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1.发明授权公开(公告)号：US07886247B2
公开(公告)日：2011-02-08
申请号：US12111634
申请日：2008-04-29
IPC分类号： G06F17/50
CPC分类号： G01R31/318371
摘要： In one embodiment, the invention is a method and apparatus for statistical path selection for at-speed testing. One embodiment of a method for selecting a path of an integrated circuit chip for at-speed testing includes computing a process coverage metric for a plurality of paths in the integrated circuit chip and selecting at least one path that maximizes the process coverage metric.
摘要翻译： 在一个实施例中，本发明是用于速度测试的统计路径选择的方法和装置。 用于选择用于高速测试的集成电路芯片的路径的方法的一个实施例包括计算集成电路芯片中的多个路径的处理覆盖度量度，并且选择使过程覆盖度量最大化的至少一个路径。
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2.发明申请公开(公告)号：US20090271751A1
公开(公告)日：2009-10-29
申请号：US12111634
申请日：2008-04-29
IPC分类号： G06F17/50
CPC分类号： G01R31/318371
摘要： In one embodiment, the invention is a method and apparatus for statistical path selection for at-speed testing. One embodiment of a method for selecting a path of an integrated circuit chip for at-speed testing includes computing a process coverage metric for a plurality of paths in the integrated circuit chip and selecting at least one path that maximizes the process coverage metric.
摘要翻译： 在一个实施例中，本发明是用于速度测试的统计路径选择的方法和装置。 用于选择用于高速测试的集成电路芯片的路径的方法的一个实施例包括计算集成电路芯片中的多个路径的处理覆盖度量度，并且选择使过程覆盖度量最大化的至少一个路径。
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公开(公告)号：US08781792B2
公开(公告)日：2014-07-15
申请号：US12610291
申请日：2009-10-31
IPC分类号： G06F11/30
CPC分类号： G06F17/5045 , G06F2217/10 , G06F2217/82
摘要： Techniques for improving parametric chip yield of manufactured chips are provided. In one aspect, a method for optimizing parametric chip yield is provided. The method includes the following steps. Parametric chip yield is computed based on performance and power consumption of a plurality of manufactured chips subject to a given voltage binning scheme. It is then determined whether the parametric chip yield computed is optimal. If the parametric chip yield is not optimal, the voltage binning scheme is altered and the compute and determine steps are repeated. Otherwise the binning scheme is left unaltered.
摘要翻译： 提供了用于提高制造芯片的参数芯片产量的技术。 在一方面，提供了一种用于优化参数芯片产量的方法。 该方法包括以下步骤。 基于经受给定电压合并方案的多个制造的芯片的性能和功耗来计算参数芯片产量。 然后确定计算的参数芯片产量是否是最佳的。 如果参数芯片产量不是最优的，则改变电压组合方案，并重复计算和确定步骤。 否则，binning方案保持不变。
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4.发明申请公开(公告)号：US20110106483A1
公开(公告)日：2011-05-05
申请号：US12610090
申请日：2009-10-30
CPC分类号： G01R31/31835
摘要： In one embodiment, the invention is a method and apparatus for selecting paths for use in at-speed testing. One embodiment of a method for selecting a set of n paths with which to test an integrated circuit chip includes: organizing the set of n paths into a plurality of sub-sets, receiving a new candidate path, and adding the new candidate path to one of the sub-sets when the new candidate path improves the process coverage metric of the sub-sets.
摘要翻译： 在一个实施例中，本发明是用于选择在速度测试中使用的路径的方法和装置。 用于选择用于测试集成电路芯片的n个路径的集合的方法的一个实施例包括：将n个路径的集合组织成多个子集，接收新的候选路径，并将新的候选路径添加到一个 当新的候选路径改进子集的过程覆盖度量时，子集的子集。
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5.发明授权Representing and propagating a variational voltage waveform in statistical static timing analysis of digital circuits 有权在数字电路的统计静态时序分析中表征和传播变分电压波形公开(公告)号：US07814448B2
公开(公告)日：2010-10-12
申请号：US11733058
申请日：2007-04-09
申请人： Soroush Abbaspour , David J. Hathaway , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
发明人： Soroush Abbaspour , David J. Hathaway , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
IPC分类号： G06F17/50
CPC分类号： G06F17/5031
摘要： An approach that represents and propagates a variational voltage waveform in statistical static timing analysis of digital circuits is described. In one embodiment, there is a statistical static timing analysis tool for analyzing digital circuit designs. The statistical static timing analysis tool includes a variational waveform modeling component that is configured to generate a variational waveform model that approximate arbitrary waveform transformations of waveforms at nodes of a digital circuit. The variational waveform model transforms a nominal waveform into a perturbed waveform in accordance with a plurality of waveform transformation operators that account for variations that occur between the nominal waveform and the perturbed waveform. A variational waveform propagating component is configured to propagate variational waveforms through a timing arc from at least one input to at least one output of the digital circuit in accordance with the variational waveform model.
摘要翻译： 描述了在数字电路的统计静态时序分析中表示和传播变化电压波形的方法。 在一个实施例中，存在用于分析数字电路设计的统计静态时序分析工具。 统计静态时序分析工具包括变分波形建模组件，其被配置为生成近似波形在数字电路节点处的任意波形变换的变分波形模型。 变分波形模型根据考虑在标称波形和扰动波形之间出现的变化的多个波形变换算子将标称波形变换为扰动波形。 变分波形传播分量被配置为根据变化波形模型将变化波形传播通过定时弧从数字电路的至少一个输入到至少一个输出。
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公开(公告)号：US07620921B2
公开(公告)日：2009-11-17
申请号：US11741164
申请日：2007-04-27
申请人： Eric A. Foreman , Gary D. Grise , Peter A. Habitz , Vikram Iyengar , David E. Lackey , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
发明人： Eric A. Foreman , Gary D. Grise , Peter A. Habitz , Vikram Iyengar , David E. Lackey , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F2217/10
摘要： Methods, systems and program products for evaluating an IC chip are disclosed. In one embodiment, the method includes running a statistical static timing analysis (SSTA) of a full IC chip design; creating at-functional-speed test (AFST) robust paths for an IC chip, the created robust paths representing a non-comprehensive list of AFST robust paths for the IC chip; and re-running the SSTA with the SSTA delay model setup based on the created robust paths. A process coverage is calculated for evaluation from the SSTA runnings; and a particular IC chip is evaluated based on the process coverage.
摘要翻译： 公开了用于评估IC芯片的方法，系统和程序产品。 在一个实施例中，该方法包括运行全IC芯片设计的统计静态时序分析（SSTA）; 创建用于IC芯片的功能速度测试（AFST）鲁棒路径，所创建的鲁棒路径表示IC芯片的AFST鲁棒路径的非全面列表; 并基于创建的鲁棒路径，使用SSTA延迟模型设置重新运行SSTA。 计算过程覆盖率用于从SSTA运行中进行评估; 并且基于处理覆盖来评估特定的IC芯片。
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7.发明申请METHOD AND APPARATUS FOR INCREMENTALLY COMPUTING CRITICALITY AND YIELD GRADIENT 有权用于更严格地计算关键度和等级的方法和装置公开(公告)号：US20090100393A1
公开(公告)日：2009-04-16
申请号：US11870672
申请日：2007-10-11
IPC分类号： G06F17/50
CPC分类号： G06F17/5045 , G06F17/5031
摘要： In one embodiment, the invention is a method and apparatus for incrementally computing criticality and yield gradient. One embodiment of a method for computing a diagnostic metric for a circuit includes modeling the circuit as a timing graph, determining a chip slack for the circuit, determining a slack of at least one diagnostic entity, and computing a diagnostic metric relating to the diagnostic entity(ies) from the chip slack and the slack of the diagnostic entity(ies).
摘要翻译： 在一个实施例中，本发明是用于递增地计算临界度和屈服梯度的方法和装置。 用于计算电路的诊断度量的方法的一个实施例包括将电路建模为定时图，确定电路的芯片松弛，确定至少一个诊断实体的松弛，以及计算与诊断实体有关的诊断度量 （ies）从芯片松弛和诊断实体的松弛。
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8.发明授权Method and apparatus for generating test patterns for use in at-speed testing 有权用于生成用于速度测试的测试模式的方法和装置公开(公告)号：US08359565B2
公开(公告)日：2013-01-22
申请号：US13439188
申请日：2012-04-04
CPC分类号： G01R31/318328 , G01R31/318342
摘要： In one embodiment, the invention is a method and apparatus generating test patterns for use in at-speed testing. One embodiment of a method for use by a general purpose computing device that is configured to generate a set of test patterns with which to test an integrated circuit chip includes receiving, by an input device of the general purpose computing device, statistical timing information relating to the integrated circuit chip and a logic circuit of the integrated circuit chip and generating, by a processor of the general purpose computing device, the set of test patterns in accordance with the statistical timing information while simultaneously selecting a set of paths on which to test the set of test patterns.
摘要翻译： 在一个实施例中，本发明是产生用于在速测试中的测试图案的方法和装置。 由通用计算设备使用的方法的一个实施例被配置为生成用于测试集成电路芯片的一组测试图案，包括由通用计算设备的输入设备接收与 所述集成电路芯片和所述集成电路芯片的逻辑电路，并且由所述通用计算设备的处理器根据所述统计定时信息生成所述一组测试图案，同时选择一组在其上测试所述的路径 一套测试模式。
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9.发明授权公开(公告)号：US08340939B2
公开(公告)日：2012-12-25
申请号：US12610090
申请日：2009-10-30
IPC分类号： G01R31/00
CPC分类号： G01R31/31835
摘要： In one embodiment, the invention is a method and apparatus for selecting paths for use in at-speed testing. One embodiment of a method for selecting a set of n paths with which to test an integrated circuit chip includes: organizing the set of n paths into a plurality of sub-sets, receiving a new candidate path, and adding the new candidate path to one of the sub-sets when the new candidate path improves the process coverage metric of the sub-sets.
摘要翻译： 在一个实施例中，本发明是用于选择在速度测试中使用的路径的方法和装置。 用于选择用于测试集成电路芯片的n个路径的集合的方法的一个实施例包括：将n个路径的集合组织成多个子集，接收新的候选路径，并将新的候选路径添加到一个 当新的候选路径改进子集的过程覆盖度量时，子集的子集。
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10.发明授权Method and apparatus for efficient incremental statistical timing analysis and optimization 有权用于高效增量统计时序分析和优化的方法和装置公开(公告)号：US08104005B2
公开(公告)日：2012-01-24
申请号：US12244512
申请日：2008-10-02
申请人： Debjit Sinha , Natesan Venkateswaran , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
发明人： Debjit Sinha , Natesan Venkateswaran , Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G06F2217/10 , G06F2217/84
摘要： In one embodiment, the invention is a method and apparatus for efficient incremental statistical timing analysis and optimization. One embodiment of a method for determining an incremental extrema of n random variables, given a change to at least one of the n random variables, includes obtaining the n random variables, obtaining a first extrema for the n random variables, where the first extrema is an extrema computed prior to the change to the at least one of the n random variables, removing the at least one of the n random variables to form an (n−1) subset, computing a second extrema for the (n−1) subset in accordance with the first extrema and the at least one of the n random variables, and outputting a new extrema of the n random variables incrementally based on the extrema of the (n−1) subset and the at least one of the n random variables that changed.
摘要翻译： 在一个实施例中，本发明是一种用于有效增量统计时序分析和优化的方法和装置。 给定对n个随机变量中的至少一个的改变的用于确定n个随机变量的增量极值的方法的一个实施例包括获得n个随机变量，获得n个随机变量的第一极值，其中第一极值是 在对所述n个随机变量中的至少一个随机变量进行改变之前计算的极值，去除所述n个随机变量中的所述至少一个以形成（n-1）子集，计算所述（n-1）子集的第二极值 根据第一极值和n个随机变量中的至少一个，并且基于第（n-1）个子集的极值和n个随机变量中的至少一个来递增地输出n个随机变量的新的极值 改变了。
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