公开(公告)号：US20170184515A1

公开(公告)日：2017-06-29

申请号：US15278470

申请日：2016-09-28

Applicant: Nuctech Company Limited

Inventor： Qingjun ZHANG ,  Yuanjing LI ,  Shuwei LI ,  Ziran ZHAO ,  Weibin ZHU ,  Junxiao WANG ,  Jianhua LI

IPC: G01N23/087 ,  G01T1/20

CPC classification number: G01N23/087 ,  G01N2223/202 ,  G01N2223/501 ,  G01N2223/505 ,  G01T1/2008 ,  G01T1/2018

Abstract: The present application relates to a dual-energy detection method, system and apparatus. The apparatus includes: a first pixel detector array proximal to a ray source, configured to detect ray source photons having relatively low energy; and a second pixel detector array distal from the ray source, configured to detect ray source photons having relatively high energy; wherein the first pixel detector array includes a plurality of rows of first pixel detectors, the first pixel detector including a first sensitive medium, a first photosensitive device, a first incidence plane, and a first window; the second pixel detector array includes a single row of second pixel detectors, the second pixel detector including a second sensitive medium, a second photosensitive device, a second incidence plane, and a second window; and each of the second pixel detectors has the same pixel area as corresponding plurality of first pixel detectors thereof.

公开(公告)号：US20190302281A1

公开(公告)日：2019-10-03

申请号：US16365910

申请日：2019-03-27

Applicant: Nuctech Company Limited

Inventor： Shuwei LI ,  Qingjun ZHANG ,  Xiang ZOU ,  Bozhen ZHAO ,  Junxiao WANG ,  Weibin ZHU ,  Yongqiang WANG ,  Wenjian ZHANG

IPC: G01T1/20 ,  G01T1/22 ,  G01T1/24 ,  G01N23/04 ,  G01B15/02

Abstract: The present disclosure provides a dual-energy detection apparatus and method. The dual-energy detection apparatus includes an X-ray source configured to send a first X-ray beam to an object to be measured; a scintillation detector configured to work in an integration mode, and receive a second X-ray beam penetrating through the object to be measured to generate a first electrical signal; a Cherenkov detector configured to be located behind the scintillation detector, work in a counting mode, and receive a third X-ray beam penetrating through the scintillation detector to generate a second electrical signal; and a processor configured to output image, thickness and material information of the object to be measured according to the first electrical signal and the second electrical signal. The dual-energy detection method provided by the present disclosure may acquire an image of the object to be measured that is clearer and contains more information.

公开(公告)号：US20160187502A1

公开(公告)日：2016-06-30

申请号：US14981953

申请日：2015-12-29

Applicant: TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

Inventor： Kejun KANG ,  Shuwei LI ,  Qingjun ZHANG ,  Yuanjing LI ,  Yulan LI ,  Ziran ZHAO ,  Yinong LIU ,  Yaohong LIU ,  Weibin ZHU ,  Xiaolin ZHAO ,  Huishao HE

IPC: G01T7/00 ,  G01T1/20 ,  G01T1/16 ,  G21K1/02

CPC classification number: G01T7/00 ,  G01T1/1603 ,  G01T1/17 ,  G01T1/2006 ,  G01V5/0016 ,  G06T1/0014 ,  G09G2320/0626 ,  G09G2320/0646 ,  G21K1/02 ,  H01L27/30 ,  H04N5/3698 ,  H04N5/57 ,  H05G1/36

Abstract: The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal of the X-ray beam and a brightness correction signal of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.

Abstract translation: 本发明公开了一种X射线束强度监测装置和X射线检查系统。 X射线束强度监测装置包括强度检测模块和数据处理模块，其中强度检测模块被X射线束照射并发送检测信号，数据处理模块与强度 检测模块，用于接收检测信号并输出​​X射线束强度监测信号，其中X射线束强度监测信号包括X射线束的剂量监测信号和X射线束的亮度校正信号。 X射线束强度监测装置可以同时进行剂量监测和亮度监测，从而提高X射线束强度监测装置的使用效率。 此外，X射线束强度的监测结果可以更准确可靠。