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公开(公告)号:US10431445B2
公开(公告)日:2019-10-01
申请号:US15763813
申请日:2015-10-09
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Kazushige Nishimura , Hiroyuki Satake , Masuyuki Sugiyama , Hideki Hasegawa , Tomoyuki Sakai
Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.
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公开(公告)号:US09601321B2
公开(公告)日:2017-03-21
申请号:US14415226
申请日:2013-06-14
Applicant: Hitachi High-Technologies Corporation
Inventor: Akihito Kaneko , Yohei Kawaguchi , Masuyuki Sugiyama , Kazushige Nishimura
CPC classification number: H01J49/0036 , H01J49/0009 , H01J49/0022 , H01J49/0027 , H01J49/26 , H01J49/4265
Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.
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公开(公告)号:US09287105B2
公开(公告)日:2016-03-15
申请号:US13760284
申请日:2013-02-06
Applicant: Hitachi High-Technologies Corporation
Inventor: Yohei Kawaguchi , Yuichiro Hashimoto , Masuyuki Sugiyama , Shun Kumano , Akihito Kaneko , Masahito Togami , Kazushige Nishimura , Hiroyuki Inoue
CPC classification number: H01J49/26 , H01J49/0031 , H01J49/0036
Abstract: There is a tendency of the intensity and the shape of a spectrum to be measured transitioning with the passage of measured time, depending on the volatility and the reactivity of a component. A mass spectrometric system includes: a mass spectrometric unit that measures a specimen and outputs a mass spectrum; and an estimator that has an estimation rule on content information, the estimation rule being assigned to each component and each measurement time. The estimator estimates, based on a mass spectrum output from the mass spectrometric unit, content information on each component of a plurality of components that may be contained in the specimen in accordance with the estimation rule.
Abstract translation: 根据组分的挥发性和反应性,测量光谱的强度和形状趋于随着测量时间的流逝而过渡。 质谱系统包括:测量样品并输出质谱的质谱单位; 以及估计器,其对内容信息具有估计规则,所述估计规则被分配给每个组件和每个测量时间。 估计器基于质谱单位输出的质谱估计根据估计规则可以包含在样本中的多个分量的每个分量的内容信息。
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公开(公告)号:US10551346B2
公开(公告)日:2020-02-04
申请号:US16323168
申请日:2016-08-19
Applicant: Hitachi High-Technologies Corporation
Inventor: Kazushige Nishimura , Masuyuki Sugiyama , Hideki Hasegawa , Yuichiro Hashimoto
Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.
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公开(公告)号:US20150206728A1
公开(公告)日:2015-07-23
申请号:US14415226
申请日:2013-06-14
Applicant: Hitachi High-Technologies Corporation
Inventor: Akihito Kaneko , Yohei Kawaguchi , Masuyuki Sugiyama , Kazushige Nishimura
CPC classification number: H01J49/0036 , H01J49/0009 , H01J49/0022 , H01J49/0027 , H01J49/26 , H01J49/4265
Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.
Abstract translation: 确定质谱仪装置中的测量状态,使得可以自动确定下一轮测量的测量方法。 质谱仪装置(1)具备:计算质谱中离子总量的第一计算部(6) 计算从质谱中出现的峰值中选出的代表峰值的半值宽度的第二计算单元(6) 以及控制单元(7),其基于代表峰的总离子量和半值宽度来确定在下一轮测量中使用的测量方法。
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公开(公告)号:US10684256B2
公开(公告)日:2020-06-16
申请号:US16078286
申请日:2017-02-28
Applicant: Hitachi High-Technologies Corporation
Inventor: Hiroyuki Satake , Kazushige Nishimura , Hideki Hasegawa , Masuyuki Sugiyama
Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.
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公开(公告)号:US08803084B2
公开(公告)日:2014-08-12
申请号:US13726294
申请日:2012-12-24
Applicant: Hitachi High-Technologies Corporation
Inventor: Kazushige Nishimura , Yuichiro Hashimoto , Masuyuki Sugiyama , Masuyoshi Yamada , Hidetoshi Morokuma
IPC: H01J49/10
CPC classification number: H01J49/105 , H05H1/2406 , H05H2001/245 , H05H2001/2456
Abstract: A mass spectrometer featured in including an ion source including a first electrode, a second electrode, and a dielectric unit having a sample introducing unit and a sample discharging unit and provided between the first electrode and the second electrode, a power source of ionizing a sample by a discharge generated between the first electrode and the second electrode by applying an alternating current voltage to either one of the first electrode and the second electrode, a mass spectrometry unit of analyzing an ion discharged from the sample discharging unit, and a light irradiating unit of irradiating an area of generating the discharge with light.
Abstract translation: 一种质谱仪,其特征在于包括离子源,所述离子源包括第一电极,第二电极和具有样品引入单元和样品排出单元并且设置在所述第一电极和所述第二电极之间的电介质单元, 通过对第一电极和第二电极中的任一个施加交流电压,通过对第一电极和第二电极之间产生的放电进行分析,分析从取样放出单元排出的离子的质谱分析单元和光照射单元 用光照射产生放电的区域。
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