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公开(公告)号：US08250730B2
公开(公告)日：2012-08-28
申请号：US12674273
申请日：2008-10-14
申请人： Yoshiyuki Tani , Hiroshi Iwamoto
发明人： Yoshiyuki Tani , Hiroshi Iwamoto
IPC分类号： G01R31/28
CPC分类号： B23D55/046 , B09B5/00 , Y10T29/49002 , Y10T29/49004 , Y10T29/49135 , Y10T29/49155 , Y10T29/49169 , Y10T29/49199 , Y10T29/49202
摘要： In the disassembling method of a display device of the present invention, the display device has a display panel, and metal plate unit having a panel member formed of a chassis member disposed on the back surface of the display panel and a circuit board as an electric circuit member attached to the chassis member through an attaching member. The disassembling method has a mounting step of mounting metal plate unit on stage whose tilt angle can be adjusted by mechanism section and a cutting step of cutting the attaching member in parallel with the surface of stage with saw blade that abuts on the attaching member by the own weight of metal plate unit based on the tilt angle of stage.
摘要翻译： 在本发明的显示装置的拆卸方法中，显示装置具有显示面板和金属板单元，该金属板单元具有由设置在显示面板的背面上的底板构件和作为电气的电路板形成的面板构件 电路构件通过附接构件附接到底架构件。 拆卸方法具有将金属板单元安装在台架上的安装步骤，其倾斜角度可以通过机构部分进行调节;以及切割步骤，该切割步骤与锯片的与平台的表面平行地切割， 基于舞台倾角的金属板单元自重。
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公开(公告)号：US07515685B2
公开(公告)日：2009-04-07
申请号：US11587930
申请日：2005-04-25
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： In a fluorescent X-ray analysis method, a sample (1) is set on a sample stage (2) on an upper side of an X-ray irradiation chamber (7) and a sample cover (6) is closed from the upper part of the sample (1) to surround the sample (1), and then, a lower plane of the sample (1) is irradiated with X-ray for analysis. When the sample (1) is set on the sample stage (2) and the sample cover (6) is closed, a cover detecting means (8) detects that the sample cover (6) is closed and X-ray is automatically projected from an X-ray source (3) to start analysis.
摘要翻译： 在荧光X射线分析方法中，将样品（1）设置在X射线照射室（7）的上侧的样品台（2）上，并且样品盖（6）从上部 的样品（1）包围样品（1），然后用X射线照射样品（1）的下平面用于分析。 当样品（1）被放置在样品台（2）上并且样品盖（6）被关闭时，盖检测装置（8）检测到样品盖（6）被关闭并且X射线从 X射线源（3）开始分析。
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公开(公告)号：US20110167615A1
公开(公告)日：2011-07-14
申请号：US12674273
申请日：2008-10-14
申请人： Yoshiyuki Tani , Hiroshi Iwamoto
发明人： Yoshiyuki Tani , Hiroshi Iwamoto
IPC分类号： H05K13/00
CPC分类号： B23D55/046 , B09B5/00 , Y10T29/49002 , Y10T29/49004 , Y10T29/49135 , Y10T29/49155 , Y10T29/49169 , Y10T29/49199 , Y10T29/49202
摘要： In the disassembling method of a display device of the present invention, the display device has a display panel, and metal plate unit having a panel member formed of a chassis member disposed on the back surface of the display panel and a circuit board as an electric circuit member attached to the chassis member through an attaching member. The disassembling method has a mounting step of mounting metal plate unit on stage whose tilt angle can be adjusted by mechanism section and a cutting step of cutting the attaching member in parallel with the surface of stage with saw blade that abuts on the attaching member by the own weight of metal plate unit based on the tilt angle of stage.
摘要翻译： 在本发明的显示装置的拆卸方法中，显示装置具有显示面板和金属板单元，该金属板单元具有由设置在显示面板的背面上的底板构件和作为电气的电路板形成的面板构件 电路构件通过附接构件附接到底架构件。 拆卸方法具有将金属板单元安装在台架上的安装步骤，其倾斜角度可以通过机构部分进行调节;以及切割步骤，该切割步骤与锯片的与平台的表面平行地切割， 基于舞台倾角的金属板单元自重。
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4.发明申请公开(公告)号：US20060029182A1
公开(公告)日：2006-02-09
申请号：US11197303
申请日：2005-08-05
IPC分类号： G01N23/223 , G01T1/36
CPC分类号： G01N23/223 , G01N2223/076
摘要： The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.
摘要翻译： 测量未知样品中所含元素的浓度，而不必依赖人眼判定样品，并从先前样品供应商获取信息。 用于电子或电气设备的部件中所含的痕量元素如Cd，Pb和Hg的浓度由（1）用X射线照射样品来确定样品的类型 是非金属基材料或金属基材料; （2）根据识别出的样品类型选择荧光X射线分析的测定条件; 和（3）根据所选择的测量条件通过荧光X射线分析测量样品中所含的一种或多种元素的浓度。
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公开(公告)号：US07948247B2
公开(公告)日：2011-05-24
申请号：US12441290
申请日：2007-09-14
申请人： Norie Araki , Hirofumi Iwakawa , Yoshiyuki Tani , Hiroshi Iwamoto
发明人： Norie Araki , Hirofumi Iwakawa , Yoshiyuki Tani , Hiroshi Iwamoto
CPC分类号： G01N27/041 , G01N21/31 , G01N21/3563 , G01N21/67
摘要： A metal identifying device precisely identifies a metal material in a metal member having a plurality of through-hole portions penetrating through the metal member. The metal identifying device of the present invention includes a measurement unit that obtains a measurement value by measuring an electrical property and/or optical property of a test object, a threshold value determination unit that determines a threshold value with use of a reference value obtained by measuring the property of a metal member having a metal composition to be identified and information indicating a ratio of the through-hole portions to a measurement area in the test object and/or information indicating a configuration of the through-hole portion, and a comparison/identification unit that identifies a metal composition of the test object by comparing the measurement value and the threshold value.
摘要翻译： 金属识别装置精确地识别具有穿透金属构件的多个通孔部分的金属构件中的金属材料。 本发明的金属识别装置包括：测量单元，通过测量测试对象的电气特性和/或光学特性来获得测量值;阈值确定单元，其使用由 测量具有要识别的金属组合物的金属构件的性质和指示通孔部分与测试对象中的测量区域的比率的信息和/或指示通孔部分的构造的信息，以及比较 /识别单元，其通过比较测量值和阈值来识别测试对象的金属组成。
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6.发明申请公开(公告)号：US20090262890A1
公开(公告)日：2009-10-22
申请号：US12064624
申请日：2006-08-14
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
摘要翻译： 本发明的目的是缩短样品中所含特定物质的X射线分析中处理所需的时间，并且简化工作并增加样品数量。 为了实现该目的，用于测定样品106中特定物质的含量的方法包括用X射线照射样品106并测量样品106的光谱的测量步骤（S3）和测定步骤 （S4）比较样品106的光谱中的特定物质的组分和已经为样品106预先存储的参考光谱，并且确定特定物质是否包含在样品106中的量相等 达到或大于特定值。
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7.发明授权公开(公告)号：US07382855B2
公开(公告)日：2008-06-03
申请号：US11587856
申请日：2005-04-27
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.
摘要翻译： 可以解决常规荧光X射线分析的问题，即只有经过设定为测量时间的时间才能获得浓度计算结果。 在根据本发明的荧光X射线分析方法和荧光X射线分析装置中，在开始测量之前设置样品测量条件，并且计算包含在样品中的元素的测量浓度和测量精度。 当测量精度已经成为满足预定测量条件的值时，测量结束并且此时的浓度被输出。
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8.发明申请公开(公告)号：US20070248211A1
公开(公告)日：2007-10-25
申请号：US11587856
申请日：2005-04-27
IPC分类号： G01N23/223 , G06F19/00
CPC分类号： G01N23/223 , G01N2223/076
摘要： It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.
摘要翻译： 可以解决常规荧光X射线分析的问题，即只有经过设定为测量时间的时间才能获得浓度计算结果。 在根据本发明的荧光X射线分析方法和荧光X射线分析装置中，在开始测量之前设置样品测量条件，并且计算包含在样品中的元素的测量浓度和测量精度。 当测量精度已经成为满足预定测量条件的值时，测量结束并且此时的浓度被输出。
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9.发明申请GLASS CUTTING APPARATUS, GLASS-SUBSTRATE DISASSEMBLING APPARATUS, GLASS-SUBSTRATE DISASSEMBLING SYSTEM, GLASS CUTTING METHOD, AND GLASS-SUBSTRATE DISASSEMBLING METHOD 有权玻璃切割装置，玻璃基板拆除装置，玻璃基板拆除系统，玻璃切割方法和玻璃基板拆除方法公开(公告)号：US20100288101A1
公开(公告)日：2010-11-18
申请号：US12445606
申请日：2007-10-05
CPC分类号： C03B33/0207 , B65G2249/04 , C03B33/03 , C03B33/033 , C03B33/076 , G02F1/1303 , G02F1/133351 , H01J9/52 , H01J2217/49 , H01J2329/00 , Y02W30/60 , Y02W30/828 , Y10T29/49815 , Y10T29/49819 , Y10T29/49821 , Y10T29/49822 , Y10T29/53 , Y10T29/534 , Y10T29/54 , Y10T83/0363 , Y10T225/325
摘要： A glass cutting apparatus (101) includes a pair of cutters (13a, 13b) installed oppositely to each other in such a way as to sandwich, therebetween, a glass plate with surfaces of the glass plate thereof being along a vertical direction; a first pressing unit (14a) which presses one of the cutters to one of the surfaces of the glass plate in a horizontal direction with a pressing force P; a second pressing unit (14b) which is placed oppositely to the first pressing unit and presses the other one of the cutters to the other surface of the glass plate in the horizontal direction with the pressing force P; and a moving unit (20) which moves the pair of cutters pressing the glass plate with the pressing force P.
摘要翻译： 玻璃切割装置（101）包括一对彼此相对地安装的切割器（13a，13b），以在其间夹着玻璃板，其玻璃板的表面沿着垂直方向夹持; 第一按压单元（14a），其按压力P将水平方向上的一个切割器压在玻璃板的一个表面上; 第二按压单元（14b），其与第一按压单元相对地放置，并且用按压力P将另一个切割器沿水平方向按压到玻璃板的另一个表面; 以及移动单元（20），该移动单元使所述一对切割器以所述按压力P按压所述玻璃板。
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公开(公告)号：US20100022152A1
公开(公告)日：2010-01-28
申请号：US12311397
申请日：2007-09-26
申请人： Hiroshi Iwamoto , Yoshiyuki Tani
发明人： Hiroshi Iwamoto , Yoshiyuki Tani
IPC分类号： H01J9/50
CPC分类号： B24C1/08 , B24C3/322 , G02F2203/68 , H01J9/52 , H01J2217/49 , Y02W30/60 , Y02W30/828
摘要： The present invention provides a material recovering method in which an attached member attached to at least one surface of a glass substrate is removed from the glass substrate so that the glass substrate is recovered. The method includes: a step A of crushing part of the glass substrate so that a glass fragment is formed; and a step B of allowing the glass fragment to impact against the attached member so as to detach and remove the attached member from the glass substrate. This method allows an attached member attached to a glass substrate to be removed at low cost and achieves an improved yield of the glass substrate.
摘要翻译： 本发明提供一种材料回收方法，其中从玻璃基板去除附着在玻璃基板的至少一个表面上的附着部件，从而回收玻璃基板。 该方法包括：粉碎玻璃基板的一部分以形成玻璃片的步骤A; 以及允许玻璃碎片冲击附着构件以从玻璃基板分离和移除附着构件的步骤B. 该方法允许以低成本去除附着在玻璃基板上的附接部件，并且实现玻璃基板的提高的产量。
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