摘要:
The present invention provides a simple, easy to implement method and apparatus to reduce jitter in a channel and expand the eye width and eye height of the eye pattern of the signal. The method and apparatus of the present invention reduces jitter specific to a channel in a high speed interface. The present invention utilizes a phasing shifting mechanism based on history of the incoming bits at the receiver. The input bits from the channel are shifted in time before getting to the receiver. This approach significantly reduces Intersymbol Interference (ISI) and deterministic jitter, thus opening up the eye width and eye height for a given interface.
摘要:
The present invention provides a simple, easy to implement method and apparatus to reduce jitter in a channel and expand the eye width and eye height of the eye pattern of the signal. The method and apparatus of the present invention reduces jitter specific to a channel in a high speed interface. The present invention utilizes a phasing shifting mechanism based on history of the incoming bits at the receiver. The input bits from the channel are shifted in time before getting to the receiver. This approach significantly reduces Intersymbol Interference (ISI) and deterministic jitter, thus opening up the eye width and eye height for a given interface.
摘要:
Methods, apparatuses, and computer program products are disclosed for controlling plating stub reflections in a chip package. In one embodiment, a resonance optimizer determines performance characteristics of a bond wire that connects a chip to a substrate of a semiconductor chip mount. In this embodiment, the resonance optimizer selects, based on the performance characteristics of the bond wire, a line width for an open-ended plating stub that extends from a signal interconnect of the substrate to a periphery of the substrate, The resonance optimizer also generates a design of signal traces for the substrate, where the signal traces include the open-ended plating stub with the selected line width.
摘要:
A printed circuit board (‘PCB’) with reduced dielectric loss, including conductive traces disposed upon layers of dielectric material, the layers of dielectric material including core layers and prepreg layers, one or more of the layers of dielectric material including pockets of air that reduce an overall relative dielectric constant of the PCB.
摘要:
Methods, apparatuses, and computer program products are disclosed for controlling plating stub reflections in a chip package. Embodiments include determining, by a resonance optimizer, performance characteristics of a bond wire, the bond wire connecting a chip to a substrate of a semiconductor chip mount; based on the performance characteristics of the bond wire, selecting, by the resonance optimizer, a line width for an open-ended plating stub, the open-ended plating stub extending from a signal interconnect of the substrate to a periphery of the substrate; and generating, by the resonance optimizer, a design of signal traces for the substrate, the signal traces including the open-ended plating stub with the selected line width.
摘要:
One embodiment provides a method of locating a short circuit in a printed circuit board. Test signals may be injected at different test points on the circuit board. The distance between each test point and the short circuit may be determined according to how long it takes for a signal reflection at the short circuit to propagate back to each test point. The distances between the various test points and the short circuit can be used to narrow the possible locations of the short circuit or even to pinpoint the location of the short circuit.
摘要:
A printed circuit board (‘PCB’) with reduced dielectric loss, including conductive traces disposed upon layers of dielectric material, the layers of dielectric material including core layers and prepreg layers, one or more of the layers of dielectric material including pockets of air that reduce an overall relative dielectric constant of the PCB.
摘要:
In a particular embodiment, a method of manufacturing a printed circuit board (‘PCB’) with reduced dielectric loss includes fabricating conductive traces disposed upon layers of dielectric material; and fabricating the layers of dielectric material, including core layers and prepreg layers, with one or more of the layers of dielectric material including pockets of air that reduce an overall relative dielectric constant of the PCB. In the particular embodiment, the conductive traces are disposed upon layers of the dielectric material orthogonally with respect to one another and the pockets of air are aligned at an angle of 45 degrees with respect to the conductive traces.
摘要:
One embodiment provides a method of locating a short circuit in a printed circuit board. Test signals may be injected at different test points on the circuit board. The distance between each test point and the short circuit may be determined according to how long it takes for a signal reflection at the short circuit to propagate back to each test point. The distances between the various test points and the short circuit can be used to narrow the possible locations of the short circuit or even to pinpoint the location of the short circuit.
摘要:
Apparatus and methods for identifying a signal on a printed circuit board (‘PCB’) under test, including an integrated circuit mounted on the PCB, the integrated circuit having a test signal generator that transmits a test signal to an output pin of the integrated circuit, with the output pin connected to a test point on the PCB; the integrated circuit also having signal identification logic that inserts into the test signal, an identifier of the signal; a test probe in contact with the test point; and a signal-identifying controller that receives the test signal and the identifier from the test probe and displays, in dependence upon the identifier, the identity of the signal.