摘要:
An apparatus for atomizing a sample comprises a cuvette of heating material into which a sample is introduced, a pair of electrodes of supplying an electric current to the cuvette, thereby heating and atomizing the sample, supports of supporting the pair of the electrodes, a means for supplying light to the atomized sample and a means of slidably maintaining at least one of the pair of the electrodes against the cuvette in a predetermined range of contact pressures, where the heating temperature of the cuvette can be maintained constant with improved reproducibility of analytical values.
摘要:
A cuvette used in a flameless atomizer is hollow and includes an opening at both ends and a hole in a radial direction substantially at its central portion. The cuvette is made of a conductive material and Joule-heated by currents flowing therethrough. The interior of the cuvette is divided substantially into three sections: a sample mount section at which a sample introduced through the hole of the cuvette is disposed; a light beam path section through which light incident from the opening at one end of the cuvette passes and goes out of the opening at the other end; and an absorption cell section at which the light beam path section intersects with atomic vapors generated from the sample disposed at the sample mount section. The electric resistance of the cuvette is made smaller at the sample mount section than at a portion near the absorption cell section. This allows the higher temperature of the portions near the absorption cell section than that of the sample mount section. Therefore, almost all of the atomic vapors in the cuvette exist at the absorption cell portion, and the application of a magnetic field to the absorption cell section allows a great improvement in analysis precision and sensitivity of the flameless atomizer for atomic absorption analysis using a Zeeman effect.
摘要:
A defective particle measuring apparatus that irradiates focused laser light on a sample, images scattered light from the sample, and measures defective particles in the sample based on the image result, includes a position deviation computing portion which, based on an in-plane intensity distribution of scattered light of each defective particle that is imaged, obtains a deviation from a focal point position on an image point side of the scattered light of each defective particle and calculates a position deviation amount in a depth direction of the defective particle corresponding to the deviation from the focal point position, a light intensity correcting portion for correcting the light intensity of the scattered light of the defective particle corresponding to the position deviation amount in the depth direction, and a size determining portion for determining the defective particle size based on the light intensity corrected by the light intensity correcting portion. Thus, the size of the defective particles can be determined at a high precision by a simple constitution in a short time, and density distribution of the defective particles can be obtained.
摘要:
A defect evaluation apparatus of this invention includes a laser irradiation unit for obliquely irradiating a laser beam onto an object, and an observation unit for observing scattered light from inside the object or a surface of the object. The laser irradiation unit irradiates the laser beam onto the object from a plurality of incident directions around an observation optical axis, and the observation unit receives the scattered light from the object to obtain shape information of a defect in the object or on the surface of the object.
摘要:
The object of this invention is to provide an atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorptiometer, which enable a light absorption measurement based on the Zeeman effect highly capable of background correction and eliminate the need for the troublesome work of dismounting a magnet. For this purpose, the following configuration is employed. First, the specimen, hydrochloric acid, and sodium borohydride are delivered and mixed by the peristaltic pump 10 to produce a metallic hydride. The generated gas-liquid mixture solution is separated by the separator 12 into a specimen gas and liquids. The separated specimen gas is introduced into the heating section 30. Electricity is supplied from the power source 28 to the specimen heating section 30 where the specimen gas introduced is heated and separated into hydrogen and a specimen metal vapor to be measured. The specimen metal vapor is then introduced into the measuring section 34 arranged between magnetic poles of the magnet 32 where the metal vapor is subjected to the atomic absorptiometric analysis based on the Zeeman effect.
摘要:
A defect estimating apparatus includes a laser radiating unit For obliquely radiating laser light on a surface to be observed of an object to be inspected, an observing unit for observing, through the surface to be observed, scattered light produced From internal defects or particles of the object by refracted light of the laser light, and observing scattered light or reflected light produced from flaws or particles on the surface by tile laser light, and a component separating unit for allowing the observing unit to perform observation by using both light containing primarily a p-polarized light component of the laser light and light containing primarily an s-polarized light component of the laser light.
摘要:
A grinding machine provided with an apparatus for changing a feed rate of a grinding wheel relative to a workpiece just before the grinding wheel comes into contact with the workpiece. An electrode device is mounted adjacent to the grinding wheel and connected to an electric power source for applying a potential to the surface of the grinding wheel. A detecting device detects a difference of potential between the grinding wheel and the workpiece to generate an output voltage. A memory device memorizes the output voltage detected when the grinding wheel is distant from the workpiece. A setting device reduces the memorized output voltage at a predetermined rate to provide a reference voltage corresponding to a predetermined gap between the grinding wheel and the workpiece. A comparator circuit compares the output voltage with the reference voltage to generate a feed rate changing signal when the output voltage attains the reference voltage. A control device controls a feed device so as to change the feed rate of a wheel slide in accordance with the feed rate changing signal.
摘要:
In an analysis device, an auxiliary gas supplied from a compressor 1 is introduced from an auxiliary gas inlet 3 via a pipe 2 to a burner through a pressure regulator 5, a pressur meter 6, a pressure switch 7 and a connecting joint 8. On the other hand, a combustible gas supplied from a gas bomb 9 is introduced from a combustible gas inlet 11 via a pipe 10 to the burner through a first electromagnetic valve 12, a pressure regulator 13, a pressure meter 14, a needle valve 15, a second electromagnetic valve 16 and a connecting joint 17 and further via a tube. An auxiliary gas use block 4, on which auxiliary gas flow controlling elements such as the pressure regulator 5, the pressure meter 6 and the pressure switch 7 are secured, is provided independent and separated from a combustible gas use block 18, on which combustible gas flow controlling elements such as the first electromagnetic valve 12, the pressure regulator 13, the pressure meter 14, the needle valve 15 and the second electromagnetic valve 16 are secured. Whereby the analysis device using chemical combustion flame having an element safety is provided in which possible danger caused by such as the gas leakage and the gas mixing between the combustible gas passage and the auxiliary gas passage is further reduced.
摘要:
A light beam emitted by a hollow cathode lamp is concentrated on a central portion of an electrothermal sample atomizing apparatus by a concave mirror. The light concentrated on the central portion of the electrothermal sample atomizing apparatus is further concentrated on a central portion of a flame produced in a burner type sample atomizing apparatus by a lens. The light traveled through the burner type sample atomizing apparatus is condensed by a concave mirror, reflected by a flat mirror, and concentrated on an entrance slit of a spectroscope. Light outgoing through an exit slit of the spectroscope is detected by a photodetector.
摘要:
A size of particle or defect in an object is measured. A laser beam is guided through an optical system into the object. A light receiving element receives scattered light from a particle or a defect in the object. A scattering image is formed by an image processor from the scattered light thus received. The size of particle or defect is obtained by integrating a scattering intensity of the scattered light. Also, a size distribution of particle or defect in an object may be acquired by detecting a maximum scattering intensity of each particle or defect. A polarization dependency of scattering may be checked as well.