PER-PART REAL-TIME LOAD-LINE MEASUREMENT APPARATUS AND METHOD

    公开(公告)号:US20210132123A1

    公开(公告)日:2021-05-06

    申请号:US17128070

    申请日:2020-12-19

    Abstract: A scheme for measuring AC and DC load-line (LL) using voltage and current monitoring apparatus. During calibration for LL measurement, a tested or known workload is executed on a processor or system-on-chip (SoC). The calibration can be done when the processor is first used in a real-time system (customer) scenario, or repeated whenever necessary to compensate silicon aging or other effects that affect the LL values. LL is estimated, determined, and/or calculated for each power supply rail in the processor or SoC. The measured LL is used in calculations that determine the operating voltage of an input voltage regulator (VR) at run time, thereby optimizing the power/performance characteristics of that specific system.

    THERMAL MANAGEMENT IN HORIZONTALLY OR VERTICALLY STACKED DIES

    公开(公告)号:US20220300049A1

    公开(公告)日:2022-09-22

    申请号:US17203571

    申请日:2021-03-16

    Abstract: A thermal management scheme, for a multichip module, that is aware of various dies in a stack (horizontal and/or vertical) and heat generated from them, local hot spots in a victim die, and hot spots in aggressor die(s). Each victim die receives telemetry information from thermal sensors located in aggressor dies as well as local thermal sensors in the victim die. The telemetry information is used to enable a virtual sensing scheme where temperature for a target die (e.g., a victim die) and/or its intellectual property (IP) domain is estimated or calculated. The estimated or calculated temperature is then used for performance management of the victim and/or aggressor dies in the stack.

    Per-part real-time load-line measurement apparatus and method

    公开(公告)号:US12117469B2

    公开(公告)日:2024-10-15

    申请号:US17128070

    申请日:2020-12-19

    CPC classification number: G01R19/2513 H02J4/00

    Abstract: A scheme for measuring AC and DC load-line (LL) using voltage and current monitoring apparatus. During calibration for LL measurement, a tested or known workload is executed on a processor or system-on-chip (SoC). The calibration can be done when the processor is first used in a real-time system (customer) scenario, or repeated whenever necessary to compensate silicon aging or other effects that affect the LL values. LL is estimated, determined, and/or calculated for each power supply rail in the processor or SoC. The measured LL is used in calculations that determine the operating voltage of an input voltage regulator (VR) at run time, thereby optimizing the power/performance characteristics of that specific system.

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