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公开(公告)号:US07635635B2
公开(公告)日:2009-12-22
申请号:US11400731
申请日:2006-04-06
申请人: Hamza Yilmaz , Qi Wang , Minhua Li , Chung-Lin Wu
发明人: Hamza Yilmaz , Qi Wang , Minhua Li , Chung-Lin Wu
IPC分类号: H01L21/46
CPC分类号: H01L21/76251 , H01L21/6835 , H01L24/28 , H01L29/78603 , H01L2224/16 , H01L2224/29111 , H01L2224/2919 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01024 , H01L2924/01029 , H01L2924/01033 , H01L2924/01042 , H01L2924/01047 , H01L2924/0105 , H01L2924/01058 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/10253 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/157 , H01L2924/19041 , H01L2924/19043 , H01L2924/3011 , H01L2924/351 , H01L2924/01026 , H01L2924/01028 , H01L2924/3512 , H01L2924/00 , H01L2924/00012 , H01L2924/0665
摘要: A method of bonding a semiconductor substrate to a metal substrate is disclosed. In some embodiments the method includes forming a semiconductor device in a semiconductor substrate, the semiconductor device comprising a first surface. The method further includes obtaining a metal substrate. The metal substrate is bonded to the first surface of the semiconductor device, wherein at least a portion of the metal substrate forms an electrical terminal for the semiconductor device.
摘要翻译: 公开了将半导体衬底接合到金属衬底的方法。 在一些实施例中,该方法包括在半导体衬底中形成半导体器件,该半导体器件包括第一表面。 该方法还包括获得金属基底。 金属基板结合到半导体器件的第一表面,其中金属基板的至少一部分形成用于半导体器件的电端子。
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公开(公告)号:US20070238263A1
公开(公告)日:2007-10-11
申请号:US11400731
申请日:2006-04-06
申请人: Hamza Yilmaz , Qi Wang , Minhua Li , Chung-Lin Wu
发明人: Hamza Yilmaz , Qi Wang , Minhua Li , Chung-Lin Wu
IPC分类号: H01L21/30
CPC分类号: H01L21/76251 , H01L21/6835 , H01L24/28 , H01L29/78603 , H01L2224/16 , H01L2224/29111 , H01L2224/2919 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01024 , H01L2924/01029 , H01L2924/01033 , H01L2924/01042 , H01L2924/01047 , H01L2924/0105 , H01L2924/01058 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/0132 , H01L2924/01322 , H01L2924/0133 , H01L2924/10253 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/157 , H01L2924/19041 , H01L2924/19043 , H01L2924/3011 , H01L2924/351 , H01L2924/01026 , H01L2924/01028 , H01L2924/3512 , H01L2924/00 , H01L2924/00012 , H01L2924/0665
摘要: A method of bonding a semiconductor substrate to a metal substrate is disclosed. In some embodiments the method includes forming a semiconductor device in a semiconductor substrate, the semiconductor device comprising a first surface. The method further includes obtaining a metal substrate. The metal substrate is bonded to the first surface of the semiconductor device, wherein at least a portion of the metal substrate forms an electrical terminal for the semiconductor device.
摘要翻译: 公开了将半导体衬底接合到金属衬底的方法。 在一些实施例中,该方法包括在半导体衬底中形成半导体器件,该半导体器件包括第一表面。 该方法还包括获得金属基底。 金属基板结合到半导体器件的第一表面,其中金属基板的至少一部分形成用于半导体器件的电端子。
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3.
公开(公告)号:US20110201179A1
公开(公告)日:2011-08-18
申请号:US13095584
申请日:2011-04-27
申请人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
发明人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
IPC分类号: H01L21/78
CPC分类号: H01L21/78
摘要: A method for obtaining individual dies from a semiconductor structure is disclosed. The semiconductor structure includes a device layer, and the device layer in turn includes active regions separated by predefined spacings. Thick metal is selectively formed on backside of the device layer such that thick metal is formed on backside of active regions but not on backside of the predefined spacings. The semiconductor structure is then cut along the predefined spacings to separate the active regions with thick metal on their backside into individual dies.
摘要翻译: 公开了一种从半导体结构获得单个管芯的方法。 半导体结构包括器件层,器件层又包括由预定间隔隔开的有源区。 在器件层的背侧选择性地形成厚金属,使得在有源区的背面形成厚金属,而不在预定间隔的背面形成厚金属。 然后沿着预定的间隔切割半导体结构,以将其背面的厚金属的活性区域分离成单独的管芯。
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公开(公告)号:US07768075B2
公开(公告)日:2010-08-03
申请号:US11400729
申请日:2006-04-06
申请人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
发明人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
IPC分类号: H01L27/088
CPC分类号: H01L23/3114 , H01L23/481 , H01L24/13 , H01L24/14 , H01L24/81 , H01L25/072 , H01L2224/05568 , H01L2224/05573 , H01L2224/06102 , H01L2224/13 , H01L2224/13022 , H01L2224/13099 , H01L2224/1403 , H01L2224/14051 , H01L2224/1411 , H01L2224/8121 , H01L2224/81815 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/1423 , H01L2924/30107 , H01L2924/00 , H01L2224/05599
摘要: A semiconductor die package is disclosed. The semiconductor die package comprises a metal substrate, and a semiconductor die comprising a first surface comprising a first electrical terminal, a second surface including a second electrical terminal, and at least one aperture. The metal substrate is attached to the second surface. A plurality of conductive structures is on the semiconductor die, and includes at least one conductive structure disposed in the at least one aperture. Other conductive structures may be disposed on the first surface of the semiconductor die.
摘要翻译: 公开了一种半导体管芯封装。 半导体管芯封装包括金属基板和半导体管芯,其包括第一表面,第一表面包括第一电端子,第二表面,包括第二电端子和至少一个孔。 金属基板附接到第二表面。 多个导电结构在半导体管芯上,并且包括设置在该至少一个孔中的至少一个导电结构。 其他导电结构可以设置在半导体管芯的第一表面上。
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公开(公告)号:US20070235886A1
公开(公告)日:2007-10-11
申请号:US11400729
申请日:2006-04-06
申请人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James Murphy , John Diroll
发明人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James Murphy , John Diroll
IPC分类号: H01L23/48
CPC分类号: H01L23/3114 , H01L23/481 , H01L24/13 , H01L24/14 , H01L24/81 , H01L25/072 , H01L2224/05568 , H01L2224/05573 , H01L2224/06102 , H01L2224/13 , H01L2224/13022 , H01L2224/13099 , H01L2224/1403 , H01L2224/14051 , H01L2224/1411 , H01L2224/8121 , H01L2224/81815 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/1423 , H01L2924/30107 , H01L2924/00 , H01L2224/05599
摘要: A semiconductor die package is disclosed. The semiconductor die package comprises a metal substrate, and a semiconductor die comprising a first surface comprising a first electrical terminal, a second surface including a second electrical terminal, and at least one aperture. The metal substrate is attached to the second surface. A plurality of conductive structures is on the semiconductor die, and includes at least one conductive structure disposed in the at least one aperture. Other conductive structures may be disposed on the first surface of the semiconductor die.
摘要翻译: 公开了一种半导体管芯封装。 半导体管芯封装包括金属基板和半导体管芯,其包括第一表面,第一表面包括第一电端子,第二表面,包括第二电端子和至少一个孔。 金属基板附接到第二表面。 多个导电结构在半导体管芯上,并且包括设置在该至少一个孔中的至少一个导电结构。 其他导电结构可以设置在半导体管芯的第一表面上。
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公开(公告)号:US08329508B2
公开(公告)日:2012-12-11
申请号:US12823805
申请日:2010-06-25
申请人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
发明人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
CPC分类号: H01L23/3114 , H01L23/481 , H01L24/13 , H01L24/14 , H01L24/81 , H01L25/072 , H01L2224/05568 , H01L2224/05573 , H01L2224/06102 , H01L2224/13 , H01L2224/13022 , H01L2224/13099 , H01L2224/1403 , H01L2224/14051 , H01L2224/1411 , H01L2224/8121 , H01L2224/81815 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/1423 , H01L2924/30107 , H01L2924/00 , H01L2224/05599
摘要: A semiconductor die package is disclosed. The semiconductor die package comprises a metal substrate, and a semiconductor die comprising a first surface comprising a first electrical terminal, a second surface including a second electrical terminal, and at least one aperture. The metal substrate is attached to the second surface. A plurality of conductive structures is on the semiconductor die, and includes at least one conductive structure disposed in the at least one aperture. Other conductive structures may be disposed on the first surface of the semiconductor die.
摘要翻译: 公开了一种半导体管芯封装。 半导体管芯封装包括金属基板和半导体管芯,其包括第一表面,第一表面包括第一电端子,第二表面,包括第二电端子和至少一个孔。 金属基板附接到第二表面。 多个导电结构在半导体管芯上,并且包括设置在该至少一个孔中的至少一个导电结构。 其他导电结构可以设置在半导体管芯的第一表面上。
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7.
公开(公告)号:US20090181520A1
公开(公告)日:2009-07-16
申请号:US12174863
申请日:2008-07-17
申请人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
发明人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
IPC分类号: H01L21/78
CPC分类号: H01L21/78
摘要: A method for obtaining individual dies from a semiconductor structure is disclosed. The semiconductor structure includes a device layer, and the device layer in turn includes active regions separated by predefined spacings. Thick metal is selectively formed on backside of the device layer such that thick metal is formed on backside of active regions but not on backside of the predefined spacings. The semiconductor structure is then cut along the predefined spacings to separate the active regions with thick metal on their backside into individual dies.
摘要翻译: 公开了一种从半导体结构获得单个管芯的方法。 半导体结构包括器件层,器件层又包括由预定间隔隔开的有源区。 在器件层的背侧选择性地形成厚金属,使得在有源区的背面形成厚金属,而不在预定间隔的背面形成厚金属。 然后沿着预定的间隔切割半导体结构,以将其背面的厚金属的活性区域分离成单独的管芯。
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8.
公开(公告)号:US08343852B2
公开(公告)日:2013-01-01
申请号:US13095584
申请日:2011-04-27
申请人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
发明人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
IPC分类号: H01L21/00
CPC分类号: H01L21/78
摘要: A method for obtaining individual dies from a semiconductor structure is disclosed. The semiconductor structure includes a device layer, and the device layer in turn includes active regions separated by predefined spacings. Thick metal is selectively formed on backside of the device layer such that thick metal is formed on backside of active regions but not on backside of the predefined spacings. The semiconductor structure is then cut along the predefined spacings to separate the active regions with thick metal on their backside into individual dies.
摘要翻译: 公开了一种从半导体结构获得单个管芯的方法。 半导体结构包括器件层,器件层又包括由预定间隔隔开的有源区。 在器件层的背侧选择性地形成厚金属,使得在有源区的背面形成厚金属,而不在预定间隔的背面形成厚金属。 然后沿着预定的间隔切割半导体结构,以将其背面的厚金属的活性区域分离成单独的管芯。
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9.
公开(公告)号:US07951688B2
公开(公告)日:2011-05-31
申请号:US12174863
申请日:2008-07-17
申请人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
发明人: Minhua Li , Qi Wang , Gordon Sim , Matthew Reynolds , Suku Kim , James J. Murphy , Hamza Yilmaz
CPC分类号: H01L21/78
摘要: A method for obtaining individual dies from a semiconductor structure is disclosed. The semiconductor structure includes a device layer, and the device layer in turn includes active regions separated by predefined spacings. Thick metal is selectively formed on backside of the device layer such that thick metal is formed on backside of active regions but not on backside of the predefined spacings. The semiconductor structure is then cut along the predefined spacings to separate the active regions with thick metal on their backside into individual dies.
摘要翻译: 公开了一种从半导体结构获得单个管芯的方法。 半导体结构包括器件层,器件层又包括由预定间隔隔开的有源区。 在器件层的背侧选择性地形成厚金属,使得在有源区的背面形成厚金属,而不在预定间隔的背面形成厚金属。 然后沿着预定的间隔切割半导体结构,以将其背面的厚金属的活性区域分离成单独的管芯。
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公开(公告)号:US20100267200A1
公开(公告)日:2010-10-21
申请号:US12823805
申请日:2010-06-25
申请人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
发明人: Hamza Yilmaz , Steven Sapp , Qi Wang , Minhua Li , James J. Murphy , John Robert Diroll
CPC分类号: H01L23/3114 , H01L23/481 , H01L24/13 , H01L24/14 , H01L24/81 , H01L25/072 , H01L2224/05568 , H01L2224/05573 , H01L2224/06102 , H01L2224/13 , H01L2224/13022 , H01L2224/13099 , H01L2224/1403 , H01L2224/14051 , H01L2224/1411 , H01L2224/8121 , H01L2224/81815 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/01082 , H01L2924/014 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/14 , H01L2924/1423 , H01L2924/30107 , H01L2924/00 , H01L2224/05599
摘要: A semiconductor die package is disclosed. The semiconductor die package comprises a metal substrate, and a semiconductor die comprising a first surface comprising a first electrical terminal, a second surface including a second electrical terminal, and at least one aperture. The metal substrate is attached to the second surface. A plurality of conductive structures is on the semiconductor die, and includes at least one conductive structure disposed in the at least one aperture. Other conductive structures may be disposed on the first surface of the semiconductor die.
摘要翻译: 公开了一种半导体管芯封装。 半导体管芯封装包括金属基板和半导体管芯,其包括第一表面,第一表面包括第一电端子,第二表面,包括第二电端子和至少一个孔。 金属基板附接到第二表面。 多个导电结构在半导体管芯上,并且包括设置在该至少一个孔中的至少一个导电结构。 其他导电结构可以设置在半导体管芯的第一表面上。
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