摘要:
In order to provide a built-in self testing function, a one-chip microcomputer is equipped with an activation register for activating the test operation and a built-in self test activation pattern generator for setting initial values at test control circuits (pseudo random number generator, logical circuit testing compressor, pattern generator, and memory testing compressor). In accordance with an instruction from the CPU, a built-in self test is activated so that the results of tests of the memory and the group of logical circuits are read from the memory testing compressor and the logical circuit testing compressor, and respectively compared with expected values preliminarily stored in the memory in the one-chip microcomputer; thus, the results are diagnosed. Thus, it is possible to carry out a built-in self test without using a plurality of exclusively-used test terminals.
摘要:
A 1-chip microcomputer having a built-in nonvolatile memory includes at least one erasable flash memory provided in a memory space of the microcomputer, a boot ROM for storing an initial program to start up the 1-chip microcomputer and a transfer program to transfer the initial program to the flash memory, and control means for, when the flash memory stores no program, transferring the initial program to the flash memory in accordance with the transfer program and subsequently removing the boot ROM from the memory space. Consequently, even if a new program is additionally stored to the nonvolatile memory in the 1-chip microcomputer, the additional program can be carried out.
摘要:
When a built-in nonvolatile memory in a microcomputer is tested, a control program prestored in a boot ROM is run upon entering a test command from an external communication device; a test program is transferred from the external communication device to a built-in RAM through a communication circuit; a control of a CPU is switched to the built-in RAM after the test program has been transferred and a test is conducted on the nonvolatile memory; and a test result and a fail log are transferred to the external communication device through the communication circuit. Consequently, the built-in nonvolatile memory in the microcomputer can be checked without leaving the test program on the chip.
摘要:
A semiconductor chip has a nonvolatile memory formed on the upper surface side of a semiconductor substrate. The chip includes at least one recess portion formed in the lower surface of the semiconductor substrate. The recess portion is located in a region corresponding to the nonvolatile memory. A method of manufacturing the semiconductor chip is also disclosed.
摘要:
An apparatus for positioning the backrest of a vehicle seat to facilitate an occupant's entry and exit from the vehicle. The apparatus includes a seat frame mounted on the floor of a vehicle and a backrest frame pivotally connected to the seat frame. A pawl member releasably engages the seat frame from teeth on the backrest frame and is controlled by an operating lever to adjust the pivotable position of the backrest. A support member slidably positions the seat frame along the vehicle and includes a pair of spaced lower rails and a pair of complimentary upper rails slidably mounted on the lower rails. A locking device mounted on the upper rail prevents sliding movement between the upper and lower rails. A cable means extending between the backrest and the locking device releases the locking device to enable sliding movement between the upper and lower rails when the backrest is pivoted beyond a predetermined position. The backrest, which is biased toward the front of the vehicle, cannot be pivoted back to its original position until a positioning lever engages a cam surface mounted on the lower rail to disengage a restricting arm engaged within a groove on the backrest.