公开(公告)号：US12070817B2

公开(公告)日：2024-08-27

申请号：US18070151

申请日：2022-11-28

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B23K26/342 ,  B23K26/03 ,  B23K26/06 ,  B23K26/0622 ,  B23K26/073 ,  B23K26/082 ,  B23K26/70 ,  B29C64/30 ,  B29C64/393 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K31/12 ,  G01N21/84 ,  G01N21/94 ,  G01N21/95

CPC classification number: B23K26/342 ,  B23K26/032 ,  B23K26/0622 ,  B23K26/0626 ,  B23K26/073 ,  B23K26/0821 ,  B23K26/70 ,  B29C64/30 ,  B29C64/393 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/702 ,  B23K31/125 ,  G01N21/8422 ,  G01N21/94 ,  G01N21/95

Abstract: Systems, devices, and methods for additive manufacturing are provided that allow for components being manufactured to be assessed during the printing process. As a result, changes to a print plan can be considered, made, and implemented during the printing process. More particularly, in exemplary embodiments, a spectrometer is operated while a component is being printed to measure one or more parameters associated with one or more layers of the component being printed. The measured parameter(s) are then relied upon to determine if any changes are needed to the way printing is occurring, and if such changes are desirable, the system is able to implement such changes during the printing process. By way of non-limiting examples, printed material in one or more layers may be reheated to alter the printed component, such as to remove defects identified by the spectrometer data. A variety of systems, devices, and methods for performing real-time sensing and control of an additive manufacturing process are also provided.

公开(公告)号：US10525632B2

公开(公告)日：2020-01-07

申请号：US15636502

申请日：2017-06-28

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B29C64/40 ,  B33Y40/00 ,  B22F5/00 ,  B22F3/24 ,  B22F3/105 ,  B33Y80/00 ,  G05B19/4099 ,  B33Y50/02 ,  B29C64/386 ,  B29C64/393

Abstract: Methods, systems, and devices for precision locating additively manufactured components for assembly and/or post processing manufacturing are provided for herein. In some embodiments, at least one component can be additively manufactured to include one or more kinematic features on one or more surfaces of the component. The kinematic feature(s) can be configured to engage complementary kinematic feature(s) formed in a second component so the two components can form an assembly. Alternatively, the kinematic feature(s) can be configured to engage complementary kinematic feature(s) associated with a post-processing machine such that the one or more post-processing actions can be performed on the component after the component is precisely located with respect to the machine by way of the kinematic features of the component and associated with the machine. A variety of systems and methods that utilize kinematic features are also provided.

公开(公告)号：US20230182235A1

公开(公告)日：2023-06-15

申请号：US18070151

申请日：2022-11-28

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B23K26/342 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/03 ,  B23K26/06 ,  B23K26/073 ,  B23K26/082 ,  B23K26/70 ,  B23K26/0622 ,  B29C64/30 ,  B29C64/393

CPC classification number: B23K26/342 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/032 ,  B23K26/0626 ,  B23K26/073 ,  B23K26/0821 ,  B23K26/70 ,  B23K26/0622 ,  B29C64/30 ,  B29C64/393 ,  G01N21/95

Abstract: Systems, devices, and methods for additive manufacturing are provided that allow for components being manufactured to be assessed during the printing process. As a result, changes to a print plan can be considered, made, and implemented during the printing process. More particularly, in exemplary embodiments, a spectrometer is operated while a component is being printed to measure one or more parameters associated with one or more layers of the component being printed. The measured parameter(s) are then relied upon to determine if any changes are needed to the way printing is occurring, and if such changes are desirable, the system is able to implement such changes during the printing process. By way of non-limiting examples, printed material in one or more layers may be reheated to alter the printed component, such as to remove defects identified by the spectrometer data. A variety of systems, devices, and methods for performing real-time sensing and control of an additive manufacturing process are also provided.

公开(公告)号：US20200016820A1

公开(公告)日：2020-01-16

申请号：US16513700

申请日：2019-07-16

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B29C64/10 ,  B29C64/245 ,  B29C64/277 ,  B29C64/227 ,  B29C64/393 ,  B29C64/286

Abstract: Systems, devices, and methods for additive manufacturing as disclosed allow for improved optical access to a build platform. In at least some embodiments a multiplexing optic of an additive manufacturing device is configured to multiplex an arbitrary number of optical paths to a build platform along a substantially common optical axis by dividing a theoretical input aperture of the multiplexing optic into a plurality of sub-apertures. Each sub-aperture can independently receive and direct an optical path to the build platform. An optical path can be a light path from a light source or an optical process monitoring path from an optical process monitoring system or optical process monitoring device. In some embodiments, an optical path can enter the multiplexing optic off-axis and/or off-angle with respect to an optical axis of the multiplexing optic. The multiplexing optic can include one or more lens elements and/or one or more mirror elements.

公开(公告)号：US20200016657A1

公开(公告)日：2020-01-16

申请号：US16513702

申请日：2019-07-16

Applicant: Massachusetts Institute of Technology

Inventor： Anastasios John Hart ,  Ryan Wade Penny ,  Martin C. Feldmann ,  Jonathan S. Gibbs ,  Stuart P. Baker

IPC: B22F3/105

Abstract: Disclosed are systems, devices, and methods for additive manufacturing that allow for control of composition and/or porosity of components being manufactured. More particularly, in exemplary embodiments, a secondary material can be used in conjunction with a primary feedstock material in a spatially controlled manner during an additive manufacturing process to control a composition of materials and/or porosity of a manufactured component. Systems, devices, and methods for additive manufacturing are also disclosed that allow for control of a pressure of an atmosphere surrounding a build surface during an additive manufacturing process. More particularly, a pressure of an atmosphere surrounding a build surface can be raised to a pressure greater than standard atmospheric pressure. Various features of the exemplary embodiments of the systems, devices, and methods disclosed can be used together to further control for composition and/or porosity and quality of a manufactured part.

公开(公告)号：US11511373B2

公开(公告)日：2022-11-29

申请号：US16114188

申请日：2018-08-27

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B23K26/342 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/70 ,  G01N21/95 ,  B23K31/12 ,  B23K26/03 ,  B23K26/06 ,  B23K26/073 ,  B23K26/082 ,  B23K26/0622 ,  B29C64/30 ,  B29C64/393 ,  G01N21/84 ,  G01N21/94

Abstract: Systems, devices, and methods for additive manufacturing are provided that allow for components being manufactured to be assessed during the printing process. As a result, changes to a print plan can be considered, made, and implemented during the printing process. More particularly, in exemplary embodiments, a spectrometer is operated while a component is being printed to measure one or more parameters associated with one or more layers of the component being printed. The measured parameter(s) are then relied upon to determine if any changes are needed to the way printing is occurring, and if such changes are desirable, the system is able to implement such changes during the printing process. By way of non-limiting examples, printed material in one or more layers may be reheated to alter the printed component, such as to remove defects identified by the spectrometer data. A variety of systems, devices, and methods for performing real-time sensing and control of an additive manufacturing process are also provided.

公开(公告)号：US20190118300A1

公开(公告)日：2019-04-25

申请号：US16114188

申请日：2018-08-27

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B23K26/342 ,  G01N21/95 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/03 ,  B23K26/0622 ,  B23K26/06 ,  B23K26/073 ,  B23K26/082 ,  B23K26/70

Abstract: Systems, devices, and methods for additive manufacturing are provided that allow for components being manufactured to be assessed during the printing process. As a result, changes to a print plan can be considered, made, and implemented during the printing process. More particularly, in exemplary embodiments, a spectrometer is operated while a component is being printed to measure one or more parameters associated with one or more layers of the component being printed. The measured parameter(s) are then relied upon to determine if any changes are needed to the way printing is occurring, and if such changes are desirable, the system is able to implement such changes during the printing process. By way of non-limiting examples, printed material in one or more layers may be reheated to alter the printed component, such as to remove defects identified by the spectrometer data. A variety of systems, devices, and methods for performing real-time sensing and control of an additive manufacturing process are also provided.

公开(公告)号：US11577317B2

公开(公告)日：2023-02-14

申请号：US16513702

申请日：2019-07-16

Applicant: Massachusetts Institute of Technology

Inventor： Anastasios John Hart ,  Ryan Wade Penny ,  Martin C. Feldmann ,  Jonathan S. Gibbs ,  Stuart P. Baker

IPC: B22F10/20 ,  B22F10/30

Abstract: Disclosed are systems, devices, and methods for additive manufacturing that allow for control of composition and/or porosity of components being manufactured. More particularly, in exemplary embodiments, a secondary material can be used in conjunction with a primary feedstock material in a spatially controlled manner during an additive manufacturing process to control a composition of materials and/or porosity of a manufactured component. Systems, devices, and methods for additive manufacturing are also disclosed that allow for control of a pressure of an atmosphere surrounding a build surface during an additive manufacturing process. More particularly, a pressure of an atmosphere surrounding a build surface can be raised to a pressure greater than standard atmospheric pressure. Various features of the exemplary embodiments of the systems, devices, and methods disclosed can be used together to further control for composition and/or porosity and quality of a manufactured part.

公开(公告)号：US11325299B2

公开(公告)日：2022-05-10

申请号：US16513700

申请日：2019-07-16

Applicant: Massachusetts Institute of Technology

Inventor： Ryan Wade Penny ,  Anastasios John Hart

IPC: B29C64/10 ,  B29C64/264 ,  H04J14/00 ,  B29C64/245 ,  B29C64/277 ,  B29C64/227 ,  B29C64/286 ,  B29C64/393 ,  B29C64/188 ,  B29C64/141 ,  B33Y50/02 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y40/00

Abstract: Systems, devices, and methods for additive manufacturing as disclosed allow for improved optical access to a build platform. In at least some embodiments a multiplexing optic of an additive manufacturing device is configured to multiplex an arbitrary number of optical paths to a build platform along a substantially common optical axis by dividing a theoretical input aperture of the multiplexing optic into a plurality of sub-apertures. Each sub-aperture can independently receive and direct an optical path to the build platform. An optical path can be a light path from a light source or an optical process monitoring path from an optical process monitoring system or optical process monitoring device. In some embodiments, an optical path can enter the multiplexing optic off-axis and/or off-angle with respect to an optical axis of the multiplexing optic. The multiplexing optic can include one or more lens elements and/or one or more mirror elements.