Assembly including plural through wafer vias, method of cooling the assembly and method of fabricating the assembly
    3.
    发明授权
    Assembly including plural through wafer vias, method of cooling the assembly and method of fabricating the assembly 有权
    组装包括通过晶片通孔的多个通孔,冷却组件的方法和制造组件的方法

    公开(公告)号:US09252071B2

    公开(公告)日:2016-02-02

    申请号:US14096702

    申请日:2013-12-04

    Abstract: An assembly includes a chip including an integrated circuit, a casing including an integrated circuit and having an upper portion formed on a side of the chip and lower portion formed on another side of the chip, plural through-wafer vias (TWVs) for electrically connecting the integrated circuit of the chip and the integrated circuit of the casing, and a card connected to the casing for electrically connecting the casing to a system board. The card includes an upper card connected to the upper portion of the casing, and a lower card connected to the lower portion of the casing. The upper card includes one of a photosensor, light emitting element, radio frequency (RF) antenna, and radio frequency emitter. The lower card includes an area array input/output.

    Abstract translation: 一种组件,包括集成电路的芯片,包括集成电路的壳体,并且具有形成在芯片的一侧的上部和形成在芯片的另一侧的下部,用于电连接的多个贯通晶片通孔(TWV) 芯片的集成电路和壳体的集成电路,以及连接到壳体的卡,用于将壳体电连接到系统板。 该卡片包括连接到壳体上部的上卡,和连接到壳体下部的下卡。 上卡包括光传感器,发光元件,射频(RF)天线和射频发射器之一。 下卡包括区域阵列输入/输出。

    Power supply for localized portions of an integrated circuit
    4.
    发明授权
    Power supply for localized portions of an integrated circuit 有权
    用于集成电路局部部分的电源

    公开(公告)号:US08736353B2

    公开(公告)日:2014-05-27

    申请号:US13621949

    申请日:2012-09-18

    Inventor: Kerry Bernstein

    CPC classification number: G06F1/26

    Abstract: System and method system for regulating voltage in a portion of an integrated circuit. An integrated circuit has a voltage input and at least a portion that is less than all of the integrated circuit, which requires a local voltage level. A voltage selector establishes a target voltage for the portion. A first comparator compares the target voltage to the local voltage and generates a pull up control signal when the local voltage is below the target voltage. A second comparator compares the target voltage to the local voltage and generates a pull down control signal when the local voltage is above the target voltage. A pull up device, responsive to the pull up control signal, increases the local voltage according to the pull up control signal. A pull down device, responsive to the pull down control signal, decreases the local voltage level according to the pull down control signal.

    Abstract translation: 用于调整集成电路部分电压的系统和方法系统。 集成电路具有电压输入和小于所有集成电路的至少一部分,其需要局部电压电平。 电压选择器为该部分建立目标电压。 第一个比较器将目标电压与局部电压进行比较,并在局部电压低于目标电压时产生上拉控制信号。 第二比较器将目标电压与局部电压进行比较,并且当局部电压高于目标电压时产生下拉控制信号。 根据上拉控制信号,上拉装置根据上拉控制信号增加局部电压。 根据下拉控制信号,下拉装置根据下拉控制信号降低局部电压电平。

    METHODS FOR NORMALIZING STRAIN IN SEMICONDCUTOR DEVICES AND STRAIN NORMALIZED SEMICONDUCTOR DEVICES
    5.
    发明申请
    METHODS FOR NORMALIZING STRAIN IN SEMICONDCUTOR DEVICES AND STRAIN NORMALIZED SEMICONDUCTOR DEVICES 有权
    用于在半导体器件和应变规范化半导体器件中正态化应变的方法

    公开(公告)号:US20130032894A1

    公开(公告)日:2013-02-07

    申请号:US13647538

    申请日:2012-10-09

    CPC classification number: H01L21/823807 H01L29/7843

    Abstract: A method of normalizing strain in semiconductor devices and normalized strain semiconductor devices. The method includes: forming first and second field effect transistors of an integrated circuit; forming a stress layer over the first and second field effect transistors, the stress layer inducing strain in channel regions of the first and second field effect transistors; and selectively thinning the stress layer over at least a portion of the second field effect transistor.

    Abstract translation: 一种在半导体器件和归一化应变半导体器件中归一化应变的方法。 该方法包括:形成集成电路的第一和第二场效应晶体管; 在所述第一和第二场效应晶体管上形成应力层,所述应力层在所述第一和第二场效应晶体管的沟道区域中引起应变; 以及在所述第二场效应晶体管的至少一部分上选择性地稀薄所述应力层。

    ASSEMBLY INCLUDING PLURAL THROUGH WAFER VIAS, METHOD OF COOLING THE ASSEMBLY AND METHOD OF FABRICATING THE ASSEMBLY
    9.
    发明申请
    ASSEMBLY INCLUDING PLURAL THROUGH WAFER VIAS, METHOD OF COOLING THE ASSEMBLY AND METHOD OF FABRICATING THE ASSEMBLY 审中-公开
    组装方式包括通过WAVER VIAS,通过冷却组件的方法和组装方法

    公开(公告)号:US20140084448A1

    公开(公告)日:2014-03-27

    申请号:US14096702

    申请日:2013-12-04

    Abstract: An assembly includes a chip including an integrated circuit, a casing including an integrated circuit and having an upper portion formed on a side of the chip and lower portion formed on another side of the chip, plural through-wafer vias (TWVs) for electrically connecting the integrated circuit of the chip and the integrated circuit of the casing, and a card connected to the casing for electrically connecting the casing to a system board. The card includes an upper card connected to the upper portion of the casing, and a lower card connected to the lower portion of the casing. The upper card includes one of a photosensor, light emitting element, radio frequency (RF) antenna, and radio frequency emitter. The lower card includes an area array input/output.

    Abstract translation: 一种组件,包括集成电路的芯片,包括集成电路的壳体,并且具有形成在芯片的一侧的上部和形成在芯片的另一侧的下部,用于电连接的多个贯通晶片通孔(TWV) 芯片的集成电路和壳体的集成电路,以及连接到壳体的卡,用于将壳体电连接到系统板。 该卡片包括连接到壳体上部的上卡,和连接到壳体下部的下卡。 上卡包括光传感器,发光元件,射频(RF)天线和射频发射器之一。 下卡包括区域阵列输入/输出。

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