摘要:
A source driver includes a gamma voltage generator and a digital to analog converter. The gamma voltage generator generates a plurality of gamma voltages, in which the gamma voltage generator includes a gamma resistor string, a second resistor, a plurality of first switches and a second switch. The first resistors are electrically connected serially for dividing a first gamma reference voltage and a second gamma reference voltage, in which the first resistors have first ends and second ends for providing gamma voltages. The second resistor has a first end electrically connected to the gamma resistor string and a second end receiving a third gamma reference voltage. The first switches are uniformly conducted to the first ends or the second ends of the first resistors according to a timing control signal for passing the gamma voltages.
摘要:
A source driver includes a gamma voltage generator, in which the gamma voltage generator includes a first gamma resistor string and a second gamma resistor string. The first gamma resistor string receives a first gamma reference voltage and generates a plurality of first gamma voltages. The second gamma resistor string receives a second gamma reference voltage and generates a plurality of second gamma voltages, in which the second gamma voltages have different voltage values from the first gamma voltages. The switch circuit selects the first gamma voltages or the second gamma voltages as output gamma voltages according to a timing control signal. The digital to analog converter selects one of the output gamma voltages as a driving voltage corresponding to a received digital pixel data for driving a first pixel region or a second pixel region of the sub-pixel.
摘要:
A wafer and a test method thereof are provided. The invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
An integrated circuit includes a current mirror circuit for providing a current at an output end, a power-down switch coupled to the output end of the current mirror circuit for controlling access of the current generated by the current mirror circuit based on signals received at a control end of the power-down switch, and a compensating unit coupled to a bias end of the current mirror circuit and the power-down switch for stabilizing voltages at the bias end of the current mirror circuit.
摘要:
A wafer and a test method thereof are provided. The invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
A wafer, a test system thereof, a test method thereof and a test device thereof are provided. The present invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
A wafer, a test system thereof, a test method thereof and a test device thereof are provided. The present invention utilizes a first group of probes to perform a high voltage stress (HVS) test on a first chip, and utilizes a second group of probes to perform a function test on a second chip, where a period of the high voltage stress test overlaps a period of the function test, thereby greatly decreasing the test time of the wafer.
摘要:
An integrated circuit includes a current mirror circuit for providing a current at an output end, a power-down switch coupled to the output end of the current mirror circuit for controlling access of the current generated by the current mirror circuit based on signals received at a control end of the power-down switch, and a compensating unit coupled to a bias end of the current mirror circuit and the power-down switch for stabilizing voltages at the bias end of the current mirror circuit.
摘要:
A digital-to-analog converter outputting an output analog voltage according to an N-bit digital signal is provided. The digital-to-analog converter includes a first and a second resistor strings, a first and a second select units. The first resistor string is connected between a first and a second power supply voltages to generate a first group of reference voltages. The first select unit selects two reference voltages out of the first group according to M most significant bits of the N-bit digital signal. The second resistor string is connected between the selected reference voltages to generate a second group of reference voltages between the selected reference voltages. The second select unit selects one reference voltage out of the second group as the output analog voltage according to the N-M least significant bits of the N-bit digital signal.
摘要:
An output buffering circuit of a driver device for a display includes a first amplifier circuit having a first input stage, coupled between an upper power supply and a lower power supply, and a first output stage, coupled between the upper power supply and a first intermediate power supply that is greater than the lower power supply, and a second amplifier circuit having a second input stage coupled between the upper power supply and the lower power supply, and a second output stage coupled between a second intermediate power supply that is lower than the upper power supply and the lower power supply.