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公开(公告)号:US20140284820A1
公开(公告)日:2014-09-25
申请号:US14295528
申请日:2014-06-04
Applicant: IBIDEN CO., LTD.
Inventor: Toshiki FURUTANI , Daiki KOMATSU , Masatoshi KUNIEDA , Naomi FUJITA , Nobuya TAKAHASHI
CPC classification number: H05K1/113 , H01L21/4857 , H01L21/568 , H01L23/147 , H01L23/28 , H01L23/3128 , H01L23/49822 , H01L23/562 , H01L24/82 , H01L2224/131 , H01L2224/16225 , H01L2224/16227 , H01L2224/32225 , H01L2224/73204 , H01L2224/81005 , H01L2224/81192 , H01L2924/00013 , H01L2924/12042 , H01L2924/15311 , H01L2924/181 , H01L2924/18161 , H01L2924/351 , H05K1/0298 , H01L2224/13099 , H01L2224/13599 , H01L2224/05599 , H01L2224/05099 , H01L2224/29099 , H01L2224/29599 , H01L2924/014 , H01L2924/00012 , H01L2924/00
Abstract: A substrate for mounting a semiconductor includes a first insulation layer having first and second surfaces on the opposite sides and having a penetrating hole penetrating through the first insulation layer, an electrode formed in the penetrating hole in the first insulation layer and having a protruding portion protruding from the second surface of the first insulation layer, a first conductive pattern formed on the first surface of the first insulation layer and connected to the electrode, a second insulation layer formed on the first surface of the first insulation layer and the first conductive pattern and having a penetrating hole penetrating through the second insulating layer, a second conductive pattern formed on the second insulation layer and for mounting a semiconductor element, and a via conductor formed in the penetrating hole in the second insulation layer and connecting the first and second conductive patterns.