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公开(公告)号:US08243520B2
公开(公告)日:2012-08-14
申请号:US12610781
申请日:2009-11-02
申请人: Nigel Chan , Wolf Allers , Michael Bollu , Dimitri Lebedev , Jan Otterstedt , Christian Peters
发明人: Nigel Chan , Wolf Allers , Michael Bollu , Dimitri Lebedev , Jan Otterstedt , Christian Peters
IPC分类号: G11C11/34
CPC分类号: G11C16/349 , G11C16/0483 , G11C16/06
摘要: A method of operating an integrated circuit includes applying at least one first programming pulse to a plurality of non-volatile memory cells to adjust a level of a storage parameter of each of the non-volatile memory cells, the at least one first programming pulse defined by a plurality of pulse parameters each having a fixed valued, and determining a fail count by measuring the number of non-volatile memory cells of the plurality of non-volatile memory cells having a storage parameter level exceeding a verify level. The method further includes determining a change in an programming behavior of the plurality of non-volatile memory cells based on the fail count, adjusting a value of at least one pulse parameter of at least one second programming pulse defined by the plurality of pulse parameters to a desired value based on the change in programming behavior, and applying the at least one second programming pulse to the plurality non-volatile memory cells.
摘要翻译: 操作集成电路的方法包括将至少一个第一编程脉冲施加到多个非易失性存储器单元以调整每个非易失性存储单元的存储参数的电平,所述至少一个第一编程脉冲被定义 通过多个具有固定值的脉冲参数,并且通过测量具有超过验证电平的存储参数电平的多个非易失性存储器单元的非易失性存储器单元的数量来确定故障计数。 该方法还包括基于故障计数确定多个非易失性存储器单元的编程行为的变化,将由多个脉冲参数定义的至少一个第二编程脉冲的至少一个脉冲参数的值调整为 基于编程行为的变化的期望值,以及将所述至少一个第二编程脉冲应用于所述多个非易失性存储器单元。
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公开(公告)号:US20110103150A1
公开(公告)日:2011-05-05
申请号:US12610781
申请日:2009-11-02
申请人: Nigel Chan , Wolf Allers , Michael Bollu , Dimitri Lebedev , Jan Otterstedt , Christian Peters
发明人: Nigel Chan , Wolf Allers , Michael Bollu , Dimitri Lebedev , Jan Otterstedt , Christian Peters
CPC分类号: G11C16/349 , G11C16/0483 , G11C16/06
摘要: A method of operating an integrated circuit includes applying at least one first programming pulse to a plurality of non-volatile memory cells to adjust a level of a storage parameter of each of the non-volatile memory cells, the at least one first programming pulse defined by a plurality of pulse parameters each having a fixed valued, and determining a fail count by measuring the number of non-volatile memory cells of the plurality of non-volatile memory cells having a storage parameter level exceeding a verify level. The method further includes determining a change in an programming behavior of the plurality of non-volatile memory cells based on the fail count, adjusting a value of at least one pulse parameter of at least one second programming pulse defined by the plurality of pulse parameters to a desired value based on the change in programming behavior, and applying the at least one second programming pulse to the plurality non-volatile memory cells.
摘要翻译: 操作集成电路的方法包括将至少一个第一编程脉冲施加到多个非易失性存储器单元以调整每个非易失性存储单元的存储参数的电平,所述至少一个第一编程脉冲被定义 通过多个具有固定值的脉冲参数,并且通过测量具有超过验证电平的存储参数电平的多个非易失性存储器单元的非易失性存储器单元的数量来确定故障计数。 该方法还包括基于故障计数确定多个非易失性存储器单元的编程行为的变化,将由多个脉冲参数定义的至少一个第二编程脉冲的至少一个脉冲参数的值调整为 基于编程行为的变化的期望值,以及将所述至少一个第二编程脉冲应用于所述多个非易失性存储器单元。
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公开(公告)号:US08125821B2
公开(公告)日:2012-02-28
申请号:US11756639
申请日:2007-06-01
申请人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C11/00
CPC分类号: G11C13/004 , G11C11/56 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0071 , G11C2013/0073 , G11C2013/0078 , G11C2213/15 , G11C2213/79
摘要: One or more embodiments are related to a method of operating a phase-change memory array, including: providing the phase-change memory array, the phase-change memory array including a phase-change memory element in series with an access device between a first address line and a power line; causing a first current through the memory element from the first address line to the power line; and causing a second current through the memory element from the power line to the first address line.
摘要翻译: 一个或多个实施例涉及一种操作相变存储器阵列的方法,包括:提供相变存储器阵列,所述相变存储器阵列包括与存取装置串联的相变存储器元件,位于第一 地址线和电力线; 引起从第一地址线到电力线的存储元件的第一电流; 并且引起从电力线到第一地址线的存储元件的第二电流。
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公开(公告)号:US07864565B2
公开(公告)日:2011-01-04
申请号:US11831448
申请日:2007-07-31
申请人: Thomas Nirschl , Jan Otterstedt , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Thomas Nirschl , Jan Otterstedt , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C11/00
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/0033 , G11C16/3431 , G11C16/349 , G11C29/12005 , G11C29/50 , G11C29/50016
摘要: A data retention monitor for a memory cell including a voltage source and a voltage comparator. The voltage source is adapted to provide a selectable voltage to the memory cell. The selectable voltage includes a read voltage and a test voltage, with the test voltage being greater than the read voltage. The voltage comparator is adapted to compare a voltage of the memory cell with a reference voltage after the provision of the selectable voltage to the memory cell. The memory cell retains data when the memory cell voltage generated at least in part by the test voltage is substantially equal to the reference voltage.
摘要翻译: 一种用于包括电压源和电压比较器的存储单元的数据保持监视器。 电压源适于向存储器单元提供可选择的电压。 可选择的电压包括读取电压和测试电压,测试电压大于读取电压。 电压比较器适于在将存储单元提供可选择的电压之后将存储单元的电压与参考电压进行比较。 当至少部分由测试电压产生的存储单元电压基本上等于参考电压时,存储单元保留数据。
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公开(公告)号:US20090034343A1
公开(公告)日:2009-02-05
申请号:US11831448
申请日:2007-07-31
申请人: Thomas Nirschl , Jan Otterstedt , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Thomas Nirschl , Jan Otterstedt , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C7/06
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/0033 , G11C16/3431 , G11C16/349 , G11C29/12005 , G11C29/50 , G11C29/50016
摘要: A data retention monitor for a memory cell including a voltage source and a voltage comparator. The voltage source is adapted to provide a selectable voltage to the memory cell. The selectable voltage includes a read voltage and a test voltage, with the test voltage being greater than the read voltage. The voltage comparator is adapted to compare a voltage of the memory cell with a reference voltage after the provision of the selectable voltage to the memory cell. The memory cell retains data when the memory cell voltage generated at least in part by the test voltage is substantially equal to the reference voltage.
摘要翻译: 一种用于包括电压源和电压比较器的存储单元的数据保持监视器。 电压源适于向存储器单元提供可选择的电压。 可选择的电压包括读取电压和测试电压,测试电压大于读取电压。 电压比较器适于在将存储单元提供可选择的电压之后将存储单元的电压与参考电压进行比较。 当至少部分由测试电压产生的存储单元电压基本上等于参考电压时,存储单元保留数据。
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公开(公告)号:US20080298121A1
公开(公告)日:2008-12-04
申请号:US11756639
申请日:2007-06-01
申请人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C11/00
CPC分类号: G11C13/004 , G11C11/56 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0071 , G11C2013/0073 , G11C2013/0078 , G11C2213/15 , G11C2213/79
摘要: A method of operating a phase-change memory array. The method may comprise causing a first current to flow through a phase-change memory element in a first direction and causing a second current to flow through the memory element in a second direction.
摘要翻译: 一种操作相变存储器阵列的方法。 该方法可以包括使第一电流在第一方向上流过相变存储元件,并使第二电流沿第二方向流过存储元件。
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公开(公告)号:US08670270B2
公开(公告)日:2014-03-11
申请号:US13402895
申请日:2012-02-23
申请人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C11/00
CPC分类号: G11C13/004 , G11C11/56 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0071 , G11C2013/0073 , G11C2013/0078 , G11C2213/15 , G11C2213/79
摘要: One or more embodiments may be related to a method of operating a phase-change memory element, comprising: providing the phase-change memory element, the phase-change memory element having a first terminal and a second terminal; causing a first current through the memory element from the first terminal to the second terminal; and causing a second current through the memory element from the second terminal to the first terminal, wherein the causing the first current programs the memory element from a first resistance state to a second resistance state and the causing the second current programs the memory element from the first resistance state to the second resistance state.
摘要翻译: 一个或多个实施例可以涉及一种操作相变存储器元件的方法,包括:提供所述相变存储元件,所述相变存储元件具有第一端子和第二端子; 引起从第一端子到第二端子的存储元件的第一电流; 并且引起从第二端到第一端的存储元件的第二电流,其中使第一电流将存储器元件从第一电阻状态编程到第二电阻状态,并且使得第二电流从存储元件 第一电阻状态到第二电阻状态。
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公开(公告)号:US20130058159A1
公开(公告)日:2013-03-07
申请号:US13402895
申请日:2012-02-23
申请人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
发明人: Jan Otterstedt , Thomas Nirschl , Christian Peters , Michael Bollu , Wolf Allers , Michael Sommer
IPC分类号: G11C11/00
CPC分类号: G11C13/004 , G11C11/56 , G11C11/5678 , G11C13/0004 , G11C13/0069 , G11C2013/0071 , G11C2013/0073 , G11C2013/0078 , G11C2213/15 , G11C2213/79
摘要: One or more embodiments may be related to a method of operating a phase-change memory element, comprising: providing the phase-change memory element, the phase-change memory element having a first terminal and a second terminal; causing a first current through the memory element from the first terminal to the second terminal; and causing a second current through the memory element from the second terminal to the first terminal, wherein the causing the first current programs the memory element from a first resistance state to a second resistance state and the causing the second current programs the memory element from the first resistance state to the second resistance state.
摘要翻译: 一个或多个实施例可以涉及一种操作相变存储器元件的方法,包括:提供所述相变存储元件,所述相变存储元件具有第一端子和第二端子; 引起从第一端子到第二端子的存储元件的第一电流; 并且引起从第二端到第一端的存储元件的第二电流,其中使第一电流将存储器元件从第一电阻状态编程到第二电阻状态,并且使得第二电流从存储元件 第一电阻状态到第二电阻状态。
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公开(公告)号:US08344429B2
公开(公告)日:2013-01-01
申请号:US12212097
申请日:2008-09-17
申请人: Jan Otterstedt , Thomas Nirschl , Michael Bollu , Wolf Allers
发明人: Jan Otterstedt , Thomas Nirschl , Michael Bollu , Wolf Allers
IPC分类号: H01L23/52
CPC分类号: H01L23/52 , G11C5/063 , G11C8/14 , H01L27/0207 , H01L27/105 , H01L27/11519 , H01L27/11565 , H01L27/11587 , H01L27/11803 , H01L2924/0002 , H01L2924/00
摘要: Embodiments of the invention describe compact memory arrays. In one embodiment, the memory cell array includes first, second, and third gate lines disposed over a substrate, the second gate lines are disposed between the first and the third gate lines. The first, the second, and the third gate lines form adjacent gate lines of the memory cell array. The memory cell array further includes first metal lines disposed over the first gate lines, the first metal lines coupled to the first gate lines; second metal lines disposed over the second gate lines, the second metal lines coupled to the second gate lines; and third metal lines disposed over the third gate lines, the third metal lines coupled to the third gate lines. The first metal lines, the second metal lines and the third metal lines are disposed in different metallization levels.
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公开(公告)号:US08130558B2
公开(公告)日:2012-03-06
申请号:US12367249
申请日:2009-02-06
申请人: Thomas Nirschl , Jan Otterstedt , Michael Bollu , Wolf Allers
发明人: Thomas Nirschl , Jan Otterstedt , Michael Bollu , Wolf Allers
IPC分类号: G11C7/00
摘要: In one embodiment, a bit-line interface is disclosed. The bit-line interface has a multiplexer having a plurality of bit-line outputs, and a write path coupled to a multiplexer signal input. The bit-line interface also has a read path coupled to the multiplexer signal input, wherein the read path and the write path share at least one component.
摘要翻译: 在一个实施例中,公开了位线接口。 位线接口具有多路复用器,其具有多个位线输出,以及耦合到多路复用器信号输入的写入路径。 位线接口还具有耦合到多路复用器信号输入的读取路径,其中读取路径和写入路径共享至少一个组件。
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