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    Probe card cooling assembly with direct cooling of active electronic components
    5.
    发明授权
    Probe card cooling assembly with direct cooling of active electronic components 失效
    探针卡冷却组件，直接冷却有源电子部件

    公开(公告)号：US07863915B2

    公开(公告)日：2011-01-04

    申请号：US12547260

    申请日：2009-08-25

    申请人： Charles A. Miller

    发明人： Charles A. Miller

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

    摘要： A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

    摘要翻译： 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。

    Method and apparatus for remotely buffering test channels
    6.
    发明授权
    Method and apparatus for remotely buffering test channels 失效
    用于远程缓存测试通道的方法和设备

    公开(公告)号：US07825652B2

    公开(公告)日：2010-11-02

    申请号：US12273408

    申请日：2008-11-18

    申请人： Charles A. Miller

    发明人： Charles A. Miller

    IPC分类号： G01R31/28

    CPC分类号： G01R31/3008

    摘要： A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.

    摘要翻译： 提供了一种系统，用于使泄漏电流测量或参数测试能够与通道线中提供的隔离缓冲器一起进行。 多个这样的隔离缓冲器用于将单个信号通道连接到多条线路。 泄漏电流测量通过在每个缓冲器的输入和输出之间提供缓冲旁路元件（例如电阻器或传输门）来提供。 缓冲旁路元件可用于通过使用TDR测量来确定缓冲器延迟，以通过缓冲旁路元件反射的脉冲来校准测试系统中的缓冲延迟。 同样可以通过比较缓冲和非缓冲通道线的测量值，或通过测量具有已知延迟的器件来校准缓冲器延迟。

    METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS
    8.
    发明申请
    METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS 失效
    用于校准和/或消除通信通道的方法和装置

    公开(公告)号：US20100017662A1

    公开(公告)日：2010-01-21

    申请号：US12569584

    申请日：2009-09-29

    申请人： Charles A. Miller

    发明人： Charles A. Miller

    IPC分类号： G06F11/00

    CPC分类号： G01R35/005 ,  G01R31/3016 ,  G01R31/31723 ,  G01R31/318511 ,  G01R31/3191 ,  G01R31/31937

    摘要： A series of pulses may be driven down each drive channel, which creates a series of composite pulses at the output of the buffer. Each composite pulse is a composition of the individual pulses driven down the drive channels. Timing offsets associated with the drive channels may be adjusted until the individual pulses of the composite pulse align or closely align. Those timing offsets calibrate and/or deskew the drive channels, compensating for differences in the propagation delays through the drive channels. The composite pulse may be feed back to the tester through compare channels, and offsets associated with compare signals for each compare channel may be aligned to the composite pulse, which calibrates and/or deskews the compare channels.

    摘要翻译： 可以沿着每个驱动通道驱动一系列脉冲，这在缓冲器的输出端产生一系列复合脉冲。 每个复合脉冲是从驱动通道驱动的各个脉冲的组合。 可以调整与驱动通道相关联的定时偏移，直到复合脉冲的各个脉冲对准或紧密对准。 这些定时偏移校准和/或校正驱动通道，补偿通过驱动通道传播延迟的差异。 复合脉冲可以通过比较通道反馈给测试仪，并且与每个比较通道的比较信号相关的偏移量可以与校准和/或对比比较通道的复合脉冲对准。

    Wireless Test Cassette
    9.
    发明申请
    Wireless Test Cassette 有权
    无线测试盒

    公开(公告)号：US20090251162A1

    公开(公告)日：2009-10-08

    申请号：US12485677

    申请日：2009-06-16

    申请人： Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

    发明人： Igor Y. Khandros ,  Benjamin N. Eldridge ,  Charles A. Miller ,  A. Nicholas Sporck

    IPC分类号： G01R31/02

    CPC分类号： G01R1/0491 ,  G01R1/073 ,  G01R31/3025

    摘要： A base controller disposed in a test cassette receives test data for testing a plurality of electronic devices. The base controller wirelessly transmits the test data to a plurality of wireless test control chips, which write the test data to each of the electronic devices. The wireless test control chips then read response data generated by the electronic devices, and the wireless test control chips wirelessly transmit the response data to the base controller.

    摘要翻译： 设置在测试盒中的基本控制器接收用于测试多个电子设备的测试数据。 基站控制器将测试数据无线传输到多个无线测试控制芯片，其将测试数据写入每个电子设备。 然后，无线测试控制芯片读取由电子设备产生的响应数据，无线测试控制芯片将响应数据无线发送到基本控制器。

    Probe card cooling assembly with direct cooling of active electronic components
    10.
    发明授权
    Probe card cooling assembly with direct cooling of active electronic components 失效
    探针卡冷却组件，直接冷却有源电子部件

    公开(公告)号：US07579847B2

    公开(公告)日：2009-08-25

    申请号：US11112034

    申请日：2005-04-22

    申请人： Charles A. Miller

    发明人： Charles A. Miller

    IPC分类号： G01R31/02 ,  G01R31/26

    CPC分类号： G01R31/2875 ,  G01R1/06727 ,  G01R1/07385 ,  G01R31/2886 ,  G01R31/2891

    摘要： A probe card cooling assembly for use in a test system includes a package with one or more dies cooled by direct cooling. The cooled package includes one or more dies with active electronic components and at least one coolant port that allows a coolant to enter the high-density package and directly cool the active electronic components of the dies during a testing operation.

    摘要翻译： 用于测试系统的探针卡冷却组件包括具有通过直接冷却冷却的一个或多个模具的封装。 冷却的包装包括具有有源电子部件的一个或多个模具和允许冷却剂进入高密度封装并且在测试操作期间直接冷却模具的有效电子部件的至少一个冷却剂端口。