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    Nucleic Acid Analyzer
    1.
    发明申请
    Nucleic Acid Analyzer 审中-公开

    公开(公告)号：US20180037930A1

    公开(公告)日：2018-02-08

    申请号：US15548574

    申请日：2015-02-23

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Manami NAMMOKU ,  Terumi TAMURA ,  Kohshi MAEDA ,  Daisuke MORISHIMA ,  Toshinari SAKURAI ,  Wataru SATO

    IPC: C12Q1/68 ,  B01L7/00

    Abstract: The purpose of the invention is to provide a nucleic acid analyzer that sets and executes temperature regulation, said temperature regulation matching the characteristics of analyzing items and the configuration of the analyzer, by a simple operation while preventing deterioration in analytical performance caused by partial overheating of a liquid reaction mixture to thereby improve temperature change speed and shorten analysis time. To achieve the above purpose, provided is a method wherein, in the case of performing overshooting: as a first processing, the temperature is continuously elevated until reaching a target overshoot temperature; as a second processing, after reaching the aforesaid temperature, the overshoot target temperature is maintained for a preset period of time; and, as a third processing, the temperature is continuously lowered until reaching a target temperature of the liquid reaction mixture. By executing the first to third processings, regulation is conducted so that temperature measurement values are in a trapezoidal form.

    Operation Method for Control Materials and Automated Analyzer
    2.
    发明申请
    Operation Method for Control Materials and Automated Analyzer 审中-公开

    公开(公告)号：US20180030433A1

    公开(公告)日：2018-02-01

    申请号：US15550502

    申请日：2015-02-23

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Kohshi MAEDA ,  Terumi TAMURA ,  Daisuke MORISHIMA

    IPC: C12N15/10 ,  C12Q1/68

    Abstract: Operation methods for control material conventionally differ in each inspection laboratory, and automatic operation according to laboratory operation standards has been difficult. Further, since operation for control material is complex and devices are operated on the basis of judgments by inspectors in accordance with results of measurement for control materials, highly-trained inspectors have been necessary. The present invention comprises multiple settings for automatically operating a control material in an automated analyzer, and executes an optimal setting according to the test laboratory and inspection items, and also executes an operation process for control material. If there is a possibility of a problem in an inspection process, the control material is automatically re-measured so that wasteful inspection can be prevented and the inspection can be automatically continued.

    Automatic Analysis Device
    3.
    发明申请
    Automatic Analysis Device 审中-公开
    自动分析装置

    公开(公告)号：US20160238624A1

    公开(公告)日：2016-08-18

    申请号：US15028807

    申请日：2014-10-21

    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

    Inventor： Daisuke MORISHIMA ,  Kohshi MAEDA

    IPC: G01N35/00 ,  C12Q1/68

    CPC classification number: G01N35/00594 ,  C12Q1/6813 ,  G01N35/00663 ,  G01N35/00693 ,  G01N35/1002 ,  G01N2035/00673 ,  G01N2035/1034

    Abstract: Provided is an automatic analysis device capable of reducing a reagent cost. In the present invention, in each mixed reagent preparation cycle, an amount of mixed reagent for N analyses is mixed and prepared, and an amount of mixed reagent for one analysis is dispensed from the amount of mixed reagent for N analyses and used to analyze one sample. Minimum (Nmin) and maximum (Nmax) values for N are determined for a control unit beforehand, and if the analysis of J samples is requested, the control unit sets the value of N at the time of a mixed reagent preparation cycle within a range from Nmin to Nmax so as to minimize the remaining mixed reagent.

    Abstract translation: 提供能够降低试剂成本的自动分析装置。 在本发明中，在各混合试剂制备循环中，混合制备N分析用混合试剂的量，并从N分析用混合试剂的量中分配一次分析用混合试剂量，并用于分析 样品。 对于控制单元预先确定N的最小（Nmin）和最大（Nmax）值，并且如果要求J样本的分析，则控制单元将混合试剂制备循环时的N值设定在范围内 从Nmin到Nmax，以便使剩余的混合试剂最小化。

    Nucleic Acid Analysis Device and Diagnosis Method
    5.
    发明申请
    Nucleic Acid Analysis Device and Diagnosis Method 有权
    核酸分析装置及诊断方法

    公开(公告)号：US20160245690A1

    公开(公告)日：2016-08-25

    申请号：US14913809

    申请日：2014-07-03

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Manami NAMMOKU ,  Kohshi MAEDA ,  Takehiko HOSOIRI ,  Yasunori SHOJI

    IPC: G01J1/44 ,  G01N1/38 ,  G01N1/30

    CPC classification number: G01J1/44 ,  G01J2001/444 ,  G01N1/30 ,  G01N1/38 ,  G01N21/51 ,  G01N21/645

    Abstract: A nucleic acid analysis device is provided that is capable of quickly detecting device abnormalities, and the like. This device is provided with a temperature control block (1) for holding a tube (10) that includes a sample, a photometer (6), and a device diagnosis unit. The photometer (6) is provided with an LED (11) for irradiating light toward the temperature control block (1) in a state in which the tube (10) is held and a fluorescence detector (20) for receiving light emitted by the sample in response to the irradiation of light from the LED (11). The device diagnosis unit causes the LED (11) to irradiate light toward the temperature control block (1) in a state in which the tube (10) is not held, causes the fluorescence detector (20) to detect the resulting scattered light, and diagnoses the photometer (6) on the basis of the intensity of the scattered light.

    Abstract translation: 提供能够快速检测装置异常的核酸分析装置等。 该装置设置有用于保持包括样品的管（10）的温度控制块（1），光度计（6）和设备诊断单元。 光度计（6）具有在保持管（10）的状态下朝向温度控制块（1）照射光的LED（11）和用于接收由样品发出的光的荧光检测器（20） 响应于来自LED（11）的光的照射。 设备诊断单元使得LED（11）在不保持管（10）的状态下朝向温度控制块（1）照射光，使得荧光检测器（20）检测所得到的散射光，并且 基于散射光的强度来诊断光度计（6）。

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