SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR STORAGE DEVICE

    公开(公告)号:US20210335401A1

    公开(公告)日:2021-10-28

    申请号:US17121231

    申请日:2020-12-14

    Abstract: According to one embodiment, there is provided a semiconductor integrated circuit including an input circuit. The input circuit includes a first amplifier and a second amplifier. The second amplifier is electrically connected to the first amplifier. The second amplifier includes a first transistor, a second transistor, a third transistor, a fourth transistor, and a time constant providing circuit. The first transistor has a gate electrically connected to a first node of the first amplifier. The second transistor has a gate electrically connected to a second node of the first amplifier. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The time constant providing circuit is electrically connected between a gate of the third transistor and a drain of the third transistor, a gate of the fourth transistor.

    SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR STORAGE DEVICE

    公开(公告)号:US20210295930A1

    公开(公告)日:2021-09-23

    申请号:US17118703

    申请日:2020-12-11

    Abstract: According to one embodiment, in a semiconductor integrated circuit, an input circuit has an input and an output stage electrically connected to the input stage via a first node and a second node. The input stage includes a first transistor, a second transistor, a third transistor, a fourth transistor, a first time constant adjusting circuit and a second time constant adjusting circuit. The first transistor has a gate that receives an input signal. The second transistor has a gate that receives a reference signal. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The first time constant adjusting circuit is electrically connected between a gate of the third transistor and the first node. The second time constant adjusting circuit is electrically connected between a gate of the fourth transistor and the second node.

    SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR OPERATION THEREOF

    公开(公告)号:US20210090633A1

    公开(公告)日:2021-03-25

    申请号:US16803260

    申请日:2020-02-27

    Abstract: According to one embodiment, a semiconductor memory device includes a plurality of memory cells connected to a word line, a circuit configured to apply a voltage to the word line, a detection circuit configured to detect a first time difference from when a first signal of which a voltage is increased with a first slope is applied to the word line to when a current flows through the memory cells in response to applying the first signal, and a second time difference from when a second signal of which a voltage is increased with a second slope is applied to the word line to when a current flows through the memory cells in response to applying the second signal, the second slope being different from the first slope, and a determination circuit configured to determine a threshold voltage of the memory cells based on a difference between the first time difference and the second time difference.

    SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE

    公开(公告)号:US20240195372A1

    公开(公告)日:2024-06-13

    申请号:US18489140

    申请日:2023-10-18

    CPC classification number: H03F3/45659 H10B41/30 H10B43/30 H03F2203/45091

    Abstract: An amplifier of an input circuit includes: a first PMOS transistor having a gate connected to a first node, a source connected to a second node, and a drain connected to a third node; a second PMOS transistor having a gate connected to a fourth node that inputs a reference signal, a source connected to the second node, and a drain connected to a fifth node; a current source connected between a power supply voltage and the second node; a load circuit connected between the third node and a ground voltage; a first NMOS transistor having a gate connected to the first node, a drain connected to the power supply voltage, and a source connected to the fifth node; and a second NMOS transistor having a gate connected to the fourth node, a drain connected to the power supply voltage, and a source connected to the third node.

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