Non-volatile memory using ferroelectric gate field-effect transistors
    1.
    发明授权
    Non-volatile memory using ferroelectric gate field-effect transistors 有权
    使用铁电栅极场效应晶体管的非易失性存储器

    公开(公告)号:US06744087B2

    公开(公告)日:2004-06-01

    申请号:US10256881

    申请日:2002-09-27

    IPC分类号: H01L2976

    摘要: A vertical ferroelectric gate field-effect transistor (FeGFET) device comprises a substrate and a first drain/source electrode formed on an upper surface of the substrate. An electrically conductive channel region is formed on an upper surface of the first drain/source electrode and electrically contacting the first drain/source electrode. The FeGFET device further comprises a ferroelectric gate region formed on at least one side wall of the channel region, at least one gate electrode electrically contacting the ferroelectric gate region, and a second drain/source electrode formed on an upper surface of the channel region and electrically contacting the channel region. The ferroelectric gate region is selectively polarizable in response to a potential applied between the gate electrode and at least one of the first and second drain/source electrodes. A non-volatile memory array can be formed comprising a plurality of FeGFET devices.

    摘要翻译: 垂直铁电栅极场效应晶体管(FeGFET)器件包括形成在衬底的上表面上的衬底和第一漏极/源极。 在第一漏/源电极的上表面上形成导电沟道区,并与第一漏/源电极电接触。 FeGFET器件还包括形成在通道区域的至少一个侧壁上的铁电栅极区域,与铁电栅极区域电接触的至少一个栅极电极和形成在沟道区域的上表面上的第二漏极/源极电极,以及 电接触通道区域。 铁电栅极区域响应于施加在栅极电极和第一和第二漏极/源极电极中的至少一个之间的电位而选择性地极化。 可以形成包括多个FeGFET装置的非易失性存储器阵列。

    FREQUENCY MODIFICATION TECHNIQUES THAT ADJUST AN OPERATING FREQUENCY TO COMPENSATE FOR AGING ELECTRONIC COMPONENTS
    2.
    发明申请
    FREQUENCY MODIFICATION TECHNIQUES THAT ADJUST AN OPERATING FREQUENCY TO COMPENSATE FOR AGING ELECTRONIC COMPONENTS 失效
    调整操作频率以补偿老化电子元件的频率修改技术

    公开(公告)号:US20080263383A1

    公开(公告)日:2008-10-23

    申请号:US12163493

    申请日:2008-06-27

    IPC分类号: G06F1/04

    CPC分类号: G06F11/008

    摘要: A number of performance parameters for the electronic system are determined at a particular age of the electronic system. The performance parameters can be correlated to maximum operating frequency of electronic components of the electronic system for the particular age of the electronic system. Operating frequency of the electronic components is adjusted in accordance with the performance parameters. The performance parameters may be predetermined (such as through reliability and burn-in testing), determined during the life of the electronic system, or some combination of these. Performance parameters can comprise prior operating frequencies, hours of operation, ambient temperature, and supply voltage. Performance parameters can comprise performance statistics determined using age-monitoring circuits, where an aged circuit is compared with a circuit enabled only for comparison. Performance statistics may also be determined though error detection circuits. If an error is detected, the operating frequency can be reduced.

    摘要翻译: 在电子系统的特定年龄确定电子系统的许多性能参数。 性能参数可以与电子系统的特定年龄的电子系统的电子部件的最大工作频率相关联。 电子元件的工作频率根据性能参数进行调整。 性能参数可以是预定的(例如通过可靠性和老化测试),在电子系统的寿命期间确定,或者这些的一些组合。 性能参数可以包括以前的工作频率,工作时间,环境温度和电源电压。 性能参数可以包括使用年龄监测电路确定的性能统计,其中老化电路与仅用于比较的电路进行比较。 也可以通过错误检测电路来确定性能统计。 如果检测到错误,则可以减少工作频率。

    Memory array employing single three-terminal non-volatile storage elements
    3.
    发明授权
    Memory array employing single three-terminal non-volatile storage elements 失效
    采用单个三端非易失性存储元件的存储阵列

    公开(公告)号:US06894916B2

    公开(公告)日:2005-05-17

    申请号:US10256715

    申请日:2002-09-27

    CPC分类号: G11C11/22

    摘要: An improved non-volatile memory array comprises a plurality of memory cells, at least one of the memory cells comprising a three-terminal non-volatile storage element for storing a logical state of the at least one memory cell. The memory array further comprises a plurality of write lines operatively coupled to the memory cells for selectively writing the logical state of one or more memory cells in the memory array, and a plurality of bit lines and word lines operatively coupled to the memory cells for selectively reading and writing the logical state of one or more memory cells in the memory array. The memory array is advantageously configured so as to eliminate the need for a pass gate being operatively coupled to a corresponding non-volatile storage element in the at least one memory cell.

    摘要翻译: 改进的非易失性存储器阵列包括多个存储器单元,至少一个存储器单元包括用于存储至少一个存储器单元的逻辑状态的三端非易失性存储元件。 存储器阵列还包括可操作地耦合到存储器单元的多个写入线,用于选择性地将存储器阵列中的一个或多个存储器单元的逻辑状态写入,并且可操作地耦合到存储器单元的多个位线和字线用于选择性地 读取和写入存储器阵列中的一个或多个存储器单元的逻辑状态。 有利地,存储器阵列被配置为消除对可操作地耦合到至少一个存储器单元中的对应的非易失性存储元件的通过栅极的需要。

    Restore tracking system for DRAM
    4.
    发明授权
    Restore tracking system for DRAM 失效
    恢复跟踪系统的DRAM

    公开(公告)号:US06389505B1

    公开(公告)日:2002-05-14

    申请号:US09196086

    申请日:1998-11-19

    IPC分类号: G06F1200

    CPC分类号: G06F12/0893 G06F12/0802

    摘要: A system and method for reducing the number of refresh actions needed to maintain data in a DRAM, by restoring only those cells which haven't been read from or written to within an allotted data retention time. One embodiment describes a restore tracking system as applied to a DRAM cache. The restore tracking system can alternatively be applied to any memory architecture having duplication of information. For example, the number of refresh actions needed to maintain data entries in a DRAM can be reduced by recording and updating a refresh status of one or more of the data entries in the DRAM; and invalidating those data entries having an expired status. Thus, more memory bandwidth can be made available to a computer system.

    摘要翻译: 一种用于通过仅恢复在分配的数据保留时间内未被读取或写入的那些单元来减少维持DRAM中的数据所需的刷新动作数量的系统和方法。 一个实施例描述了应用于DRAM高速缓存的还原跟踪系统。 还原跟踪系统可以替代地应用于具有信息重复的任何存储器架构。 例如,可以通过记录和更新DRAM中的一个或多个数据条目的刷新状态来减少维护DRAM中的数据条目所需的刷新动作的数量; 并使那些具有过期状态的数据条目无效。 因此,可以使更多的存储器带宽可用于计算机系统。

    Frequency modification techniques that adjust an operating frequency to compensate for aging electronic components

    公开(公告)号:US08495444B2

    公开(公告)日:2013-07-23

    申请号:US12163493

    申请日:2008-06-27

    IPC分类号: G01R31/30

    CPC分类号: G06F11/008

    摘要: A number of performance parameters for the electronic system are determined at a particular age of the electronic system. The performance parameters can be correlated to maximum operating frequency of electronic components of the electronic system for the particular age of the electronic system. Operating frequency of the electronic components is adjusted in accordance with the performance parameters. The performance parameters may be predetermined (such as through reliability and burn-in testing), determined during the life of the electronic system, or some combination of these. Performance parameters can comprise prior operating frequencies, hours of operation, ambient temperature, and supply voltage. Performance parameters can comprise performance statistics determined using age-monitoring circuits, where an aged circuit is compared with a circuit enabled only for comparison. Performance statistics may also be determined though error detection circuits. If an error is detected, the operating frequency can be reduced.

    Frequency modification techniques that adjust an operating frequency to compensate for aging electronic components
    6.
    发明授权
    Frequency modification techniques that adjust an operating frequency to compensate for aging electronic components 失效
    调整工作频率以补偿老化电子元件的频率修改技术

    公开(公告)号:US07475320B2

    公开(公告)日:2009-01-06

    申请号:US10643549

    申请日:2003-08-19

    IPC分类号: G06F11/32 G06F11/18

    CPC分类号: G06F11/008

    摘要: A number of performance parameters for the electronic system are determined at a particular age of the electronic system. The performance parameters can be correlated to maximum operating frequency of electronic components of the electronic system for the particular age of the electronic system. Operating frequency of the electronic components is adjusted in accordance with the performance parameters. The performance parameters may be predetermined (such as through reliability and burn-in testing), determined during the life of the electronic system, or some combination of these. Performance parameters can comprise prior operating frequencies, hours of operation, ambient temperature, and supply voltage. Performance parameters can comprise performance statistics determined using age-monitoring circuits, where an aged circuit is compared with a circuit enabled only for comparison. Performance statistics may also be determined though error detection circuits. If an error is detected, the operating frequency can be reduced.

    摘要翻译: 在电子系统的特定年龄确定电子系统的许多性能参数。 性能参数可以与电子系统的特定年龄的电子系统的电子部件的最大工作频率相关联。 电子元件的工作频率根据性能参数进行调整。 性能参数可以是预定的(例如通过可靠性和老化测试),在电子系统的寿命期间确定,或者这些的一些组合。 性能参数可以包括以前的工作频率,工作时间,环境温度和电源电压。 性能参数可以包括使用年龄监测电路确定的性能统计,其中老化电路与仅用于比较的电路进行比较。 也可以通过错误检测电路来确定性能统计。 如果检测到错误,则可以减少工作频率。

    Redundancy structure and method for high-speed serial link
    7.
    发明授权
    Redundancy structure and method for high-speed serial link 失效
    用于高速串行链路的冗余结构和方法

    公开(公告)号:US07447273B2

    公开(公告)日:2008-11-04

    申请号:US10708240

    申请日:2004-02-18

    IPC分类号: H01L21/82 H01P1/10

    CPC分类号: H04L1/22 H04L25/029 H04L25/08

    摘要: An integrated circuit is provided having a plurality of data transmitters, including a plurality of default data transmitters for transmitting data from a plurality of data sources and at least one redundancy data transmitter. A plurality of connection elements are provided having a first, low impedance connecting state and having a second, high impedance, disconnecting state. The connection elements are operable to disconnect a failing data transmitter from a corresponding output signal line and to connect the redundancy data transmitter to that output signal line in place of the failing data transmitter. In one preferred form, the connection elements include a fuse and an antifuse. In another form, the connection elements include micro-electromechanical (MEM) switches. The connecting elements preferably present the low impedance connecting state at frequencies which include signal switching frequencies above about 500 MHz.

    摘要翻译: 提供了具有多个数据发送器的集成电路,包括用于从多个数据源发送数据的多个默认数据发送器和至少一个冗余数据发送器。 提供了具有第一低阻抗连接状态并且具有第二高阻抗断开状态的多个连接元件。 连接元件可操作以将故障数据发射器与相应的输出信号线断开连接,并将冗余数据发射器连接到该输出信号线来代替故障数据发射器。 在一个优选形式中,连接元件包括保险丝和反熔丝。 在另一种形式中,连接元件包括微机电(MEM)开关。 连接元件优选地在包括高于约500MHz的信号切换频率的频率处呈现低阻抗连接状态。

    Compact SRAM cell incorporating refractory metal-silicon-nitrogen resistive elements and method for fabricating
    10.
    发明授权
    Compact SRAM cell incorporating refractory metal-silicon-nitrogen resistive elements and method for fabricating 失效
    含有难熔金属 - 硅 - 氮电阻元件的紧凑SRAM单元及其制造方法

    公开(公告)号:US06777286B2

    公开(公告)日:2004-08-17

    申请号:US10616243

    申请日:2003-07-08

    IPC分类号: H01L218234

    摘要: A compact SRAM cell that incorporates refractory metal-silicon-nitrogen resistive elements as its pull-up transistors is described which includes a semi-conducting substrate, a pair of NMOS transfer devices formed vertically on the sidewalls of an etched substrate by a metal conductor providing electrical communication between an n+ region in the substrate and a bitline on top, a pair of pull-down nMOS devices on the substrate connected to ground interconnects, and a pair of vertical high-resistive elements formed of a refractory metal-silicon-nitrogen and function as a load for connecting to Vdd. The invention further describes a method for fabricating such compact SRAM cell.

    摘要翻译: 描述了一种紧凑的SRAM单元,其包含难熔金属硅 - 氮电阻元件作为其上拉晶体管,其包括半导体衬底,一对NMOS传输器件,其通过金属导体在蚀刻衬底的侧壁上垂直形成,提供 衬底中n +区和顶部位线之间的电气通信,连接到接地互连的衬底上的一对下拉nMOS器件以及由难熔金属硅形成的一对垂直高电阻元件 - 并且作为连接到Vdd的负载。 本发明还描述了一种用于制造这种紧凑的SRAM单元的方法。