Methods of Protecting Elevated Polysilicon Structures During Etching Processes
    1.
    发明申请
    Methods of Protecting Elevated Polysilicon Structures During Etching Processes 有权
    在蚀刻过程中保护高架多晶硅结构的方法

    公开(公告)号:US20130149851A1

    公开(公告)日:2013-06-13

    申请号:US13314270

    申请日:2011-12-08

    IPC分类号: H01L21/28

    CPC分类号: H01L27/11534 H01L21/28273

    摘要: Disclosed herein are various methods of protecting elevated polysilicon structures during etching processes. In one example, the method includes forming a layer stack above a semiconducting substrate for a memory device, forming a protective mask layer above the layer stack of the memory device and performing at least one etching process to define a gate electrode for a transistor while the protective mask is in position above the layer stack for the memory device.

    摘要翻译: 本文公开了在蚀刻工艺期间保护升高的多晶硅结构的各种方法。 在一个示例中,该方法包括在用于存储器件的半导体衬底之上形成层堆叠,在存储器件的层堆叠之上形成保护掩模层,并执行至少一个蚀刻工艺以限定晶体管的栅电极,而 保护罩位于存储器件的层堆叠之上。

    Methods of protecting elevated polysilicon structures during etching processes
    2.
    发明授权
    Methods of protecting elevated polysilicon structures during etching processes 有权
    在蚀刻过程中保护高架多晶硅结构的方法

    公开(公告)号:US08569173B2

    公开(公告)日:2013-10-29

    申请号:US13314270

    申请日:2011-12-08

    IPC分类号: H01L21/302

    CPC分类号: H01L27/11534 H01L21/28273

    摘要: Disclosed herein are various methods of protecting elevated polysilicon structures during etching processes. In one example, the method includes forming a layer stack above a semiconducting substrate for a memory device, forming a protective mask layer above the layer stack of the memory device and performing at least one etching process to define a gate electrode for a transistor while the protective mask is in position above the layer stack for the memory device.

    摘要翻译: 本文公开了在蚀刻工艺期间保护升高的多晶硅结构的各种方法。 在一个示例中,该方法包括在用于存储器件的半导体衬底之上形成层堆叠,在存储器件的层堆叠之上形成保护掩模层,并执行至少一个蚀刻工艺以限定晶体管的栅电极,而 保护罩位于存储器件的层堆叠之上。

    STI CMP under polish monitoring
    4.
    发明授权
    STI CMP under polish monitoring 有权
    STI CMP在抛光监测下

    公开(公告)号:US08852968B2

    公开(公告)日:2014-10-07

    申请号:US13768870

    申请日:2013-02-15

    IPC分类号: H01L21/66

    CPC分类号: H01L22/12 G01B2210/56

    摘要: Methods of deducing oxide thickness using calculated and measured scattering spectra are provided. Embodiments include depositing an oxide over a semiconductor wafer, reducing the oxide from a portion of the semiconductor wafer, and deducing a thickness of oxide remaining at a location within the portion using scatterometric metrology. Embodiments further include deducing the thickness by: calculating scattering spectra for a plurality of oxide thicknesses, producing calculated scattering spectra, monitoring scattering spectra at the location within the portion of the semiconductor wafer, comparing the monitored scattering spectra at the location to the calculated scattering spectra, determining a closest matching calculated scattering spectra to the monitored scattering spectra at the location, and obtaining an oxide thickness corresponding to the closest matching calculated scattering spectra.

    摘要翻译: 提供了使用计算和测量的散射光谱推导氧化物厚度的方法。 实施例包括在半导体晶片上沉积氧化物,从半导体晶片的一部分还原氧化物,并使用散射测量法推算残留在该部分内部的氧化物的厚度。 实施例还包括通过以下方式推导厚度:计算多个氧化物厚度的散射光谱,产生计算的散射光谱,监测半导体晶片部分内的位置处的散射光谱,将该位置处的所监视的散射光谱与计算出的散射光谱进行比较 确定与所述位置处的所监视的散射光谱最接近的匹配计算的散射光谱,以及获得对应于最接近的匹配计算的散射光谱的氧化物厚度。

    Computer tomography imaging device and method
    5.
    发明授权
    Computer tomography imaging device and method 有权
    计算机断层扫描成像装置及方法

    公开(公告)号:US09380984B2

    公开(公告)日:2016-07-05

    申请号:US13322696

    申请日:2009-12-30

    摘要: The present invention discloses a method for performing CT imaging on a region of interest of an object under examination, comprising: acquiring the CT projection data of the region of interest; acquiring the CT projection data of region B; selecting a group of PI line segments covering the region of interest, and calculating the reconstruction image value for each PI line segment in the group; and combining the reconstruction image values in all the PI line segments to obtain the image of the region of interest. The present invention further discloses a CT imaging device using this method and a data processor therein. Since the 2D/3D slice image of the region of interest can be exactly reconstructed and obtained as long as the X-ray beam covers the region of interest and the region B, it is possible to use a small-sized detector to perform CT imaging on the region of interest at any position of a large-sized object, which reduces to a great extent the radiation dose of the X-ray during the CT scanning.

    摘要翻译: 本发明公开了一种对被检查物体的感兴趣区域进行CT成像的方法,包括:获取感兴趣区域的CT投影数据; 获取区域B的CT投影数据; 选择覆盖感兴趣区域的一组PI线段,并计算组中每个PI线段的重建图像值; 并且将所有PI线段中的重建图像值组合以获得感兴趣区域的图像。 本发明还公开了一种使用该方法的CT成像装置及其中的数据处理器。 由于只要X射线束覆盖感兴趣区域和区域B,就可以精确地重构和获得感兴趣区域的2D / 3D切片图像,因此可以使用小尺寸检测器来执行CT成像 在大尺寸物体的任何位置处的感兴趣区域,其在CT扫描期间在很大程度上降低X射线的辐射剂量。

    Methods and computing devices for password verification
    6.
    发明授权
    Methods and computing devices for password verification 有权
    用于密码验证的方法和计算设备

    公开(公告)号:US09075987B2

    公开(公告)日:2015-07-07

    申请号:US13872187

    申请日:2013-04-29

    申请人: Liang Li

    发明人: Liang Li

    IPC分类号: G06F21/46 G06F21/31

    CPC分类号: G06F21/46 G06F21/31

    摘要: A method for password verification comprises a first verification step for verifying a password that is input at least one time with a first preset password; and a second verification step for verifying the password that is input in another round with a second preset password when the password input in the first verification step is determined to be incorrect. The number of digits of the second preset password is larger than that of the first preset password.

    摘要翻译: 一种用于密码验证的方法包括用于验证至少一次用第一预设密码输入的密码的第一验证步骤; 以及第二验证步骤,用于当确定在第一验证步骤中输入的密码不正确时,用第二预设密码验证在另一轮中输入的密码。 第二预设密码的位数大于第一预置密码的位数。

    Method for producing fucoxanthin
    8.
    发明授权
    Method for producing fucoxanthin 有权
    生产岩藻黄质的方法

    公开(公告)号:US08871217B2

    公开(公告)日:2014-10-28

    申请号:US12619474

    申请日:2009-11-16

    申请人: Yanmei Li Liang Li

    发明人: Yanmei Li Liang Li

    摘要: The present invention provides a method for producing fucoxanthin extract, said method comprising: performing absorption of the fucoxanthin extract by using absorbent and then performing elution to remove heavy metals and arsenic salt contained in the fucoxanthin extract, wherein the absorbent is selected from a group having macroporous resin, polyamide, activated carbon, alumina and a combination thereof. The method for producing fucoxanthin extract according to the present invention, the content of heave metal in the fucoxanthin extract can be reduced, while the content of fucoxanthin in the fucoxanthin extract can increase. In addition, the present invention also provides a fucoxanthin extract obtained by the above method, as well as fucoxanthin products containing the fucoxanthin extract.

    摘要翻译: 本发明提供了一种生产岩藻黄素提取物的方法,所述方法包括:通过使用吸收剂进行岩藻黄素提取物的吸收,然后进行洗脱以除去岩藻黄素提取物中所含的重金属和砷盐,其中吸收剂选自具有 大孔树脂,聚酰胺,活性炭,氧化铝及其组合。 根据本发明的岩藻黄素提取物的制造方法,可以降低岩藻黄质提取物中的沉淀金属的含量,而岩藻黄质提取物中的岩藻黄质的含量可以增加。 此外,本发明还提供通过上述方法获得的岩藻黄素提取物以及含有岩藻黄质提取物的岩藻黄素产物。

    METHOD AND DEVICE FOR TRAINING, METHOD AND DEVICE FOR ESTIMATING POSTURE VISUAL ANGLE OF OBJECT IN IMAGE
    10.
    发明申请
    METHOD AND DEVICE FOR TRAINING, METHOD AND DEVICE FOR ESTIMATING POSTURE VISUAL ANGLE OF OBJECT IN IMAGE 审中-公开
    用于训练,方法和设备的方法和装置,用于估计图像中对象的姿势视角

    公开(公告)号:US20120045117A1

    公开(公告)日:2012-02-23

    申请号:US13266057

    申请日:2010-04-23

    申请人: Liang Li Weiguo Wu

    发明人: Liang Li Weiguo Wu

    IPC分类号: G06K9/00

    CPC分类号: G06T7/77

    摘要: Method and device for estimating the posture orientation of the object in image are described. An image feature of the image is obtained. For each orientation class, 3-D object posture information corresponding to the image feature is obtained based on a mapping model corresponding to the orientation class, for mapping the image feature to the 3-D object posture information. A joint probability of a joint feature including the image feature and the corresponding 3-D object posture information for each orientation class is calculated according to a joint probability distribution model based on single probability distribution models for the orientation classes. A conditional probability of the image feature in condition of the corresponding 3-D object posture information is calculated based on the joint probability for each orientation class. The orientation class corresponding to the maximum of the conditional probabilities is estimated as the posture orientation of the object in the image.

    摘要翻译: 描述用于估计图像中的物体的姿势取向的方法和装置。 获得图像的图像特征。 对于每个取向类,基于与取向类对应的映射模型,获得与图像特征相对应的3-D对象姿势信息,用于将图像特征映射到3D对象姿势信息。 根据基于用于取向类的单一概率分布模型的联合概率分布模型来计算包括用于每个方向类的图像特征和相应的3-D对象姿势信息的联合特征的联合概率。 基于每个定向类的联合概率来计算相应3-D对象姿势信息的条件下的图像特征的条件概率。 对应于条件概率的最大值的取向类别被估计为图像中对象的姿势取向。