Abstract:
The present disclosure provides a patterning process for an oxide film, including: covering a barrier layer composition on a substrate to form a patterned barrier layer, wherein the barrier layer composition includes an inorganic component and an organic binder with a weight ratio of 50-98:2-50; forming an oxide film on the patterned barrier layer and the substrate, wherein a thickness ratio (D1/D2) of the barrier layer (D1) to the oxide film (D2) is about 5-2000; and lifting off the barrier layer and the oxide film thereon, while leaving portions of the oxide film on the substrate.
Abstract:
A low-haze tin oxide film and a manufacturing method thereof are provided. The method includes: applying a mixed solution on a substrate and heating the substrate to form a tin oxide film. The mixed solution contains a tin source, an oxidizing agent, and a solvent.
Abstract:
The disclosure provides an infrared absorption material, a method for fabricating the same, and a thermal isolation structure employing the same. The infrared absorption material includes a tungsten bronze complex having a formula of M1xM2yWOz, wherein 0.6≦x≦0.8, 0.2≦y≦0.33, 0.8≦x+y
Abstract translation:本发明提供红外线吸收材料,其制造方法以及使用其的热隔离结构。 红外吸收材料包括具有式M1xM2yWOz的钨青铜络合物,其中0.6和nlE; x和nlE; 0.8,0.2和nlE; y和nlE; 0.33,0.8和nlE; x + y <1和2