公开(公告)号：US20050018809A1

公开(公告)日：2005-01-27

申请号：US10893511

申请日：2004-07-16

申请人： David Gibson ,  Walter Gibson ,  Huapeng Huang ,  Jodi Reeves

发明人： David Gibson ,  Walter Gibson ,  Huapeng Huang ,  Jodi Reeves

IPC分类号： G01N23/207 ,  G01N23/20

CPC分类号： G01N23/207

摘要： An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.

摘要翻译： 一种用于测量样品的x射线衍射测量装置，其具有以组合的方式耦合在一起的X射线源和检测器，以便围绕样品进行协调旋转，使得可以以多个角度拍摄X射线衍射数据。 该装置可以提供样品的晶体取向的极图表示，其中极图表示晶体对准，并且从用于晶体取向定量的极数计算全宽半最大值。 数据可以沿着样品的长度的离散位置进行，并且样品在测量期间处于固定位置; 或者随着样品在源和检测器之间的运动路径中连续地沿其长度移动，可以沿物品的长度连续地取走数据。 样品可以是带状的，线性地通过测量区域的形式。

公开(公告)号：US20050014653A1

公开(公告)日：2005-01-20

申请号：US10892731

申请日：2004-07-16

申请人： Jodi Reeves ,  David Gibson ,  Walter Gibson ,  Huapeng Huang

发明人： Jodi Reeves ,  David Gibson ,  Walter Gibson ,  Huapeng Huang

IPC分类号： C10F5/00 ,  C30B23/02 ,  C30B29/22 ,  H01L20060101

CPC分类号： H01B12/02 ,  C30B23/002 ,  C30B29/22 ,  H01L39/2461

摘要： A method for forming a superconductive article is disclosed. According to one method, a substrate is provided, the substrate having an aspect ratio of not less than about 1×103, forming a buffer layer overlying the substrate, forming a superconductor layer overlying the buffer layer, and characterizing at least one of the substrate, the buffer layer and the superconductor layer by x-ray diffraction. In this regard, x-ray diffraction is carried out such that data are taken at multiple phi angles. Data acquisition at multiple phi angles permits robust characterization of the film or layer subject to characterization, and such data may be utilized for process control and/or quality control. Additional methods for forming superconductive articles, and for characterizing same with XRD are also disclosed.

摘要翻译： 公开了一种形成超导制品的方法。 根据一种方法，提供衬底，所述衬底具有不小于约1×10 3的纵横比，形成覆盖在衬底上的缓冲层，形成覆盖缓冲层的超导体层，以及表征至少一个 衬底，缓冲层和超导体层通过X射线衍射。 在这方面，进行x射线衍射使得以多个角度拍摄数据。 以多个角度进行的数据采集允许经受表征的胶片或层的强化表征，并且这些数据可用于过程控制和/或质量控制。 还公开了用于形成超导制品并用于用XRD表征其的附加方法。

公开(公告)号：US20070093376A1

公开(公告)日：2007-04-26

申请号：US11560269

申请日：2006-11-15

申请人： Jodi Reeves ,  Yunfei Qiao

发明人： Jodi Reeves ,  Yunfei Qiao

IPC分类号： C04B35/52

CPC分类号： G01B11/303 ,  G01N21/8901

摘要： A tape manufacturing system and a tape-surface-inspection unit are disclosed. The tape-surface-inspection unit is capable of continuously characterizing the surface of a non-transparent tape that is usable with or without a tape manufacturing system. The tape-surface-inspection unit includes a surface illuminator, an imager, an image processor, a tape guide, and, optionally, an indexer. The surface illuminator provides a tape surface located by the tape guide in a manner that allows the imager to capture images for characterization by the image processor. The indexer facilitates a correlation of locations along the tape and a characterization of the locations on the tape. The tape manufacturing system, in addition to at least one tape-surface-inspection unit, includes a tape-processing unit, a tape handler, and a controller.

摘要翻译： 公开了一种胶带制造系统和胶带表面检查装置。 带表面检查单元能够连续地表征可用于或不具有胶带制造系统的不透明带的表面。 带表面检查单元包括表面照明器，成像器，图像处理器，带引导件和可选的分度器。 表面照明器以允许成像仪捕获图像以由图像处理器表征的方式提供由磁带引导件定位的磁带表面。 索引器有助于沿着磁带的位置的相关性以及磁带上位置的表征。 磁带制造系统除了至少一个磁带表面检查单元之外，还包括磁带处理单元，磁带处理器和控制器。

公开(公告)号：US20050123186A1

公开(公告)日：2005-06-09

申请号：US10730961

申请日：2003-12-09

申请人： Jodi Reeves ,  Yunfei Qiao

发明人： Jodi Reeves ,  Yunfei Qiao

IPC分类号： G01Q90/00 ,  G01B11/30 ,  G01N21/89 ,  G01Q60/00 ,  G06K9/00

CPC分类号： G01B11/303 ,  G01N21/8901

摘要： A tape manufacturing system and a tape-surface-inspection unit are disclosed. The tape-surface-inspection unit is capable of continuously characterizing the surface of a non-transparent tape that is usable with or without a tape manufacturing system. The tape-surface-inspection unit includes a surface illuminator, an imager, an image processor, a tape guide, and, optionally, an indexer. The surface illuminator provides a tape surface located by the tape guide in a manner that allows the imager to capture images for characterization by the image processor. The indexer facilitates a correlation of locations along the tape and a characterization of the locations on the tape. The tape manufacturing system, in addition to at least one tape-surface-inspection unit, includes a tape-processing unit, a tape handler, and a controller.

摘要翻译： 公开了一种胶带制造系统和胶带表面检查装置。 带表面检查单元能够连续地表征可用于或不具有胶带制造系统的不透明带的表面。 带表面检查单元包括表面照明器，成像器，图像处理器，带引导件和可选的分度器。 表面照明器以允许成像仪捕获图像以由图像处理器表征的方式提供由磁带引导件定位的磁带表面。 索引器有助于沿着磁带的位置的相关性以及磁带上位置的表征。 磁带制造系统除了至少一个磁带表面检查单元之外，还包括磁带处理单元，磁带处理器和控制器。