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    RESISTANCE MEASUREMENTS IN ELECTRICAL CHARACTERIZATION SYSTEM
    3.
    发明申请
    RESISTANCE MEASUREMENTS IN ELECTRICAL CHARACTERIZATION SYSTEM 有权

    公开(公告)号：US20250085310A1

    公开(公告)日：2025-03-13

    申请号：US18244566

    申请日：2023-09-11

    Applicant: International Business Machines Corporation

    Inventor： Eric Zhang ,  Jason S. Orcutt ,  Yves Martin

    IPC: G01R1/067 ,  G01R27/20

    Abstract: A system comprises a prober unit, and a control unit. The prober unit comprises electrical probes. The control unit configured to: cause the prober unit to make contact between the electrical probes and contact pads of a target device; cause the prober unit to increment a contact overdrive by a specified amount to increase a contact pressure between the electrical probes and the contact pads of the target device; measure a contact resistance between the electrical probes and the contact pads of the target device, subsequent to incrementing the contact overdrive; compare the measured contact resistance with a contact resistance threshold; and determine whether to perform an electrical characterization measurement of the target device, based on a result of comparing the measured contact resistance with the contact resistance threshold.

    FREQUENCY CONTROL AND TUNING OF MODULAR DEVICES
    5.
    发明申请
    FREQUENCY CONTROL AND TUNING OF MODULAR DEVICES 有权

    公开(公告)号：US20250068950A1

    公开(公告)日：2025-02-27

    申请号：US18236047

    申请日：2023-08-21

    Applicant: International Business Machines Corporation

    Inventor： Eric Zhang ,  Jared Barney Hertzberg

    IPC: G06N10/40

    Abstract: Identify a plurality of candidate quantum computing chips to be arranged in a multi-chip quantum processor. Generate a current optimized tuning plan for the arrangement of the plurality of candidate quantum computing chips in the multi-chip quantum processor. Obtain results of tuning in accordance with the optimized tuning plan from at least one tuning system. Carry out tuning yield assessment based on results of the obtained tuning results. Repeat the steps of obtaining results and carrying out tuning yield assessment, based on tuning being incomplete and the current optimized tuning plan remaining viable.

    Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities
    7.
    发明授权
    Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities 有权

    公开(公告)号：US10677726B2

    公开(公告)日：2020-06-09

    申请号：US15846912

    申请日：2017-12-19

    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

    Inventor： William Green ,  Chu Cheyenne Teng ,  Gerard Wysocki ,  Chi Xiong ,  Eric Zhang

    IPC: G01N21/45 ,  G01J3/45 ,  G01N21/27 ,  G01N21/39

    Abstract: A tunable diode laser absorption spectroscopy device includes a tunable diode laser. A laser driver is configured to drive the diode laser and ramp it within a particular frequency range. An analyte gas container, a reference gas container, and a fringe generating device are configured to receive the laser therethrough. An optical detector is configured to detect the laser after it has passed through the analyte gas container and/or the reference gas container, and the in-line fringe generating device. An acquisition card is configured to sample an output of the optical detector. A spectral analyzer is configured to receive output data from the acquisition card, determine a spectrum of the output data, decouple the fringe spectrum from the measured spectrum, calibrate the spectrum based on an expected ideal spectrum of both the fringe and reference gas, and determine a composition of the analyte based on the calibrated spectrum.

    Resonator coupling modulation spectroscopy
    8.
    发明授权
    Resonator coupling modulation spectroscopy 有权
    谐振器耦合调制光谱

    公开(公告)号：US09476770B1

    公开(公告)日：2016-10-25

    申请号：US15008664

    申请日：2016-01-28

    Applicant: International Business Machines Corporation

    Inventor： William M. J. Green ,  Lionel Tombez ,  Eric Zhang

    IPC: G01N21/00 ,  G01J3/45 ,  G01J3/42 ,  G01N33/00

    CPC classification number: G01N33/0027 ,  G01J3/0218 ,  G01J3/42 ,  G01J3/433 ,  G01J3/453

    Abstract: Disclosed herein is a system for detecting the presence of an chemical in a sample comprising a laser light source for generating a beam of light; a beam splitter that is operative to split the beam of light into a first beam of light and a second beam of light; a reference cell and a first recording device that are operative to receive the first beam of light; where the first recording device is downstream of the reference cell; a resonator that is operative to receive the second beam of light via a coupler; where the resonator contains the sample that contains the chemical; a phase modulator and a second recording device that lie downstream of the resonator and are operative to receive the second beam of light.

    Abstract translation: 本文公开了一种用于检测样品中存在化学物质的系统，其包括用于产生光束的激光光源; 分束器，其可操作地将光束分成第一光束和第二光束; 可操作地接收第一光束的参考单元和第一记录装置; 其中第一记录装置在参考单元的下游; 可操作地通过耦合器接收第二光束的谐振器; 谐振器包含含有化学物质的样品; 相位调制器和第二记录装置，其位于谐振器的下游并且可操作以接收第二光束。

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