摘要:
There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating sections that outputs a timing clock having a phase obtained by shifting a phase of the delayed reference clock by a designated phase shift amount, a timing comparator that acquires a data signal in accordance with the timing clock, a plurality of second variable delay circuits that delays the timing clock, a plurality of phase comparators that outputs a phase shift amount according to a phase difference between a clock signal and the timing clock, a first adjusting section that adjusts a delay amount of the first variable delay circuit so that the timing comparator acquires a data signal based on the timing clock, and a second adjusting section that adjusts a delay amount of the second variable delay circuit so that the timing comparator acquires the data signal based on the clock signal.
摘要:
There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating sections that outputs a timing clock having a phase obtained by shifting a phase of the delayed reference clock by a designated phase shift amount, a timing comparator that acquires a data signal in accordance with the timing clock, a plurality of second variable delay circuits that delays the timing clock, a plurality of phase comparators that outputs a phase shift amount according to a phase difference between a clock signal and the timing clock, a first adjusting section that adjusts a delay amount of the first variable delay circuit so that the timing comparator acquires a data signal based on the timing clock, and a second adjusting section that adjusts a delay amount of the second variable delay circuit so that the timing comparator acquires the data signal based on the clock signal.
摘要:
A multi-strobe circuit that latches a signal to be tested, an evaluation target, at each edge timing of a multi-strobe signal having a plurality of edges. An oscillator oscillates at a predetermined frequency in synchronization with a reference strobe signal. A latch circuit latches the signal to be tested at an edge timing of an output signal of the oscillator. A gate circuit is provided between a clock terminal of the latch circuit and the oscillator, and makes the output signal of the oscillator pass therethrough for a predetermined period. A clock transfer circuit loads the output signal of the latch circuit at an edge timing of the output signal of the oscillator and performs retiming on the output signal of the latch circuit by using a reference clock.
摘要:
There is provided an electric circuit that outputs a timing signal and a recovered clock. The electric circuit includes a delay circuit that delays a reference signal, a PLL section that delays an oscillation signal synchronized with the delayed reference signal by an offset delay amount to output the delayed oscillation signal when outputting the timing signal and changes a delay amount for the oscillation signal in a tracking range using the offset delay amount as a standard to output the oscillation signal in synchronization with a periodic signal when outputting the recovered clock, a delay amount separating section that separates a coarse component of an integral multiple of a period of the clock signal and a fine component less than the period of the clock signal from a system timing, and a delay setting section that sets a value obtained by subtracting an adjusted delay amount, which is an integral multiple of the period of the clock signal, from the coarse component as the delay amount of the delay circuit and sets a value obtained by adding the adjusted delay amount to the fine component as the offset delay amount if the tracking range in a negative direction is larger than the fine component.
摘要:
A multi-strobe circuit that latches a signal to be tested, an evaluation target, at each edge timing of a multi-strobe signal having a plurality of edges. An oscillator oscillates at a predetermined frequency in synchronization with a reference strobe signal. A latch circuit latches the signal to be tested at an edge timing of an output signal of the oscillator. A gate circuit is provided between a clock terminal of the latch circuit and the oscillator, and makes the output signal of the oscillator pass therethrough for a predetermined period. A clock transfer circuit loads the output signal of the latch circuit at an edge timing of the output signal of the oscillator and performs retiming on the output signal of the latch circuit by using a reference clock.
摘要:
The present invention provides a valve apparatus which is small and reasonably priced, and with which a fuel amount can be regulated by restricting the lift amount of a valve. A columnar portion 60 is formed in a body 16, the columnar portion 60 is inserted into a valve 44, 46 and a washer 62 formed with a protruding portion 72 which protrudes outward from a flange portion 64, and the check valve 44, 46 and washer 62 are attached or fixed to the pump body 16 by subjecting the tip end of the columnar portion 60 to thermal caulking or the like. The outer diameter of the protruding portion 72 is set to be relatively smaller than the outer diameter of the flange portion 64 such that when the check valve 44, 46 is sandwiched between the protruding portion 72 and pump body 16, the check valve 44, 46 contacts an outer peripheral edge 70 of the flange portion 64 when the check valve 44, 46 opens. As a result, the lift amount of the valve 44, 46 can be restricted, and the flow rate of the fuel passing through a passage 40, 42 can be maintained at a constant level.
摘要:
There is provided an electric circuit that outputs a timing signal and a recovered clock. The electric circuit includes a delay circuit that delays a reference signal, a PLL section that delays an oscillation signal synchronized with the delayed reference signal by an offset delay amount to output the delayed oscillation signal when outputting the timing signal and changes a delay amount for the oscillation signal in a tracking range using the offset delay amount as a standard to output the oscillation signal in synchronization with a periodic signal when outputting the recovered clock, a delay amount separating section that separates a coarse component of an integral multiple of a period of the clock signal and a fine component less than the period of the clock signal from a system timing, and a delay setting section that sets a value obtained by subtracting an adjusted delay amount, which is an integral multiple of the period of the clock signal, from the coarse component as the delay amount of the delay circuit and sets a value obtained by adding the adjusted delay amount to the fine component as the offset delay amount if the tracking range in a negative direction is larger than the fine component.
摘要:
A timing generation circuit can increase a maximum delay amount without changing the configuration of a timing memory. The timing generation circuit includes: a timing memory (TMM) 10 containing predetermined timing data; a plurality of down counters 20 for loading the timing data from the TMM and outputting a pulse signal at the timing indicated by the timing data; an address selection circuit 40 for specifying one or two TMM addresses by switching and outputting corresponding one or plural timing data; a load data switching circuit 50 for loading the plural timing data to the plural down counters cascaded and outputting one timing pulse signal; and a timing data selection circuit 60 for selecting one of the pulse signals. The plural timing data are generated by dividing the timing memory into a plurality of memory regions either in a column or row direction.
摘要:
There is provided a clock transferring apparatus for synchronizing a pattern signal synchronized with a reference clock with a variable clock based on an oscillation source different from that of the reference clock, having a rate clock generating section for generating a rate clock whose number of pulses within a predetermined period is almost equal with a number of pulses of the variable clock within the predetermined period by thinning out the pulses within the reference clock, a pattern generating section for generating the pattern signal corresponding to the pulses of the rate clock and a FIFO memory that stores data of the pattern signal corresponding to the pulses of the rate clock and outputs the stored data corresponding to the pulses of the variable clock.
摘要:
A test device includes: the first reference clock generation unit for generating the first reference clock; the first test rate generation unit for generating the first test rate clock based on the first reference clock; the first driver unit for supplying the first test pattern to an electronic device based on the first test rate clock; the second reference clock generation unit for generating the second reference clock; the first phase synchronization unit for synchronizing the phase of the second reference clock with the phase of the first test rate clock; the second test rate generation unit for generating the second test rate clock based on the second reference clock having the synchronized phase; and the second driver unit for supplying the second test pattern to the electronic device based on the second test rate clock.