MIS hydrogen sensors
    2.
    发明授权
    MIS hydrogen sensors 有权
    MIS氢传感器

    公开(公告)号:US06935158B2

    公开(公告)日:2005-08-30

    申请号:US10472988

    申请日:2001-03-16

    CPC分类号: G01N33/005

    摘要: Hydrogen gas sensors employ an epitaxial layer of the thermodynamically stable form of aluminum nitride (AlN) as the “insulator” in an MIS structure having a thin metal gate electrode suitable for catalytic dissociate of hydrogen, such as palladium, on a semiconductor substrate. The AlN is deposited by a low temperature technique known as Plasma Source Molecular Beam Epitaxy (PSMBE). When silicon (Si) is used the semiconducting substrate, the electrical behavior of the device is that of a normal nonlinear MIS capacitor. When a silicon carbide (SiC) is used, the electrical behavior of the device is that of a rectifying diode. Preferred structures are Pd/AlN/Si and Pd/AlN/SiC wherein the SiC is preferably 6H—SiC.

    摘要翻译: 氢气传感器采用在具有薄金属栅电极的MIS结构中的作为“绝缘体”的热力学稳定形式的氮化铝(AlN)的外延层,该薄金属栅电极适于在半导体衬底上催化解离氢例如钯。 AlN通过称为等离子体源分子束外延(PSMBE)的低温技术沉积。 当使用硅(Si)半导体衬底时,器件的电气特性是正常非线性MIS电容器的电气特性。 当使用碳化硅(SiC)时,器件的电气特性是整流二极管的电气特性。 优选的结构是Pd / AlN / Si和Pd / AlN / SiC,其中SiC优选为6H-SiC。

    Mis hydrogen sensors
    4.
    发明申请
    Mis hydrogen sensors 有权
    错误氢传感器

    公开(公告)号:US20050074970A1

    公开(公告)日:2005-04-07

    申请号:US10472988

    申请日:2001-03-16

    CPC分类号: G01N33/005

    摘要: Hydrogen gas sensors employ an epitaxial layer of the thermodynamically stable form of aluminum nitride (AlN) as the “insulator” in an MIS structure having a thin metal gate electrode suitable for catalytic dissociate of hydrogen, such as palladium, on a semiconductor substrate. The AlN is deposited by a low temperature technique known as Plasma Source Molecular Beam Epitaxy (PSMBE). When silicon (Si) is used the semiconducting substrate, the electrical behavior of the device is that of a normal nonlinear MIS capacitor. When a silicon carbide (SiC) is used, the electrical behavior of the device is that of a rectifying diode. Preferred structures are Pd/AlN/Si and Pd/AlN/SiC wherein the SiC is preferably 6H—SiC.

    摘要翻译: 氢气传感器采用在具有薄金属栅电极的MIS结构中的作为“绝缘体”的热力学稳定形式的氮化铝(AlN)的外延层,该薄金属栅电极适于在半导体衬底上催化解离氢,例如钯。 AlN通过称为等离子体源分子束外延(PSMBE)的低温技术沉积。 当使用硅(Si)半导体衬底时,器件的电气特性是正常非线性MIS电容器的电气特性。 当使用碳化硅(SiC)时,器件的电气特性是整流二极管的电气特性。 优选的结构是Pd / AlN / Si和Pd / AlN / SiC,其中SiC优选为6H-SiC。