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    Exposure development device for long base member
    1.
    发明授权
    Exposure development device for long base member 失效
    长基础成员曝光开发装置

    公开(公告)号：US4719495A

    公开(公告)日：1988-01-12

    申请号：US889534

    申请日：1986-07-25

    申请人： Kazuo Ohuchi ,  Chiharu Miyaake ,  Yutaka Yamamura

    发明人： Kazuo Ohuchi ,  Chiharu Miyaake ,  Yutaka Yamamura

    IPC分类号： G03C7/20 ,  G03F7/20 ,  G03F7/30 ,  H05K1/00 ,  H05K3/00 ,  H05K3/06 ,  G03B27/30

    CPC分类号： G03F7/30 ,  G03F7/2002 ,  H05K3/0097 ,  H05K1/0393 ,  H05K2203/0264 ,  H05K2203/1545 ,  H05K3/0073 ,  H05K3/0082 ,  H05K3/064

    摘要： An exposure development device for long base member is disclosed, comprising:a long base member exposing section which repeats the operations of exposing an image forming long base member in the long size state, the image forming long base member being prepared by laminating an image forming material comprising a transparent support having adhered thereon a photopolymerizable composition layer on a long substrate on the surface of which an image is formed, and intermittently feeding the exposed image forming long base member;a synchronous connection section which detects a length of the image forming long base member intermittently fed from the exposing section and continuously feeds the image forming long base member; anda continuous peel development section which continuously peels the transparent support and non-exposed portions of the photopolymerizable composition layer of the image forming long base member continuously fed from the synchronous section, from the long substrate to retain the exposed photopolymerizable composition layer thereon, whereby an image is formed continuously on the long substrate.

    摘要翻译： 公开了一种用于长基座部件的曝光显影装置，包括：长基部件暴露部分，其重复在长尺寸状态下曝光图像形成长基座部件的操作，所述成像长基座部件通过层叠图像形成 包括在其上形成有图像的表面上的长基板上粘附有可光聚合组合物层的透明支撑体的材料，并且间歇地供给曝光的图像形成长基底构件; 同步连接部分，其检测从曝光部分间歇地供给的图像形成长基座部件的长度，并连续地供给图像形成长基座部件; 以及连续剥离显影部，其从长基板连续剥离从同步部连续供给的成像长基材的可光聚合组合物的透明支持体和未曝光部分，以将曝光的光聚合组合物层保持在其上，由此 在长基板上连续地形成图像。

    X-ray inspection apparatus and X-ray inspection method
    2.
    发明授权
    X-ray inspection apparatus and X-ray inspection method 失效
    X射线检查仪和X射线检查方法

    公开(公告)号：US07099432B2

    公开(公告)日：2006-08-29

    申请号：US10924363

    申请日：2004-08-23

    申请人： Masaru Ichihara ,  Shinji Yoshino ,  Hiroyuki Inoue ,  Toshio Kinoshita ,  Kazuo Ohuchi

    发明人： Masaru Ichihara ,  Shinji Yoshino ,  Hiroyuki Inoue ,  Toshio Kinoshita ,  Kazuo Ohuchi

    IPC分类号： G01N23/083

    CPC分类号： G01N23/046 ,  G01N2223/419 ,  G01N2223/6113

    摘要： The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.

    摘要翻译： 根据本发明的X射线检查装置和X射线检查方法被配置为利用来自X射线照射装置的X射线来保持被检查物体照射，使用摆动装置进行摆动运动 以任意角度和任意方向倾斜被检查物体，在X射线检测装置中对通过被检查物体的X射线进行成像，从X射线图像中提取期望的截面的数据 的X射线检测装置。