摘要:
A duty detection circuit includes discharge transistors, charge transistors, detection lines, and a comparator circuit that detects a potential difference of these detection lines, and also includes a gate circuit that controls the discharge transistors and the charge transistors in response to the internal clock signal of an even cycle. As a result, the detection lines are charged and discharged in response to the internal clock signal of the even cycle. Consequently, the duty detection circuit can be applied to a multi-phase DLL circuit, and a potential difference appearing in the detection line can be sufficiently secured.
摘要:
A duty correction circuit is formed using at least one delay circuit, which is constituted of a first inverter including three transistors of different conduction types and a second inverter including three other transistors of different conduction types and which delays and adjusts an input clock signal at the leading-edge/trailing-edge timing so as to convert it into an output clock signal based on a first or second bias voltage produced by a bias circuit detecting the duty ratio of the output clock signal. The duty correction circuit decreases the high-level period of the output clock signal having a high duty ratio based on the first bias voltage. Alternatively, the duty correction circuit increases the high-level period of the output clock signal having a low duty ratio based on the second bias voltage.
摘要:
A DLL circuit includes a delay line (CDL) (10) that delays a clock signal at a relatively coarse adjustment pitch, a delay line (FDL) (20) that delays the clock signal at a relatively fine adjustment pitch, and phase detecting circuits and counter control circuits that control delay amounts of the delay lines (10, 20). The counter control circuits control the delay line (10) by a linear search method, and control the delay line (20) by a binary search method. As a result, even when the number of bits of the count signal for adjusting the delay line (20) is increased, a delay amount can be determined at a high speed.
摘要:
A duty correction circuit is formed using at least one delay circuit, which is constituted of a first inverter including three transistors of different conduction types and a second inverter including three other transistors of different conduction types and which delays and adjusts an input clock signal at the leading-edge/trailing-edge timing so as to convert it into an output clock signal based on a first or second bias voltage produced by a bias circuit detecting the duty ratio of the output clock signal. The duty correction circuit decreases the high-level period of the output clock signal having a high duty ratio based on the first bias voltage. Alternatively, the duty correction circuit increases the high-level period of the output clock signal having a low duty ratio based on the second bias voltage.
摘要:
To provide a semiconductor memory device including: a first clock generation circuit and a second clock generation circuit that generate a first internal clock and a second internal clock, respectively; a latency counter that counts latency synchronously with the first internal clock; and a recovery counter that counts a write recovery period synchronously with the second internal clock. The second clock generation circuit activates the second internal clock when auto-precharge is designated, and deactivates the second internal clock when the auto-precharge is not designated. With this configuration, the recovery counter does not perform any counting operation when an auto-precharge function is not operated, and thus unnecessary power consumption can be prevented.
摘要:
In one embodiment, to maintain the operation stability of a semiconductor device even when an external voltage changes. An input signal discrimination unit operates with a power supply potential supplied from a first power supply line VDDI. The input signal discrimination unit compares an input signal VIN with a reference potential Vref. The comparison result is inverted into a signal V0 by an inverter INV1. A power supply sensor circuit monitors the potential of the first power supply line VDDI. If an external potential VDDI falls below a reference potential VX, the power supply sensor circuit turns on a second current source. When the second current source is turned on, an operating current is supplied to a discrimination unit from the second current source as well as a first current source.
摘要:
A synchronous semiconductor memory device of the present invention has a clock generator for generating a normal and a reverse phase clocks by dividing an external clock, a command decoder for decoding an external command and outputting a command signal; latency setting means capable of selectively setting an even or odd number latency within a range of a predetermined number of clock cycles of the external clock, a latency counter which includes two counter circuits for sequentially shifting the command signal captured using the normal and reverse phase clock and being capable of switching a signal path in response to the number of clock cycles, and first and second control means which controls counting of the clock cycles equivalent to the even or odd number latency by forming an appropriate signal path.
摘要:
A synchronous semiconductor memory device of the present invention has a clock generator for generating a normal and a reverse phase clocks by dividing an external clock, a command decoder for decoding an external command and outputting a command signal; latency setting means capable of selectively setting an even or odd number latency within a range of a predetermined number of clock cycles of the external clock, a latency counter which includes two counter circuits for sequentially shifting the command signal captured using the normal and reverse phase clock and being capable of switching a signal path in response to the number of clock cycles, and first and second control means which controls counting of the clock cycles equivalent to the even or odd number latency by forming an appropriate signal path.
摘要:
A semiconductor device includes a first signal wiring, a first dummy wiring, and a second dummy wiring. The first signal wiring is configured to be supplied with a first signal potential. The first dummy wiring is insulated from the first wiring. The first dummy wiring is configured to be supplied with a fixed potential. The second dummy wiring is disposed between the first signal wiring and the first dummy wiring. The second dummy wiring is insulated from the first dummy wiring. The second dummy wiring is configured to be supplied with substantially the same potential as the first signal potential.
摘要:
In a semiconductor device, there are provided first to third pairs of nMOS transistors between a GND and two sense nodes and first to third pairs of pMOS transistors between the two sense nodes and the power supply. A first internal clock signal and its inverted signal are supplied to gates of the first pair of nMOS transistors and the second pair of nMOS transistors, respectively. Complementary external clock signals are supplied to the gates of the third pairs of nMOS transistors and the third pairs of pMOS transistors. An inverted version of a second internal clock signal and the second internal clock signal are supplied to gates of the first and second pairs of pMOS transistors. The two sense nodes are connected to inputs of a differential amplifier. The output of the differential amplifier is latched by a latch circuit. Also provided an equalizing circuit precharging/equalizing the two sense nodes (FIG. 2).