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公开(公告)号:US20250130938A1
公开(公告)日:2025-04-24
申请号:US18882292
申请日:2024-09-11
Applicant: Kioxia Corporation
Inventor: Kazutaka TAKIZAWA , Yuki KAMIJO , Takehiko AMAKI , Shohei ASAMI , Shunichi IGAHARA
IPC: G06F12/02
Abstract: A memory system according to one embodiment includes a memory device and a memory controller. The memory device includes memory cells. The memory controller executes a tracking operation. In the tracking operation, the memory controller is configured to cause the memory device to execute a plurality of times of read operations using a plurality of read levels. In the tracking operation, the memory controller is further configured to set a first voltage difference between two adjacent read levels of the read levels in a fourth voltage range lower than a first voltage in a third voltage range and a second voltage difference between two adjacent read levels of the read levels in a fifth voltage range higher than the first voltage in the third voltage range. The first and second voltage differences are different from each other.
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公开(公告)号:US20210241833A1
公开(公告)日:2021-08-05
申请号:US17038721
申请日:2020-09-30
Applicant: KIOXIA CORPORATION
Inventor: Kazutaka TAKIZAWA , Yoshihisa KOJIMA , Masaaki NIIJIMA
Abstract: A memory system includes a non-volatile memory chip and a controller. The non-volatile memory chip is capable of determining an erase voltage according to a temperature of the non-volatile memory chip and a correction parameter. The controller is configured to update the correction parameter of the non-volatile memory chip according to temperature information related to the temperature of the non-volatile memory chip. The non-volatile memory chip determines the erase voltage according to the temperature of the non-volatile memory chip and the updated correction parameter received from the controller.
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公开(公告)号:US20210082528A1
公开(公告)日:2021-03-18
申请号:US16817371
申请日:2020-03-12
Applicant: Kioxia Corporation
Inventor: Kazutaka TAKIZAWA , Yoshihisa KOJIMA , Sumio KURODA , Masaaki NIIJIMA
Abstract: According to one embodiment, a memory system includes a first memory and a memory controller. The first memory is nonvolatile and includes a plurality of memory cell transistors, each of which stores data corresponding to a threshold voltage. The memory controller causes the first memory to execute a read operation to acquire data corresponding to the threshold voltage from the plurality of memory cell transistors on the basis of a result of comparison between the threshold voltage and a read voltage. The memory controller selects a first candidate value from among a plurality of candidate values for the read voltage in accordance with a degree of stress that affects the threshold voltage; and causes the first memory to execute the read operation using the first candidate value as the read voltage.
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公开(公告)号:US20200303018A1
公开(公告)日:2020-09-24
申请号:US16727488
申请日:2019-12-26
Applicant: KIOXIA Corporation
Inventor: Kazutaka TAKIZAWA , Yoshihisa KOJIMA , Masaaki NIIJIMA
IPC: G11C16/26 , G11C16/04 , G11C16/22 , G11C11/56 , H01L27/11556 , H01L27/11582
Abstract: A memory system includes a nonvolatile memory and a controller. The nonvolatile memory includes memory cells at intersection locations of stacked word lines and a memory pillar passing through the word lines in a stacking direction, the word lines including a first group of word lines stacked above a second group of word lines. The controller reads data of a first memory cell in a first read mode and reads data of a second memory cell in a second read mode. The first memory cell is, and the second memory cell is not, at an intersection location of a word line that is in a boundary area of the first and second groups of word lines and the memory pillar. The boundary area is adjacent to a location of the memory pillar where a width of the memory pillar discontinuously changes along the stacking direction.
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