Memory and semiconductor device
    1.
    发明申请
    Memory and semiconductor device 有权
    存储器和半导体器件

    公开(公告)号:US20060092737A1

    公开(公告)日:2006-05-04

    申请号:US11265894

    申请日:2005-11-03

    IPC分类号: G11C7/02

    摘要: A memory includes: memory elements arranged in a matrix, each memory element having such characteristics that when an electric signal at a level equal to or higher than that of a first threshold signal is applied to the memory element, the resistance thereof is changed from a high value to a low value, and when an electric signal at a level equal to or higher than that of a second threshold signal is applied thereto, the resistance is changed from the low value to the high value, the polarities of the first and second threshold signals being different from each other; electric circuits for applying electric signals to the memory elements; and detection units each for measuring a current flowing through the corresponding memory element or a voltage applied thereto from the start of the application of electric signals to detect whether the resistance is high or low.

    摘要翻译: 存储器包括:排列成矩阵的存储器元件,每个存储元件具有这样的特性,即当等于或高于第一阈值信号的电信号被施加到存储元件时,其电阻从 高值为低值,当施加等于或高于第二阈值信号的电信号时,电阻从低值变为高值,第一和第二极性的极性 阈值信号彼此不同; 用于向存储元件施加电信号的电路; 以及各自的检测单元,用于测量从开始施加电信号开始流过相应的存储元件的电流或施加到其上的电压,以检测电阻是高还是低。

    Memory and semiconductor device with memory state detection
    2.
    发明授权
    Memory and semiconductor device with memory state detection 有权
    具有存储器状态检测的存储器和半导体器件

    公开(公告)号:US07719873B2

    公开(公告)日:2010-05-18

    申请号:US11265894

    申请日:2005-11-03

    IPC分类号: G11C11/00

    摘要: A memory includes: memory elements arranged in a matrix, each memory element having such characteristics that when an electric signal at a level equal to or higher than that of a first threshold signal is applied to the memory element, the resistance thereof is changed from a high value to a low value, and when an electric signal at a level equal to or higher than that of a second threshold signal is applied thereto, the resistance is changed from the low value to the high value, the polarities of the first and second threshold signals being different from each other; electric circuits for applying electric signals to the memory elements; and detection units each for measuring a current flowing through the corresponding memory element or a voltage applied thereto from the start of the application of electric signals to detect whether the resistance is high or low.

    摘要翻译: 存储器包括:排列成矩阵的存储器元件,每个存储元件具有这样的特性,即当等于或高于第一阈值信号的电信号被施加到存储元件时,其电阻从 高值为低值,当施加等于或高于第二阈值信号的电信号时,电阻从低值变为高值,第一和第二极性的极性 阈值信号彼此不同; 用于向存储元件施加电信号的电路; 以及各自的检测单元,用于测量从开始施加电信号开始流过相应的存储元件的电流或施加到其上的电压,以检测电阻是高还是低。

    Memory device
    3.
    发明授权
    Memory device 有权
    内存设备

    公开(公告)号:US07345908B2

    公开(公告)日:2008-03-18

    申请号:US11456436

    申请日:2006-07-10

    IPC分类号: G11C11/00

    摘要: The present invention is to provide a memory device including: a plurality of memory cells that each include a memory element having a memory layer and first and second electrodes that sandwich the memory layer, the plurality of memory cells being divided into memory blocks of m columns by n rows (m and n are each an integer of not less than 1, m+n≧3), the memory elements in the same memory block having the first electrode that is formed of a single layer in common to the memory elements; and a voltage application unit that applies any voltage to the first electrode of the memory block.

    摘要翻译: 本发明提供一种存储器件,包括:多个存储单元,每个存储单元包括具有存储层的存储元件和夹持存储层的第一和第二电极,多个存储单元被分成m列的存储块 由n行(m和n各自为不小于1的整数,m + n> = 3),相同存储块中的存储元件具有由存储元件共同的单层形成的第一电极 ; 以及向存储块的第一电极施加任何电压的电压施加单元。

    STORAGE DEVICE AND SEMICONDUCTOR APPARATUS
    4.
    发明申请
    STORAGE DEVICE AND SEMICONDUCTOR APPARATUS 失效
    存储器件和半导体器件

    公开(公告)号:US20060279983A1

    公开(公告)日:2006-12-14

    申请号:US11422483

    申请日:2006-06-06

    IPC分类号: G11C11/00

    摘要: A storage device includes a storage element having first and second terminals that cause a first electrical characteristic change when an electric signal of a first threshold level or higher is applied and that cause a second electrical characteristic change, which is asymmetrical to the first electrical characteristic change, when an electric signal of a second threshold level or higher, the polarity of the electric signal of the second threshold level or higher being different from the polarity of the electric signal of the first threshold level or higher, is applied; and a unipolar transistor connected in series with the storage element. One of the first terminal and the second terminal of the storage element is electrically connected to the unipolar transistor. The unipolar transistor has a negative polarity or a positive polarity in accordance with the first terminal or the second terminal electrically connected to the unipolar transistor.

    摘要翻译: 存储装置包括具有第一和第二端子的存储元件,当施加第一阈值电平或更高的电信号并且引起与第一电特性变化不对称的第二电特性变化时,第一和第二端子引起第一电特性变化 当施加第二阈值以上的电信号时,施加与第一阈值电平以上的电信号的极性不同的第二阈值电平以上的电信号的极性; 以及与存储元件串联连接的单极晶体管。 存储元件的第一端子和第二端子之一电连接到单极晶体管。 单极晶体管根据与单极晶体管电连接的第一端子或第二端子具有负极性或正极性。

    Storage device and semiconductor apparatus
    5.
    发明授权
    Storage device and semiconductor apparatus 失效
    存储装置和半导体装置

    公开(公告)号:US07336520B2

    公开(公告)日:2008-02-26

    申请号:US11422483

    申请日:2006-06-06

    IPC分类号: G11C11/00

    摘要: A storage device includes a storage element having first and second terminals that cause a first electrical characteristic change when an electric signal of a first threshold level or higher is applied and that cause a second electrical characteristic change, which is asymmetrical to the first electrical characteristic change, when an electric signal of a second threshold level or higher, the polarity of the electric signal of the second threshold level or higher being different from the polarity of the electric signal of the first threshold level or higher, is applied; and a unipolar transistor connected in series with the storage element. One of the first terminal and the second terminal of the storage element is electrically connected to the unipolar transistor. The unipolar transistor has a negative polarity or a positive polarity in accordance with the first terminal or the second terminal electrically connected to the unipolar transistor.

    摘要翻译: 存储装置包括具有第一和第二端子的存储元件,当施加第一阈值电平或更高的电信号并且引起与第一电特性变化不对称的第二电特性变化时,第一和第二端子引起第一电特性变化 当施加第二阈值以上的电信号时,施加与第一阈值电平以上的电信号的极性不同的第二阈值电平以上的电信号的极性; 以及与存储元件串联连接的单极晶体管。 存储元件的第一端子和第二端子之一电连接到单极晶体管。 单极晶体管根据与单极晶体管电连接的第一端子或第二端子具有负极性或正极性。

    MEMORY DEVICE
    6.
    发明申请
    MEMORY DEVICE 有权
    内存设备

    公开(公告)号:US20070012959A1

    公开(公告)日:2007-01-18

    申请号:US11456436

    申请日:2006-07-10

    IPC分类号: H01L29/80

    摘要: The present invention is to provide a memory device including: a plurality of memory cells that each include a memory element having a memory layer and first and second electrodes that sandwich the memory layer, the plurality of memory cells being divided into memory blocks of m columns by n rows (m and n are each an integer of not less than 1, m+n≧3), the memory elements in the same memory block having the first electrode that is formed of a single layer in common to the memory elements; and a voltage application unit that applies any voltage to the first electrode of the memory block.

    摘要翻译: 本发明提供一种存储器件,包括:多个存储单元,每个存储单元包括具有存储层的存储元件和夹持存储层的第一和第二电极,多个存储单元被分成m列的存储块 由n行(m和n各自为不小于1的整数,m + n> = 3),相同存储块中的存储元件具有由存储元件共同的单层形成的第一电极 ; 以及向存储块的第一电极施加任何电压的电压施加单元。