Method of fabricating capacitor in semiconductor device
    8.
    发明授权
    Method of fabricating capacitor in semiconductor device 失效
    在半导体器件中制造电容器的方法

    公开(公告)号:US08035193B2

    公开(公告)日:2011-10-11

    申请号:US12343379

    申请日:2008-12-23

    IPC分类号: H01L27/00

    CPC分类号: H01L28/65

    摘要: A capacitor includes a bottom electrode, a dielectric layer and a top electrode over a substrate. A RuXTiYOZ film is included in at least one of the bottom and top electrodes, where x, y and z are positive real numbers. A method of fabricating the capacitor through a sequential formation of a bottom electrode, a dielectric layer and a top electrode over a substrate includes forming a RuXTiYOZ film during a formation of at least one of the bottom electrode and top electrode, where x, y and z are positive real numbers.

    摘要翻译: 电容器包括底部电极,电介质层和衬底上的顶部电极。 至少一个底部电极和顶部电极中包含RuXTiYOZ膜,其中x,y和z为正实数。 通过顺序形成底部电极,电介质层和衬底上的顶部电极来制造电容器的方法包括在形成底部电极和顶部电极中的至少一个时形成RuXTiYOZ膜,其中x,y和 z是正实数。

    METHOD FOR FABRICATING CAPACITOR IN SEMICONDUCTOR DEVICE
    10.
    发明申请
    METHOD FOR FABRICATING CAPACITOR IN SEMICONDUCTOR DEVICE 失效
    在半导体器件中制造电容器的方法

    公开(公告)号:US20090061587A1

    公开(公告)日:2009-03-05

    申请号:US12163937

    申请日:2008-06-27

    IPC分类号: H01L21/02

    CPC分类号: H01L28/65 H01L28/75

    摘要: A method for fabricating a capacitor includes providing a substrate having a capacitor region is employed, forming a first Ru1-xOx layer over the substrate, forming a Ru layer for a lower electrode over the first Ru1-xOx layer and deoxidizing the first Ru1-xOx layer, forming a dielectric layer over the Ru layer for a lower electrode, and forming a conductive layer for an upper electrode over the dielectric layer, wherein the first Ru1-xOx layer contains oxygen in an amount less than an oxygen amount of a RuO2 layer.

    摘要翻译: 一种制造电容器的方法包括提供具有电容器区域的衬底,在衬底上形成第一Ru1-xOx层,在第一Ru1-xOx层上形成用于下电极的Ru层,并使第一Ru1-xOx层脱氧 在用于下电极的Ru层上形成电介质层,在电介质层上形成用于上电极的导电层,其中第一Ru1-xOx层含有的量小于RuO 2层的氧量的氧 。