photonic crystal and the active layer for supplying current to the active layer, where the second electrode covers a region equal to or wider than the first electrode.

    LIGHT-EMITTING ELEMENT AND LIGHT-EMITTING DEVICE
    5.
    发明申请
    LIGHT-EMITTING ELEMENT AND LIGHT-EMITTING DEVICE 有权

    公开(公告)号：US20210391691A1

    公开(公告)日：2021-12-16

    申请号：US17287149

    申请日：2019-10-23

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Takahiro SUGIYAMA ,  Akiyoshi WATANABE ,  Hiroki MIYACHI ,  Ryoichi KASHIRO ,  Takeshi KANZAKI

    IPC: H01S5/11 ,  H01S5/32 ,  H01S5/02

    Abstract: One aspect relates to a light-emitting element having a layer forming a resonance mode. The light-emitting element includes a structure body constituted by a substrate and a semiconductor laminate body including a first cladding layer, a second cladding layer, an active layer, and a resonance-mode forming layer including a basic layer and modified refractive index regions. A laser light output region and a metal electrode film are on opposing surfaces of the structure body. The metal electrode film includes a first layer forming ohmic contact with the structure body, a second layer reflecting light from the resonance-mode forming layer, a third layer, and a fourth layer for solder bonding. The third layer has a different composition from the second layer and the fourth layer, and has a lower diffusion degree than the second layer and the fourth layer to that of a solder material.

    THREE-DIMENSIONAL MEASUREMENT DEVICE, LIGHT SOURCE DEVICE, AND LIGHT RECEIVING AND EMITTING MODULE
    6.
    发明公开
    THREE-DIMENSIONAL MEASUREMENT DEVICE, LIGHT SOURCE DEVICE, AND LIGHT RECEIVING AND EMITTING MODULE 审中-公开

    公开(公告)号：US20230273015A1

    公开(公告)日：2023-08-31

    申请号：US18195508

    申请日：2023-05-10

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Kazuyoshi HIROSE ,  Hiroki KAMEI ,  Takahiro SUGIYAMA ,  Akiyoshi WATANABE ,  Seiichiro MIZUNO

    IPC: G01B11/25

    CPC classification number: G01B11/2513

    Abstract: A three-dimensional measurement device includes a plurality of light source units configured to irradiate the object to be measured with measurement light having predetermined patterns, an image capture unit configured to capture an image of the object to be measured which is irradiated with the measurement light, and a measurement unit configured to measure a three-dimensional shape of the object to be measured based on results of image capture performed by the image capture unit. The predetermined patterns of the measurement light include stripe patterns, respectively. The stripe patterns radiated from the plurality of light source units have respective patterns different from each other. The plurality of light source units are arrayed in a direction parallel to stripes in the stripe patterns. The measurement unit measures the three-dimensional shape of the object to be measured based on a three-dimensional shape measurement method using the stripe pattern.

    SEMICONDUCTOR LASER MODULE
    7.
    发明申请
    SEMICONDUCTOR LASER MODULE 有权
    半导体激光模块

    公开(公告)号：US20170012407A1

    公开(公告)日：2017-01-12

    申请号：US15115713

    申请日：2014-11-10

    Applicant: KYOTO UNIVERSITY ,  HAMAMATSU PHOTONICS K.K.

    Inventor： Akiyoshi WATANABE ,  Yoshitaka KUROSAKA ,  Kazuyoshi HIROSE ,  Takahiro SUGIYAMA ,  Susumu NODA

    IPC: H01S5/0683 ,  H01S5/18 ,  H01S5/10 ,  H01S5/022

    CPC classification number: H01S5/0683 ,  H01S5/022 ,  H01S5/105 ,  H01S5/18 ,  H01S5/187

    Abstract: A surface emitting laser element capable of emitting a main beam and a sub-beam, and a monitoring light detection element capable of detecting a light intensity of the sub-beam are included, the surface emitting laser element is a PCSEL, the main beam and the sub-beam are emitted in an upward direction of the surface emitting laser element and are inclined to each other at a predetermined angle, and respective changes in a peak light intensity of the main beam and a peak light intensity of the sub-beam with respect to a value of a driving current of the surface emitting laser element are correlated with each other. Therefore, if an output of the monitoring light detection element indicating the peak light intensity of the sub-beam is used, the peak light intensity of the main beam can be estimated.

    Abstract translation: 包括能够发射主光束和子光束的表面发射激光器元件和能够检测子光束的光强度的监视光检测元件，表面发射激光器元件是PCSEL，主光束和 子光束在表面发射激光器元件的向上方向上发射，并且以预定角度彼此倾斜，并且主光束的峰值光强度和子光束的峰值光强度各自变化， 相对于表面发射激光元件的驱动电流的值彼此相关。 因此，如果使用表示子光束的峰值光强度的监视光检测元件的输出，则可以估计主光束的峰值光强度。

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