PHOTOTRANSISTOR AND SEMICONDUCTOR DEVICE
    2.
    发明申请
    PHOTOTRANSISTOR AND SEMICONDUCTOR DEVICE 有权
    光电子器件和半导体器件

    公开(公告)号:US20150214413A1

    公开(公告)日:2015-07-30

    申请号:US14604825

    申请日:2015-01-26

    CPC classification number: H01L27/1443 H01L27/14681 H01L31/02019

    Abstract: A phototransistor includes a first emitter region, a first base region having at least a portion exposed to a light-receiving side, and a first collector region in this order from the light-receiving side in a depth direction. The first collector region includes a second collector region and a third collector region that is in contact with a downstream side of the second collector region in the depth direction and has a resistance lower than that of the second collector region. The phototransistor further includes a first region that is spaced away from the first base region at an outer side of the first base region on a light-receiving side surface thereof, the first region having a conductivity type opposite to that of the first collector region.

    Abstract translation: 光电晶体管包括第一发射极区域,具有从光接收侧暴露的至少一部分的第一基极区域和沿着深度方向的光接收侧的顺序的第一集电极区域。 第一集电极区域包括与深度方向上的第二集电极区域的下游侧接触的第二集电极区域和第三集电极区域,并且具有比第二集电极区域的电阻低的电阻。 光电晶体管还包括在其受光侧表面上的第一基区的外侧与第一基区间隔开的第一区域,第一区域具有与第一集电区域相反的导电类型。

    INSPECTION DEVICE
    3.
    发明申请
    INSPECTION DEVICE 有权
    检查装置

    公开(公告)号:US20150355100A1

    公开(公告)日:2015-12-10

    申请号:US14722746

    申请日:2015-05-27

    Applicant: Keiji TSUDA

    Inventor: Keiji TSUDA

    CPC classification number: G01R31/2635 G01J1/0271 G01J1/42 G01J2001/4252

    Abstract: An inspection device is provided including a light emitting element configured to emit light, a light receiving element arranged so as to face the light emitting element and configured to receive the light, where one of the light emitting element and the light receiving element is used as a to-be-inspected element, and the other one of the light emitting element and the light receiving element is used as an inspection element that inspects the to-be-inspected element, a housing configured to accommodate the inspection element, and a lid configured to be detachable from the housing. In the inspection device, one of the housing and the lid is provided with an arrangement unit to which the to-be-inspected element is set in a detachable manner, and the lid includes a contact unit that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.

    Abstract translation: 提供了一种检查装置,包括被配置为发光的发光元件,被配置为面对发光元件并被配置为接收光的光接收元件,其中发光元件和光接收元件中的一个被用作 待检查元件,另一个发光元件和光接收元件用作检查待检查元件的检查元件,被构造成容纳检查元件的外壳,以及盖 被配置为可从壳体拆卸。 在检查装置中,壳体和盖中的一个设置有可拆卸的待检查元件的布置单元,并且盖包括与待检查的电接触的接触单元 通过触摸和分离来自被检查元件的元件。

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