Lithographic apparatus, device manufacturing method and a substrate
    2.
    发明申请
    Lithographic apparatus, device manufacturing method and a substrate 失效
    光刻设备,器件制造方法和衬底

    公开(公告)号:US20070103655A1

    公开(公告)日:2007-05-10

    申请号:US11642912

    申请日:2006-12-21

    IPC分类号: G03B27/32

    CPC分类号: G03F7/70958 G03F7/70341

    摘要: A substrate is provided with a coating of material which is substantially transparent to the wavelength of the projection beam. The coating may be thicker than the wavelength of the projection beam and have a refractive index of the coating such that the wavelength of the projection beam is shortened as it passes through it. This allows the imaging of smaller features on the substrate. Alternatively, the coating may be used with a liquid supply system and act to keep bubbles away from a radiation sensitive layer of the substrate.

    摘要翻译: 基板设置有对投影光束的波长基本透明的材料涂层。 涂层可以比投影光束的波长厚,并且具有涂层的折射率,使得投影光束的波长在其通过时被缩短。 这允许在衬底上成像较小的特征。 或者,涂层可以与液体供应系统一起使用,并且用于保持气泡远离基底的辐射敏感层。

    Lithographic apparatus, device manufacturing method and a substrate
    3.
    发明申请
    Lithographic apparatus, device manufacturing method and a substrate 失效
    光刻设备,器件制造方法和衬底

    公开(公告)号:US20050042554A1

    公开(公告)日:2005-02-24

    申请号:US10898674

    申请日:2004-07-26

    IPC分类号: G03C1/52 G03F7/20

    CPC分类号: G03F7/70958 G03F7/70341

    摘要: A substrate is provided with a coating of material which is substantially transparent to the wavelength of the projection beam. The coating may be thicker than the wavelength of the projection beam and have a refractive index of the coating such that the wavelength of the projection beam is shortened as it passes through it. This allows the imaging of smaller features on the substrate. Alternatively, the coating may be used with a liquid supply system and act to keep bubbles away from a radiation sensitive layer of the substrate.

    摘要翻译: 基板设置有对投影光束的波长基本透明的材料涂层。 涂层可以比投影光束的波长厚,并且具有涂层的折射率,使得投影光束的波长在其通过时被缩短。 这允许在衬底上成像较小的特征。 或者,涂层可以与液体供应系统一起使用,并且用于保持气泡远离基底的辐射敏感层。