PHOTOMASK BLANK, PHOTOMASK, AND METHOD OF MANUFACTURE
    2.
    发明申请
    PHOTOMASK BLANK, PHOTOMASK, AND METHOD OF MANUFACTURE 有权
    PHOTOMASK BLANK,PHOTOMASK和制造方法

    公开(公告)号:US20080090159A1

    公开(公告)日:2008-04-17

    申请号:US11952283

    申请日:2007-12-07

    IPC分类号: G03F1/00

    摘要: A photomask blank comprising a multilayer film including at least four layers of different compositions, wherein the interface between the layers is moderately graded in composition; a phase shift mask blank comprising a phase shift film of at least two layers including a surface layer of a composition based on a zirconium silicide compound and a substrate adjacent layer of a composition based on a molybdenum silicide compound, and a further layer between one layer and another layer of a different composition, the further layer having a composition moderately graded from that of the one layer to that of the other layer; a phase shift mask blank comprising a phase shift film including a plurality of layers containing a metal and silicon in different compositional ratios which are stacked in such order that a layer having a higher etching rate is on the substrate side and a layer having a lower etching rate is on the surface side. The invention provides a photomask blank, typically a phase shift mask blank, which satisfies optical properties such as transmittance, reflectance and refractive index at an exposure wavelength of interest, and has an etched pattern with a minimal line edge roughness, and a photomask, typically a phase shift mask obtained therefrom.

    摘要翻译: 一种光掩模坯料,其包括包含至少四层不同组成的多层膜,其中所述层之间的界面在组成上适度地分级; 相移掩模坯料,其包括至少两层的相移膜,所述相移膜包括基于硅化锆化合物的组合物的表面层和基于硅化钼化合物的组合物的基底相邻层,以及在层之间的另一层 和另一层不同的组成,所述另一层具有从所述一层到另一层的组成适度分级的组成; 相移掩模坯料,其包括相移膜,所述相移膜包括多个层,所述多个层包含不同组成比的金属和硅,所述多个层按照使得具有较高蚀刻速率的层位于基板侧上的顺序层叠,并且具有较低蚀刻 速率在表面。 本发明提供了一种光掩模坯料,通常是相移掩模坯料,其满足感兴趣的曝光波长下的透光率,反射率和折射率等光学特性,并且具有最小线边缘粗糙度的蚀刻图案,以及光掩模 从其获得的相移掩模。

    Photomask blank, photomask, and method of manufacture
    3.
    发明授权
    Photomask blank, photomask, and method of manufacture 有权
    光掩模坯料,光掩模和制造方法

    公开(公告)号:US07736824B2

    公开(公告)日:2010-06-15

    申请号:US11952283

    申请日:2007-12-07

    IPC分类号: G03F1/00 B32B17/10

    摘要: A photomask blank comprising a multilayer film including at least four layers of different compositions, wherein the interface between the layers is moderately graded in composition; a phase shift mask blank comprising a phase shift film of at least two layers including a surface layer of a composition based on a zirconium silicide compound and a substrate adjacent layer of a composition based on a molybdenum silicide compound, and a further layer between one layer and another layer of a different composition, the further layer having a composition moderately graded from that of the one layer to that of the other layer; a phase shift mask blank comprising a phase shift film including a plurality of layers containing a metal and silicon in different compositional ratios which are stacked in such order that a layer having a higher etching rate is on the substrate side and a layer having a lower etching rate is on the surface side. The invention provides a photomask blank, typically a phase shift mask blank, which satisfies optical properties such as transmittance, reflectance and refractive index at an exposure wavelength of interest, and has an etched pattern with a minimal line edge roughness, and a photomask, typically a phase shift mask obtained therefrom.

    摘要翻译: 一种光掩模坯料,其包括包含至少四层不同组成的多层膜,其中所述层之间的界面在组成上适度地分级; 相移掩模坯料,其包括至少两层的相移膜,所述相移膜包括基于硅化锆化合物的组合物的表面层和基于硅化钼化合物的组合物的基底相邻层,以及在层之间的另一层 和另一层不同的组成,所述另一层具有从所述一层到另一层的组成适度分级的组成; 相移掩模坯料,其包括相移膜,所述相移膜包括多个层,所述多个层包含不同组成比的金属和硅,所述多个层按照使得具有较高蚀刻速率的层位于基板侧上的顺序层叠,并且具有较低蚀刻 速率在表面。 本发明提供了一种光掩模坯料,通常是相移掩模坯料,其满足感兴趣的曝光波长下的透光率,反射率和折射率等光学特性,并且具有最小线边缘粗糙度的蚀刻图案,以及光掩模 从其获得的相移掩模。

    Fabrication method of photomask-blank
    5.
    发明申请
    Fabrication method of photomask-blank 有权
    光掩模坯料的制造方法

    公开(公告)号:US20070092807A1

    公开(公告)日:2007-04-26

    申请号:US11545451

    申请日:2006-10-11

    CPC分类号: G03F1/32 Y10T428/31616

    摘要: A susceptor having the most basic structure has a three-layer structure including a first and a second transparent quartz part and an opaque quartz part sandwiched therebetween. For example, the opaque quartz part is made of “foamed quartz”. In addition, the opacity of the opaque quartz part to flash light is determined to fall within an appropriate range based on the material or thickness of the opaque quartz part, taking into consideration the composition or thickness of a thin film formed on the substrate and various conditions concerning the energy of the irradiation light during flash light irradiation or the like. The stack structure may be composed of a stack of a plurality of opaque quartz layers having different opacities.

    摘要翻译: 具有最基本结构的感受体具有包括第一和第二透明石英部分和夹在其间的不透明石英部分的三层结构。 例如,不透明石英部分由“发泡石英”制成。 此外,考虑到在基板上形成的薄膜的组成或厚度以及各种不同的形状,不透明石英部分对闪光的不透明度被确定为基于不透明石英部分的材料或厚度在适当范围内 关于闪光照射等期间的照射光的能量的条件。 堆叠结构可以由具有不同不透明度的多个不透明石英层的堆叠构成。

    Fabrication method of photomask-blank
    6.
    发明授权
    Fabrication method of photomask-blank 有权
    光掩模坯料的制造方法

    公开(公告)号:US07632609B2

    公开(公告)日:2009-12-15

    申请号:US11545451

    申请日:2006-10-11

    IPC分类号: G03F1/14

    CPC分类号: G03F1/32 Y10T428/31616

    摘要: A susceptor having the most basic structure has a three-layer structure including a first and a second transparent quartz part and an opaque quartz part sandwiched therebetween. For example, the opaque quartz part is made of “foamed quartz”. In addition, the opacity of the opaque quartz part to flash light is determined to fall within an appropriate range based on the material or thickness of the opaque quartz part, taking into consideration the composition or thickness of a thin film formed on the substrate and various conditions concerning the energy of the irradiation light during flash light irradiation or the like. The stack structure may be composed of a stack of a plurality of opaque quartz layers having different opacities.

    摘要翻译: 具有最基本结构的感受体具有包括第一和第二透明石英部分和夹在其间的不透明石英部分的三层结构。 例如,不透明石英部分由“发泡石英”制成。 此外,考虑到在基板上形成的薄膜的组成或厚度以及各种不同的形状,不透明石英部分对闪光的不透明度被确定为基于不透明石英部分的材料或厚度在适当范围内 关于闪光照射等期间的照射光的能量的条件。 堆叠结构可以由具有不同不透明度的多个不透明石英层的堆叠构成。

    Preparation of photomask blank and photomask
    7.
    发明授权
    Preparation of photomask blank and photomask 有权
    光掩模坯料和光掩模的制备

    公开(公告)号:US07514185B2

    公开(公告)日:2009-04-07

    申请号:US11130278

    申请日:2005-05-17

    IPC分类号: G03F1/00

    CPC分类号: G03F1/32 C23C14/0676

    摘要: A photomask blank is prepared by forming a light-absorbing film on a transparent substrate, and irradiating the light-absorbing film with light from a flash lamp at an energy density of 3 to 40 J/cm2. A photomask is prepared by forming a resist pattern on the photomask blank by photolithography, etching away those portions of the light-absorbing film which are not covered with the resist pattern, and removing the resist.

    摘要翻译: 通过在透明基板上形成光吸收膜,并以3〜40J / cm 2的能量密度从闪光灯照射光吸收膜来制备光掩模坯料。 通过光刻法在光掩模坯料上形成抗蚀剂图案,蚀刻除了未被抗蚀剂图案覆盖的光吸收膜的那些部分,并除去抗蚀剂来制备光掩模。

    Photomask blank, photomask, and method of manufacture
    8.
    发明授权
    Photomask blank, photomask, and method of manufacture 有权
    光掩模坯料,光掩模和制造方法

    公开(公告)号:US07329474B2

    公开(公告)日:2008-02-12

    申请号:US10811924

    申请日:2004-03-30

    IPC分类号: G03F1/00 B32B17/06

    摘要: A photomask blank comprising a multilayer film including at least four layers of different compositions, wherein the interface between the layers is moderately graded in composition; a phase shift mask blank comprising a phase shift film of at least two layers including a surface layer of a composition based on a zirconium silicide compound and a substrate adjacent layer of a composition based on a molybdenum silicide compound, and a further layer between one layer and another layer of a different composition, the further layer having a composition moderately graded from that of the one layer to that of the other layer; a phase shift mask blank comprising a phase shift film including a plurality of layers containing a metal and silicon in different compositional ratios which are stacked in such order that a layer having a higher etching rate is on the substrate side and a layer having a lower etching rate is on the surface side. The invention provides a photomask blank, typically a phase shift mask blank, which satisfies optical properties such as transmittance, reflectance and refractive index at an exposure wavelength of interest, and has an etched pattern with a minimal line edge roughness, and a photomask, typically a phase shift mask obtained therefrom.

    摘要翻译: 一种光掩模坯料,其包括包含至少四层不同组成的多层膜,其中所述层之间的界面在组成上适度地分级; 相移掩模坯料,其包括至少两层的相移膜,所述相移膜包括基于硅化锆化合物的组合物的表面层和基于硅化钼化合物的组合物的基底相邻层,以及在层之间的另一层 和另一层不同的组成,所述另一层具有从所述一层到另一层的组成适度分级的组成; 相移掩模坯料,其包括相移膜,所述相移膜包括多个层,所述多个层包含不同组成比的金属和硅,所述多个层按照使得具有较高蚀刻速率的层位于基板侧上的顺序层叠,并且具有较低蚀刻 速率在表面。 本发明提供了一种光掩模坯料,通常是相移掩模坯料,其满足感兴趣的曝光波长下的透光率,反射率和折射率等光学特性,并且具有最小线边缘粗糙度的蚀刻图案,以及光掩模 从其获得的相移掩模。

    Method of fabricating photomask blank
    9.
    发明授权
    Method of fabricating photomask blank 有权
    制造光掩模坯料的方法

    公开(公告)号:US07767368B2

    公开(公告)日:2010-08-03

    申请号:US11882729

    申请日:2007-08-03

    IPC分类号: G03F1/00

    CPC分类号: G03F1/32 G03F1/50

    摘要: An opaque area is formed in a sidewall portion of a susceptor by stacking a material that is transparent to flash light and a material that is opaque to the flash light to form the sidewall portion or coating a surface of the opaque material with the transparent material. A top surface of the opaque area in the sidewall portion of the susceptor is designed to have a predetermined positional relationship with a top surface of a substrate; the top surface of the opaque area is set at the same position as that of the top surface of the substrate or higher than the top surface of the substrate by a predetermined height. Thus, obliquely incident flash light is absorbed or irregularly reflected by the opaque quartz portion, surrounding an excavated portion of the susceptor.

    摘要翻译: 通过堆叠对闪光透明的材料和对闪光不透明的材料以形成侧壁部分或用透明材料涂覆不透明材料的表面,在基座的侧壁部分中形成不透明区域。 基座的侧壁部分中的不透明区域的顶表面被设计成与基板的顶表面具有预定的位置关系; 不透明区域的顶表面设置在与基板的顶表面相同的位置或高于基板的顶表面预定高度。 因此,倾斜入射的闪光被不透明的石英部分吸收或不规则地反射,围绕基座的挖掘部分。

    Method of fabricating photomask blank
    10.
    发明申请
    Method of fabricating photomask blank 有权
    制造光掩模坯料的方法

    公开(公告)号:US20080076040A1

    公开(公告)日:2008-03-27

    申请号:US11882729

    申请日:2007-08-03

    IPC分类号: G03F1/00

    CPC分类号: G03F1/32 G03F1/50

    摘要: An opaque area is formed in a sidewall portion of a susceptor by stacking a material that is transparent to flash light and a material that is opaque to the flash light to form the sidewall portion or coating a surface of the opaque material with the transparent material. A top surface of the opaque area in the sidewall portion of the susceptor is designed to have a predetermined positional relationship with a top surface of a substrate; the top surface of the opaque area is set at the same position as that of the top surface of the substrate or higher than the top surface of the substrate by a predetermined height. Thus, obliquely incident flash light is absorbed or irregularly reflected by the opaque quartz portion, surrounding an excavated portion of the susceptor.

    摘要翻译: 通过堆叠对闪光透明的材料和对闪光不透明的材料以形成侧壁部分或用透明材料涂覆不透明材料的表面,在基座的侧壁部分中形成不透明区域。 基座的侧壁部分中的不透明区域的顶表面被设计成与基板的顶表面具有预定的位置关系; 不透明区域的顶表面设置在与基板的顶表面相同的位置或高于基板的顶表面预定高度。 因此,倾斜入射的闪光被不透明的石英部分吸收或不规则地反射,围绕基座的挖掘部分。