Semiconductor device and manufacturing method thereof
    2.
    发明授权
    Semiconductor device and manufacturing method thereof 有权
    半导体装置及其制造方法

    公开(公告)号:US07638377B2

    公开(公告)日:2009-12-29

    申请号:US11710658

    申请日:2007-02-23

    IPC分类号: H01L21/84

    摘要: In a crystallization process of an amorphous semiconductor film, a first polycrystalline semiconductor film, in which amorphous regions are dotted within the continuous crystal region, is obtained by performing heat treatment after introducing a metallic element which promotes crystallization on the amorphous semiconductor film. At this point, the amorphous regions are kept within a predetermined range. A laser beam having a wave length region, which can give more energy to the amorphous region than to the crystal region, is irradiated to the first polycrystalline semiconductor film, it is possible to crystallize the amorphous region without destroying the crystal region. If a TFT is manufactured based on a second polycrystalline semiconductor film, which is obtained through the above-mentioned crystallization processes, the TFT with high electric characteristics and less fluctuation can be obtained.

    摘要翻译: 在非晶半导体膜的结晶化处理中,通过在导致在非晶半导体膜上促进结晶的金属元素引入后进行热处理,得到非晶区域在连续晶体区域内点缀的第一多晶半导体膜。 此时,非晶区域保持在预定范围内。 具有能够向非晶区域提供比晶体区域更多能量的波长区域的激光束被照射到第一多晶半导体膜,可以使非晶区域结晶而不破坏晶体区域。 如果通过上述结晶工艺获得的基于第二多晶半导体膜制造TFT,则可以获得具有高电特性和较小波动的TFT。

    Method for manufacturing transistor semiconductor devices with step of annealing to getter metal with phosphorous
    3.
    发明授权
    Method for manufacturing transistor semiconductor devices with step of annealing to getter metal with phosphorous 失效
    制造具有退火步骤的晶体管半导体器件的方法,用磷吸收金属

    公开(公告)号:US06518102B1

    公开(公告)日:2003-02-11

    申请号:US08928750

    申请日:1997-09-12

    IPC分类号: H01L21335

    CPC分类号: H01L29/78621 H01L29/66757

    摘要: A method for producing a thin-film transistor by using a crystalline silicon film that has been formed by using nickel as a metal element for accelerating crystallization of silicon. In forming source and drain regions, phosphorus as an element for gettering nickel is introduced therein by ion implantation. Nickel gettering is effected by annealing. For example, in the case of producing a P-channel thin-film transistor, both phosphorus and boron are used. Boron determines a conductivity type, and phosphorus is used as a gettering material.

    摘要翻译: 通过使用通过使用镍作为加速硅的结晶的金属元素形成的结晶硅膜来制造薄膜晶体管的方法。 在形成源极和漏极区域中,通过离子注入引入作为吸杂镍的元素的磷。 镍的除气是通过退火进行的。 例如,在制造P沟道薄膜晶体管的情况下,使用磷和硼。 硼决定导电类型,磷用作吸气材料。

    Semiconductor device and manufacturing method thereof
    5.
    发明申请
    Semiconductor device and manufacturing method thereof 有权
    半导体装置及其制造方法

    公开(公告)号:US20070184593A1

    公开(公告)日:2007-08-09

    申请号:US11710658

    申请日:2007-02-23

    IPC分类号: H01L21/84 H01L21/20 H01L21/00

    摘要: In a crystallization process of an amorphous semiconductor film, a first polycrystalline semiconductor film, in which amorphous regions are dotted within the continuous crystal region, is obtained by performing heat treatment after introducing a metallic element which promotes crystallization on the amorphous semiconductor film. At this point, the amorphous regions are kept within a predetermined range. A laser beam having a wave length region, which can give more energy to the amorphous region than to the crystal region, is irradiated to the first polycrystalline semiconductor film, it is possible to crystallize the amorphous region without destroying the crystal region. If a TFT is manufactured based on a second polycrystalline semiconductor film, which is obtained through the above-mentioned crystallization processes, the TFT with high electric characteristics and less fluctuation can be obtained.

    摘要翻译: 在非晶半导体膜的结晶化处理中,通过在导致在非晶半导体膜上促进结晶的金属元素引入后进行热处理,得到非晶区域在连续晶体区域内点缀的第一多晶半导体膜。 此时,非晶区域保持在预定范围内。 具有能够向非晶区域提供比晶体区域更多能量的波长区域的激光束被照射到第一多晶半导体膜,可以使非晶区域结晶而不破坏晶体区域。 如果通过上述结晶工艺获得的基于第二多晶半导体膜制造TFT,则可以获得具有高电特性和较小波动的TFT。

    Semiconductor device and manufacturing method thereof
    7.
    发明授权
    Semiconductor device and manufacturing method thereof 失效
    半导体装置及其制造方法

    公开(公告)号:US06353244B1

    公开(公告)日:2002-03-05

    申请号:US08908281

    申请日:1997-08-07

    IPC分类号: H01L2701

    CPC分类号: H01L27/1203 G02F1/13454

    摘要: A TFT having a high threshold voltage is connected to the source electrode of each TFT that constitutes a CMOS circuit. In another aspect, pixel thin-film transistors are constructed such that a thin-film transistor more distant from a gate line drive circuit has a lower threshold voltage. In a further aspect, a control film that is removable in a later step is formed on the surface of the channel forming region of a TFT, and doping is performed from above the control film.

    摘要翻译: 具有高阈值电压的TFT连接到构成CMOS电路的每个TFT的源电极。 在另一方面,像素薄膜晶体管被构造成使得离栅极线驱动电路更远的薄膜晶体管具有较低的阈值电压。 在另一方面,在TFT的沟道形成区域的表面上形成可在后续步骤中移除的控制膜,并且从控制膜的上方进行掺杂。