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1.
公开(公告)号:US20200331748A1
公开(公告)日:2020-10-22
申请号:US16387918
申请日:2019-04-18
Applicant: Infineon Technologies AG
Inventor: Florian BRANDL , Christian GEISSLER , Robert GRUENBERGER , Claus WAECHTER , Bernhard WINKLER
Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a substrate having a first surface and a second surface arranged opposite to the first surface; a stress-sensitive sensor disposed at the first surface of the substrate, where the stress-sensitive sensor is sensitive to mechanical stress; a stress-decoupling trench that has a vertical extension that extends from the first surface into the substrate, where the stress-decoupling trench vertically extends partially into the substrate towards the second surface although not completely to the second surface; and a plurality of particle filter trenches that vertically extend from the second surface into the substrate, wherein each of the plurality of particle filter trenches have a longitudinal extension that extends orthogonal to the vertical extension of the stress-decoupling trench.
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2.
公开(公告)号:US20190198455A1
公开(公告)日:2019-06-27
申请号:US16227427
申请日:2018-12-20
Applicant: Infineon Technologies AG
Inventor: Walter HARTNER , Christian GEISSLER , Thomas KILGER , Johannes LODERMEYER , Franz-Xaver MUEHLBAUER , Martin Richard NIESSNER , Claus WAECHTER
CPC classification number: H01L23/562 , H01L21/563 , H01L23/3157 , H01L23/66 , H01L2223/6677 , H01Q1/2283
Abstract: A semiconductor apparatus comprises: a circuit board; a semiconductor package having a main surface, wherein the semiconductor package is arranged on the circuit board and the main surface faces the circuit board; a radio-frequency line element of the semiconductor package, which radio-frequency line element is arranged on the main surface or inside the semiconductor package, wherein the radio-frequency line element is designed to transmit a signal at a frequency of greater than 10 GHz; and an underfiller material arranged between the circuit board and the semiconductor package, wherein the radio-frequency line element and the underfiller material do not overlap in an orthogonal projection onto the main surface.
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公开(公告)号:US20210032097A1
公开(公告)日:2021-02-04
申请号:US17076250
申请日:2020-10-21
Applicant: Infineon Technologies AG
Inventor: Florian BRANDL , Christian GEISSLER , Robert GRUENBERGER , Claus WAECHTER , Bernhard WINKLER
Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a substrate having a first surface and a second surface arranged opposite to the first surface; a stress-sensitive sensor disposed at the first surface of the substrate, where the stress-sensitive sensor is sensitive to mechanical stress; a stress-decoupling trench that has a vertical extension that extends from the first surface into the substrate, where the stress-decoupling trench vertically extends partially into the substrate towards the second surface although not completely to the second surface; and a plurality of particle filter trenches that vertically extend from the second surface into the substrate, wherein each of the plurality of particle filter trenches have a longitudinal extension that extends orthogonal to the vertical extension of the stress-decoupling trench.
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公开(公告)号:US20200321295A1
公开(公告)日:2020-10-08
申请号:US16841298
申请日:2020-04-06
Applicant: Infineon Technologies AG
Inventor: Walter HARTNER , Francesca ARCIONI , Birgit HEBLER , Martin Richard NIESSNER , Claus WAECHTER , Maciej WOJNOWSKI
IPC: H01L23/00 , H01L23/522
Abstract: A semiconductor device comprises a semiconductor chip having a radio-frequency circuit and a radio-frequency terminal, an external radio-frequency terminal, and a non-galvanic connection arranged between the radio-frequency terminal of the semiconductor chip and the external radio-frequency terminal, wherein the non-galvanic connection is designed to transmit a radio-frequency signal.
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