公开(公告)号：US20200066645A1

公开(公告)日：2020-02-27

申请号：US16324087

申请日：2016-09-30

Applicant: INTEL CORPORATION

Inventor： Jason A. FARMER ,  Jeffrey S. LEIB ,  Michael L. MCSWINEY ,  Harsono S. SIMKA ,  Daniel B. BERGSTROM

IPC: H01L23/532 ,  H01L21/285 ,  H01L21/768 ,  H01L23/522

Abstract: Embodiments of the invention include a microelectronic device that includes a substrate having a layer of dielectric material that includes a feature with a depression, a Tungsten containing barrier liner layer formed in the depression of the feature, and a Cobalt conductive layer deposited on the Tungsten containing barrier liner layer in the depression of the feature. The Tungsten containing barrier liner layer provides adhesion for the Cobalt conductive layer.

公开(公告)号：US20170058401A1

公开(公告)日：2017-03-02

申请号：US15119699

申请日：2014-03-27

Applicant: Intel Corporation

Inventor： James M. BLACKWELL ,  Patricio E. ROMERO ,  Scott B. CLENDENNING ,  Grant M. KLOSTER ,  Florian GSTREIN ,  Harsono S. SIMKA ,  Paul A. ZIMMERMAN ,  Robert L. BRISTOL

IPC: C23C16/455 ,  H01L21/768 ,  H01L29/66 ,  H01L21/285 ,  C23C16/18 ,  C23C16/48

CPC classification number: C23C16/45553 ,  C23C16/18 ,  C23C16/482 ,  H01L21/0337 ,  H01L21/28556 ,  H01L21/28562 ,  H01L21/76816 ,  H01L21/76879 ,  H01L21/76897 ,  H01L29/66795

Abstract: Precursor and process design for photo-assisted metal atomic layer deposition (ALD) and chemical vapor deposition (CVD) is described. In an example, a method of fabricating a thin metal film involves introducing precursor molecules proximate to a surface on or above a substrate, each of the precursor molecules having one or more metal centers surrounded by ligands. The method also involves depositing a metal layer on the surface by dissociating the ligands from the precursor molecules using a photo-assisted process.

Abstract translation: 描述了光辅助金属原子层沉积（ALD）和化学气相沉积（CVD）的前体和工艺设计。 在一个实例中，制造薄金属膜的方法包括将前体分子引入靠近基底上或表面的表面，每个前体分子具有被配体包围的一个或多个金属中心。 该方法还涉及通过使用光辅助方法从前体分子解离配体而在表面上沉积金属层。