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公开(公告)号：US6097207A
公开(公告)日：2000-08-01
申请号：US138100
申请日：1998-08-21
IPC分类号： H03K19/096 , H03K19/003
CPC分类号： H03K19/0963
摘要： A domino circuit design for handling high stress conditions. The domino logic circuit includes a programmable mechanism for choosing whether the circuit is operating during normal operations or during a stress test, such as a burn-in procedure. In particular, the circuit includes a dual purpose transistor that is controllable by either a precharge signal or an output signal, and includes a mechanism for selecting whether the precharge signal or the output signal is to control the gate input of the dual purpose transistor. Accordingly, the dual purpose transistor will either act in parallel with the precharge device, or a keeper device depending on the mode of operation chosen.
摘要翻译： 用于处理高应力条件的多米诺骨牌电路设计。 多米诺骨牌逻辑电路包括用于选择电路在正常操作期间或在诸如老化过程的压力测试期间操作的可编程机构。 特别地，电路包括可通过预充电信号或输出信号控制的双用途晶体管，并且包括用于选择预充电信号或输出信号是否控制双用晶体管的栅极输入的机构。 因此，双用途晶体管将根据所选择的操作模式与预充电装置或保持器装置并联起作用。
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公开(公告)号：US08234554B2
公开(公告)日：2012-07-31
申请号：US12170462
申请日：2008-07-10
申请人： Kerry Bernstein , Norman J. Rohrer
发明人： Kerry Bernstein , Norman J. Rohrer
IPC分类号： H03M13/00
CPC分类号： H03M13/15 , G06F11/1008 , H03M13/098 , H03M13/13 , H03M13/1505 , H03M13/19
摘要： An error-correction code is generated on a line-by-line basis of the physical logic register and latch contents that store encoded words within a processor just before the processor is put into sleep mode, and later-generated syndrome bits are checked for any soft errors when the processor wakes back up, e.g., as part of the power-up sequence.
摘要翻译： 在处理器进入睡眠模式之前，将物理逻辑寄存器和锁存内容逐行生成在处理器内的处理器内，生成错误校正码，并检查后来生成的校验码位 处理器唤醒时出现软错误，例如作为上电顺序的一部分。
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3.发明申请METHOD OF DESIGNING AN INTEGRATED CIRCUIT BASED ON A COMBINATION OF MANUFACTURABILITY, TEST COVERAGE AND, OPTIONALLY, DIAGNOSTIC COVERAGE 有权基于可制造性，测试覆盖和可选择的诊断覆盖的组合设计集成电路的方法公开(公告)号：US20120066657A1
公开(公告)日：2012-03-15
申请号：US12880228
申请日：2010-09-13
CPC分类号： G06F17/5045 , G06F2217/12 , Y02P90/265
摘要： Disclose are embodiments of an integrated circuit design method based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage. Design-for manufacturability (DFM) modifications to the layout of an integrated circuit can be made in light of test coverage. Alternatively, test coverage of an integrated circuit can be established in light of DFM modifications. Alternatively, an iterative process can be performed, where DFM modifications to the layout of an integrated circuit are made in light of test coverage and then test coverage is altered in light of the DFM modifications. Alternatively, DFM modifications to the layout of an integrated circuit can be made in light of test coverage and also diagnostic coverage. In any case, after making DFM modifications and establishing test coverage, any unmodified and untested nodes (and, optionally, any unmodified and undiagnosable tested nodes) in the integrated circuit can be identified and tagged for subsequent in-line inspection.
摘要翻译： 披露是基于可制造性，测试覆盖和任选的诊断覆盖的组合的集成电路设计方法的实施例。 根据测试覆盖范围，可以对集成电路布局的可制造性（DFM）进行设计修改。 或者，可以根据DFM修改建立集成电路的测试覆盖。 或者，可以执行迭代处理，其中根据测试覆盖进行DFM对集成电路的布局的修改，然后根据DFM修改来改变测试覆盖。 或者，DFM可以根据测试覆盖范围和诊断覆盖范围对集成电路布局进行修改。 在任何情况下，在进行DFM修改和建立测试覆盖之后，可以识别和标记集成电路中的任何未修改和未测试的节点（以及可选地，任何未修改和不可判定的测试节点）以便随后的在线检查。
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4.发明授权System and method for designing a low leakage monotonic CMOS logic circuit 有权用于设计低泄漏单调CMOS逻辑电路的系统和方法公开(公告)号：US07996810B2
公开(公告)日：2011-08-09
申请号：US12103038
申请日：2008-04-15
申请人： Kerry Bernstein , Norman J. Rohrer
发明人： Kerry Bernstein , Norman J. Rohrer
IPC分类号： G06F17/50
CPC分类号： G06F17/505 , H03K19/0016 , H03K19/0948
摘要： A computer system for designing a low leakage monotonic CMOS logic circuit. The system performing the computer implements steps of: (a) specifying a reference PFET having its threshold voltage and its gate dielectric thickness and a reference NFET having its threshold voltage and its gate dielectric thickness; (b) synthesizing a schematic circuit design with standard design elements, the standard design elements including one or more reference PFETS and one or more reference NFETs; (c) analyzing one or more circuits for logic stages having predominantly high input logic states or predominantly low input logic states; (d) selecting one or more logic stages determined to have predominantly high input logic states or predominantly low input logic states; and (e) replacing the standard design elements of the selected logic stages with reduced current leakage elements.
摘要翻译： 一种用于设计低泄漏单调CMOS逻辑电路的计算机系统。 执行计算机的系统实现以下步骤：（a）指定具有其阈值电压及其栅介质厚度的参考PFET和具有其阈值电压及其栅介质厚度的参考NFET; （b）用标准设计元件合成示意电路设计，标准设计元件包括一个或多个参考PFET和一个或多个参考NFET; （c）分析具有主要为高输入逻辑状态或主要为低输入逻辑状态的逻辑级的一个或多个电路; （d）选择确定为具有主要高输入逻辑状态或主要为低输入逻辑状态的一个或多个逻辑级; 和（e）用减少的电流泄漏元件代替所选逻辑级的标准设计元件。
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公开(公告)号：US07642813B2
公开(公告)日：2010-01-05
申请号：US11850857
申请日：2007-09-06
申请人： Kerry Bernstein , Philip G. Emma , John A. Fifield , Paul D. Kartschoke , William A. Klaasen , Norman J. Rohrer
发明人： Kerry Bernstein , Philip G. Emma , John A. Fifield , Paul D. Kartschoke , William A. Klaasen , Norman J. Rohrer
IPC分类号： H03K19/20 , H03K19/094 , H03K19/003
CPC分类号： H03K19/007
摘要： The invention includes an error correcting logic system that allows critical circuits to be hardened with only one redundant unit and without loss of circuit performance. The system provides an interconnecting gate that suppresses a fault in one of at least two redundant dynamic logic gates that feed to the interconnecting gate. The system is applicable to dynamic or static logic systems. The system prevents propagation of a fault, and addresses not only soft errors, but noise-induced errors. Also, there is provided a design structure embodied in a machine readable medium used in a design process, and which includes such error correcting logic system.
摘要翻译： 本发明包括纠错逻辑系统，其允许仅使用一个冗余单元来硬化关键电路并且不损失电路性能。 该系统提供互连门，其抑制馈送到互连门的至少两个冗余动态逻辑门之一的故障。 该系统适用于动态或静态逻辑系统。 该系统防止故障传播，不仅解决软错误，而且还会引起噪声引起的错误。 此外，提供了在设计过程中使用的机器可读介质中体现的设计结构，并且包括这种纠错逻辑系统。
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公开(公告)号：US20100011278A1
公开(公告)日：2010-01-14
申请号：US12170462
申请日：2008-07-10
申请人： Kerry Bernstein , Norman J. Rohrer
发明人： Kerry Bernstein , Norman J. Rohrer
CPC分类号： H03M13/15 , G06F11/1008 , H03M13/098 , H03M13/13 , H03M13/1505 , H03M13/19
摘要： An error-correction code is generated on a line-by-line basis of the physical logic register and latch contents that store encoded words within a processor just before the processor is put into sleep mode, and later-generated syndrome bits are checked for any soft errors when the processor wakes back up, e.g., as part of the power-up sequence.
摘要翻译： 在处理器进入睡眠模式之前，将物理逻辑寄存器和锁存内容逐行生成在处理器内的处理器内，生成错误校正码，并检查后来生成的校验码位 处理器唤醒时出现软错误，例如作为上电顺序的一部分。
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公开(公告)号：US06577178B1
公开(公告)日：2003-06-10
申请号：US10064504
申请日：2002-07-23
IPC分类号： H03K1730
CPC分类号： H03K19/00361 , H03K19/0948
摘要： A circuit includes a resistance-capacitance (RC) structure connected to a first set of transistors and a second set of transistors that perform the same logical function as the first set of transistors. The first set of transistors have thinner gate oxides than the second set of transistors. The RC structure drains an electric field from the first set of transistors, such that the first set of transistors are on only during initial transistor switching. In other words, the RC structure turns off the first set of transistors after transistor switching is completed. Also, the first set of transistors and the second set of transistors share common inputs and outputs. The first set of transistors exhibit higher tunneling currents than the second set of transistors. The thinner gate oxides of the first set of transistors cause the first set of transistors to exhibit higher device currents than the second set of transistors. The RC structure includes a capacitor connected to a gate of the first set of transistors and a resistor connected to the capacitor and to ground.
摘要翻译： 电路包括连接到第一组晶体管的电阻 - 电容（RC）结构和执行与第一组晶体管相同的逻辑功能的第二组晶体管。 第一组晶体管具有比第二组晶体管更薄的栅极氧化物。 RC结构从第一组晶体管引出电场，使得第一组晶体管仅在初始晶体管切换期间导通。 换句话说，在晶体管切换完成之后，RC结构关闭第一组晶体管。 此外，第一组晶体管和第二组晶体管共享公共输入和输出。 第一组晶体管表现出比第二组晶体管更高的隧穿电流。 第一组晶体管的较薄的栅极氧化物导致第一组晶体管表现出比第二组晶体管更高的器件电流。 RC结构包括连接到第一组晶体管的栅极的电容器和连接到电容器并接地的电阻器。
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公开(公告)号：US06191628B1
公开(公告)日：2001-02-20
申请号：US09224763
申请日：1999-01-04
IPC分类号： H03K512
CPC分类号： H03K19/00323 , H03K5/131 , H03K5/133 , H03K19/00361 , H03K2005/00071
摘要： A circuit for selectively controlling the slew rate of a signal on a data line. A capacitor is connected at one end to a common terminal of a power supply and to a switching circuit. The switching circuit advantageously connects the capacitor to the data line in response to a control pulse, capacitively loading the data line so that slew rate is decreased. When the control pulse assumes a different state, the capacitor is connected by the switching circuit to a terminal of a power supply, and acts as a decoupling capacitor. The dual role of the capacitor provides for efficient circuit layout by utilizing one component in two functions.
摘要翻译： 用于选择性地控制数据线上的信号的转换速率的电路。 电容器一端连接到电源的公共端子和开关电路。 开关电路有利地将电容器响应于控制脉冲连接到数据线，电容性地加载数据线，使得转换速率降低。 当控制脉冲处于不同状态时，电容器通过开关电路连接到电源的端子，并用作去耦电容器。 电容器的双重作用通过利用两个功能中的一个组件来提供有效的电路布局。
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9.发明授权Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage 有权基于可制造性，测试覆盖和可选地诊断覆盖的组合来设计集成电路的方法公开(公告)号：US08347260B2
公开(公告)日：2013-01-01
申请号：US12880228
申请日：2010-09-13
IPC分类号： G06F11/22
CPC分类号： G06F17/5045 , G06F2217/12 , Y02P90/265
摘要： Disclose are embodiments of an integrated circuit design method based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage. Design-for manufacturability (DFM) modifications to the layout of an integrated circuit can be made in light of test coverage. Alternatively, test coverage of an integrated circuit can be established in light of DFM modifications. Alternatively, an iterative process can be performed, where DFM modifications to the layout of an integrated circuit are made in light of test coverage and then test coverage is altered in light of the DFM modifications. Alternatively, DFM modifications to the layout of an integrated circuit can be made in light of test coverage and also diagnostic coverage. In any case, after making DFM modifications and establishing test coverage, any unmodified and untested nodes (and, optionally, any unmodified and undiagnosable tested nodes) in the integrated circuit can be identified and tagged for subsequent in-line inspection.
摘要翻译： 披露是基于可制造性，测试覆盖和任选的诊断覆盖的组合的集成电路设计方法的实施例。 根据测试覆盖范围，可以对集成电路布局的可制造性（DFM）进行设计修改。 或者，可以根据DFM修改建立集成电路的测试覆盖。 或者，可以执行迭代处理，其中根据测试覆盖进行DFM对集成电路的布局的修改，然后根据DFM修改来改变测试覆盖。 或者，DFM可以根据测试覆盖范围和诊断覆盖范围对集成电路布局进行修改。 在任何情况下，在进行DFM修改和建立测试覆盖之后，可以识别和标记集成电路中的任何未修改和未测试的节点（以及可选地，任何未修改和不可判定的测试节点）以便随后的在线检查。
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10.发明授权公开(公告)号：US08055822B2
公开(公告)日：2011-11-08
申请号：US11842206
申请日：2007-08-21
申请人： Kerry Bernstein , Nazmul Habib , Norman J. Rohrer
发明人： Kerry Bernstein , Nazmul Habib , Norman J. Rohrer
CPC分类号： G06F9/3851 , G06F9/3891
摘要： An integrated circuit includes a plurality of processor cores and a readable non-volatile memory that stores information expressive of at least one operating characteristic for each of the plurality of processor cores. Also disclosed is a method to operate a data processing system, where the method includes providing a multicore processor that contains a plurality of processor cores and a readable non-volatile memory that stores information, determined during a testing operation, that is indicative of at least a maximum operating frequency for each of the plurality of processor cores. The method further includes operating a scheduler coupled to an operating system and to the multicore processor, where the scheduler is operated to be responsive at least in part to information read from the memory to schedule the execution of threads to individual ones of the processor cores for a more optimal usage of energy.
摘要翻译： 集成电路包括多个处理器核心和可读非易失性存储器，其存储表示多个处理器核心中的每一个的至少一个操作特性的信息。 还公开了一种操作数据处理系统的方法，其中所述方法包括提供包含多个处理器核心的多核处理器和存储在测试操作期间确定的信息的可读非易失性存储器，其指示至少 用于所述多个处理器核心中的每一个的最大工作频率。 所述方法还包括操作耦合到操作系统和多核处理器的调度器，其中调度器被操作以至少部分地响应于从存储器读取的信息，以调度到处理器核心中的各个处理器核心的线程的执行 更优化的能量使用。
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