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公开(公告)号:US20210335401A1
公开(公告)日:2021-10-28
申请号:US17121231
申请日:2020-12-14
Applicant: Kioxia Corporation
Inventor: Yutaka SHIMIZU , Satoshi INOUE , Isao FUJISAWA , Yumi TAKADA
IPC: G11C7/10
Abstract: According to one embodiment, there is provided a semiconductor integrated circuit including an input circuit. The input circuit includes a first amplifier and a second amplifier. The second amplifier is electrically connected to the first amplifier. The second amplifier includes a first transistor, a second transistor, a third transistor, a fourth transistor, and a time constant providing circuit. The first transistor has a gate electrically connected to a first node of the first amplifier. The second transistor has a gate electrically connected to a second node of the first amplifier. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The time constant providing circuit is electrically connected between a gate of the third transistor and a drain of the third transistor, a gate of the fourth transistor.
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公开(公告)号:US20210295930A1
公开(公告)日:2021-09-23
申请号:US17118703
申请日:2020-12-11
Applicant: Kioxia Corporation
Inventor: Fumiya WATANABE , Masaru KOYANAGI , Yutaka SHIMIZU , Yasuhiro HIRASHIMA , Kei SHIRAISHI , Mikihiko ITO
Abstract: According to one embodiment, in a semiconductor integrated circuit, an input circuit has an input and an output stage electrically connected to the input stage via a first node and a second node. The input stage includes a first transistor, a second transistor, a third transistor, a fourth transistor, a first time constant adjusting circuit and a second time constant adjusting circuit. The first transistor has a gate that receives an input signal. The second transistor has a gate that receives a reference signal. The third transistor is disposed adjacent to a drain of the first transistor. The fourth transistor is disposed adjacent to a drain of the second transistor. The first time constant adjusting circuit is electrically connected between a gate of the third transistor and the first node. The second time constant adjusting circuit is electrically connected between a gate of the fourth transistor and the second node.
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公开(公告)号:US20210090633A1
公开(公告)日:2021-03-25
申请号:US16803260
申请日:2020-02-27
Applicant: KIOXIA CORPORATION
Inventor: Rui ITO , Makoto MORIMOTO , Yutaka SHIMIZU , Ryuichi FUJIMOTO
IPC: G11C11/4074 , G11C11/408 , G11C11/4076 , G11C16/34 , G11C7/10
Abstract: According to one embodiment, a semiconductor memory device includes a plurality of memory cells connected to a word line, a circuit configured to apply a voltage to the word line, a detection circuit configured to detect a first time difference from when a first signal of which a voltage is increased with a first slope is applied to the word line to when a current flows through the memory cells in response to applying the first signal, and a second time difference from when a second signal of which a voltage is increased with a second slope is applied to the word line to when a current flows through the memory cells in response to applying the second signal, the second slope being different from the first slope, and a determination circuit configured to determine a threshold voltage of the memory cells based on a difference between the first time difference and the second time difference.
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公开(公告)号:US20240324220A1
公开(公告)日:2024-09-26
申请号:US18604848
申请日:2024-03-14
Applicant: KIOXIA CORPORATION
Inventor: Yoshikazu HOSOMURA , Go OIKE , Yutaka SHIMIZU , Masaki NAKAMURA , Hironobu HAMANAKA , Hideo WADA
IPC: H10B43/27 , H01L23/00 , H01L25/065 , H01L25/18 , H10B80/00
CPC classification number: H10B43/27 , H01L24/08 , H01L25/0657 , H01L25/18 , H10B80/00 , H01L2224/08145 , H01L2924/1431 , H01L2924/14511
Abstract: A semiconductor memory device comprises: a substrate; a first wiring layer; a second wiring layer provided between the substrate and the first wiring layer; and a memory cell array layer provided between the substrate and the second wiring layer. The memory cell array layer comprises a contact extending in a first direction intersecting with a surface of the substrate. The first wiring layer has a second conductive layer that includes a connecting portion, a pad electrode portion, and a peripheral edge portion. The connecting portion is connected to one end in the first direction of the contact. The second wiring layer has: a first opening which is provided in a region including the connecting portion and the pad electrode portion of the second conductive layer; and a ring-shaped first slit which surrounds the peripheral edge portion of the second conductive layer.
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公开(公告)号:US20240195372A1
公开(公告)日:2024-06-13
申请号:US18489140
申请日:2023-10-18
Applicant: Kioxia Corporation
Inventor: Yutaka SHIMIZU , Yasuhiro HIRASHIMA , Isao FUJISAWA , Michael BURGHART , Yuanlun ZHANG
CPC classification number: H03F3/45659 , H10B41/30 , H10B43/30 , H03F2203/45091
Abstract: An amplifier of an input circuit includes: a first PMOS transistor having a gate connected to a first node, a source connected to a second node, and a drain connected to a third node; a second PMOS transistor having a gate connected to a fourth node that inputs a reference signal, a source connected to the second node, and a drain connected to a fifth node; a current source connected between a power supply voltage and the second node; a load circuit connected between the third node and a ground voltage; a first NMOS transistor having a gate connected to the first node, a drain connected to the power supply voltage, and a source connected to the fifth node; and a second NMOS transistor having a gate connected to the fourth node, a drain connected to the power supply voltage, and a source connected to the third node.
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