公开(公告)号：US07106368B2

公开(公告)日：2006-09-12

申请号：US10012391

申请日：2001-12-12

申请人： Hiroshi Daiku ,  Iwao Sugiyama

发明人： Hiroshi Daiku ,  Iwao Sugiyama

IPC分类号： H04N9/73

CPC分类号： H04N5/2357 ,  H04N5/235 ,  H04N5/2353

摘要： It is an object of the invention to provide a method of reducing flicker noises in an X-Y address type solid-state image pickup device for reducing flicker noises generated by a fluorescent light for room illumination when taking a picture in door.A configuration is provided in which signal storage time ts resulting in no flicker noise under a fluorescent lamp having an emission frequency of 120 Hz is preset (step S1); average luminance of image data is calculated for each frame in a predetermined average luminance detection area allocated in the frame (step S2); a difference in average luminance is calculated between frames (step S3); and the signal storage time ts is changed based on the difference in luminance (steps S4, S5 and S6).

摘要翻译： 本发明的一个目的是提供一种降低X-Y地址型固态摄像装置中的闪烁噪声的方法，用于减少在室内拍摄图像时由用于室内照明的荧光灯产生的闪烁噪声。 提供了一种配置，其中预设了在发射频率为120Hz的荧光灯下不产生闪烁噪声的信号存储时间ts（步骤S1）; 对在帧中分配的预定平均亮度检测区域中的每帧计算图像数据的平均亮度（步骤S2）。 在帧之间计算平均亮度的差异（步骤S3）; 并且基于亮度差改变信号存储时间ts（步骤S 4，S 5和S 6）。

公开(公告)号：US20050285961A1

公开(公告)日：2005-12-29

申请号：US10968044

申请日：2004-10-20

申请人： Asao Kokubo ,  Hiroshi Daiku ,  Jun Funakoshi ,  Yutaka Takeda ,  Norihiro Yoshida

发明人： Asao Kokubo ,  Hiroshi Daiku ,  Jun Funakoshi ,  Yutaka Takeda ,  Norihiro Yoshida

IPC分类号： G06F1/04 ,  G06F1/06 ,  G06F1/08 ,  H04N3/14 ,  H04N5/335 ,  H04N5/341 ,  H04N5/357 ,  H04N5/363 ,  H04N5/376 ,  H04N9/64

CPC分类号： H04N5/3765 ,  H04N5/3577

摘要： A solid-state imaging device includes an image sensor configured to output image data generated by image sensing elements together with a timing signal, and an image processing unit configured to output the image data supplied from the image sensor having undergone predetermined signal processing a predetermined delay time after a timing indicated by the timing signal, the image sensor further configured to make the timing signal indicate a first timing that is at least the processing delay time earlier than a second timing indicative of a start of a valid period of the image data, and to output dummy data from the first timing to the start of the valid period of the image data.

摘要翻译： 一种固态成像装置，包括图像传感器，被配置为输出由图像检测元件生成的图像数据和定时信号;以及图像处理单元，被配置为输出从已经经过预定信号处理的图像传感器提供的图像数据， 在由定时信号指示的定时之后的时间，图像传感器还被配置为使得定时信号指示比指示图像数据的有效时段的开始的第二定时更早的处理延迟时间的第一定时， 并将伪数据从第一定时输出到图像数据的有效期的开始。

公开(公告)号：US07489347B2

公开(公告)日：2009-02-10

申请号：US10943933

申请日：2004-09-20

申请人： Hiroshi Daiku ,  Asao Kokubo

发明人： Hiroshi Daiku ,  Asao Kokubo

IPC分类号： H04N9/73

CPC分类号： H04N5/2357 ,  H04N5/243 ,  H04N17/002

摘要： A flicker noise detecting method that shortens the time for detecting flicker noise. The method sets two of a plurality of horizontal lines forming a frame as average brightness calculation regions that are separated from each other by the predetermined number of the horizontal lines, calculates an average brightness of the two average brightness calculation regions for each of three frames, multiplies each average brightness by a product sum calculation coefficient, and adds the products to generate a sum and generate a detection signal of flicker noise based on the sum. The product sum calculation coefficient is obtained by plotting one cycle of a sine wave and one cycle of a cosine wave at intervals of π/3.

摘要翻译： 一种闪烁噪声检测方法，可缩短检测闪烁噪声的时间。 该方法将形成帧的多条水平线中的两条作为平均亮度计算区域彼此分开预定数量的水平线，计算三帧中的每一帧的两个平均亮度计算区域的平均亮度， 将每个平均亮度乘以乘积和计算系数，并将乘积相加以产生和，并基于该和产生闪烁噪声的检测信号。 乘积和计算系数通过以pi / 3的间隔绘制正弦波的一个周期和余弦波的一个周期来获得。

公开(公告)号：US20080252756A1

公开(公告)日：2008-10-16

申请号：US11892842

申请日：2007-08-28

申请人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

发明人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

IPC分类号： H04N1/409

CPC分类号： G06T5/005 ,  G06T2207/10004 ,  H04N5/367

摘要： A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.

摘要翻译： 半导体集成电路包括检查单元，其将感兴趣像素的值与包含在从图像传感器提供的图像信号中的相邻像素的值进行比较，并且基于比较来确定关注像素是否有缺陷，以及缺陷 校正单元，其响应于由检查单元确定感兴趣的像素有缺陷，通过使用周围像素的值来校正感兴趣像素的值。

公开(公告)号：US5891512A

公开(公告)日：1999-04-06

申请号：US919233

申请日：1997-08-28

申请人： Satoshi Kawata ,  Masaji Dohi ,  Yoichiro Sakachi ,  Hiroshi Daiku

发明人： Satoshi Kawata ,  Masaji Dohi ,  Yoichiro Sakachi ,  Hiroshi Daiku

IPC分类号： G01J1/02 ,  G01J5/34 ,  H01L37/02 ,  B05D5/12

CPC分类号： H01L37/02 ,  G01J5/34

摘要： A solution of precursor of a pyroelectric material, e.g. BaSrTiO.sub.3, is coated on a surface of a silicon wafer having an array of mesas corresponding to infrared sensor elements to be formed thereon, and the pyroelectric material precursor coating is dried and then is subjected to a heat treatment for converting thereof into a pyroelectric thin film (sol-gel process). The internal stress in the pyroelectric thin film formed as thick as 1 .mu.m by repeating the process concentrates in the region (groove) between the mesas, hence cracks occurring in the film in connection with the stress are limited within the region and the portions of the film on the mesas can be free from the cracks. The pyroelectric thin film in the groove is selectively removed. An infrared image sensing device comprising sensor elements of uniform characteristics and high reliability is provided.

摘要翻译： 热电材料的前体溶液，例如 BaSrTiO3涂覆在具有对应于要形成在其上的红外线传感器元件的台面阵列的硅晶片的表面上，并且将热电材料前体涂层干燥，然后进行热处理以将其转化为热电薄膜 （溶胶 - 凝胶法）。 通过重复该过程形成的厚度为1μm的热电薄膜的内部应力集中在台面之间的区域（凹槽）中，因此在与应力有关的膜中产生的裂纹在区域内部分被限制 台面上的电影可以摆脱裂缝。 选择性地去除槽中的热电薄膜。 提供了包括具有均匀特性和高可靠性的传感器元件的红外图像感测装置。

公开(公告)号：US08223247B2

公开(公告)日：2012-07-17

申请号：US12364915

申请日：2009-02-03

申请人： Tadao Inoue ,  Hiroshi Daiku

发明人： Tadao Inoue ,  Hiroshi Daiku

IPC分类号： H04N5/225 ,  H04N9/04

CPC分类号： H01L27/14603 ,  H01L27/14627 ,  H01L27/14685

摘要： A method for calculating a shift amount of a microlens from a position of a light receiving element arranged in a pixel of an image pickup element is provided. The microlens collects incident light from an image pickup lens. The method comprises: acquiring an incident angle characteristic value indicating a relation between an arranged position of the pixel and an incident angle of the incident light to the pixel; calculating a sampled shift amount of the microlens from the position of the light receiving element corresponding the incident angle characteristic value based on light collection efficiency of the incident light; approximating the sampled shift amount by a second or higher order function to calculate a shift amount characteristic function indicating a relation between the arranged position and the shift amount; and calculating the shift amount of the pixel using the shift amount characteristic function.

摘要翻译： 提供了一种用于从布置在图像拾取元件的像素中的光接收元件的位置计算微透镜的偏移量的方法。 微透镜收集来自图像拾取透镜的入射光。 该方法包括：获取指示像素的布置位置与入射光与像素的入射角之间的关系的入射角特性值; 根据入射角特性值，根据入射光的光收集效率，从受光元件的位置计算微透镜的采样偏移量; 通过第二或更高阶函数近似所述采样偏移量，以计算指示所述布置位置与所述偏移量之间的关系的偏移量特征函数; 以及使用偏移量特征函数来计算像素的偏移量。

公开(公告)号：US07263215B2

公开(公告)日：2007-08-28

申请号：US10626539

申请日：2003-07-25

申请人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

发明人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

IPC分类号： G06K9/00 ,  H04N9/64

CPC分类号： G06T5/005 ,  G06T2207/10004 ,  H04N5/367

摘要： A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.

摘要翻译： 半导体集成电路包括检查单元，其将感兴趣像素的值与包含在从图像传感器提供的图像信号中的相邻像素的值进行比较，并且基于比较来确定关注像素是否有缺陷，以及缺陷 校正单元，其响应于由检查单元确定感兴趣的像素有缺陷，通过使用周围像素的值来校正感兴趣像素的值。

公开(公告)号：US5589687A

公开(公告)日：1996-12-31

申请号：US413958

申请日：1995-03-30

申请人： Satoshi Kawata ,  Masaji Dohi ,  Yoichiro Sakachi ,  Hiroshi Daiku

发明人： Satoshi Kawata ,  Masaji Dohi ,  Yoichiro Sakachi ,  Hiroshi Daiku

IPC分类号： G01J1/02 ,  G01J5/34 ,  H01L37/02

CPC分类号： H01L37/02 ,  G01J5/34

摘要： An infrared detection device has a substrate with a plurality of hollow mesas and a pyroelectric thin film formed on the surface having the mesas.

摘要翻译： 红外线检测装置具有多个中空台面的基板和在具有台面的表面上形成的热电薄膜。

公开(公告)号：US07715617B2

公开(公告)日：2010-05-11

申请号：US11892842

申请日：2007-08-28

申请人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

发明人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

IPC分类号： G06K9/00 ,  H04N9/64

CPC分类号： G06T5/005 ,  G06T2207/10004 ,  H04N5/367

摘要： A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.

摘要翻译： 半导体集成电路包括检查单元，其将感兴趣像素的值与包含在从图像传感器提供的图像信号中的相邻像素的值进行比较，并且基于比较来确定关注像素是否有缺陷，以及缺陷 校正单元，其响应于由检查单元确定感兴趣的像素有缺陷，通过使用周围像素的值来校正感兴趣像素的值。

公开(公告)号：US07352397B2

公开(公告)日：2008-04-01

申请号：US10626726

申请日：2003-07-25

申请人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

发明人： Shigeru Nishio ,  Hiroshi Daiku ,  Asao Kokubo

IPC分类号： H04N5/208 ,  H04N5/228 ,  H04N5/217 ,  H04N5/21 ,  G06K9/40 ,  G06K15/00

CPC分类号： H04N5/208 ,  H04N5/142 ,  H04N9/045

摘要： A semiconductor integrated circuit includes a differential calculating unit which obtains a differential between a value of a pixel of interest and values of surrounding pixels contained in an image signal supplied from an image sensor, a dead-zone generating unit which defines a predetermined range of pixel values, and a comparison unit which checks whether the differential falls outside the predetermined range, wherein contour enhancement is applied to the pixel of interest in response to a determination by the comparison unit that the differential falls outside the predetermined range.

摘要翻译： 半导体集成电路包括：差分计算单元，其获得感兴趣像素的值和包含在从图像传感器提供的图像信号中的周围像素的值之间的差;定影区域生成单元，其限定像素的预定范围 值，以及比较单元，其检查差分是否落在预定范围之外，其中响应于比较单元的确定差异落在预定范围之外，对感兴趣的像素应用轮廓增强。