Method and storage device for assessing execution of trim commands
    1.
    发明授权
    Method and storage device for assessing execution of trim commands 有权
    评估修剪命令执行的方法和存储设备

    公开(公告)号:US08996768B2

    公开(公告)日:2015-03-31

    申请号:US13524913

    申请日:2012-06-15

    摘要: A method and storage device for assessing execution of trim commands are provided. In one embodiment, a trace of trim and write commands sent to a storage device are obtained. For each trim command in the trace, a subsequent write command to a same logical block address (LBA) as the trim command is identified, and an elapsed time between the trim and write commands is calculated. This information can be used to display a histogram and/or to optimize when the storage device executes trim commands and/or when the host device issues trim commands.

    摘要翻译: 提供了一种用于评估修剪命令执行的方法和存储装置。 在一个实施例中,获得发送到存储设备的修剪和写入命令的跟踪。 对于跟踪中的每个修剪命令,识别与修剪命令相同的逻辑块地址(LBA)的后续写入命令,并计算修剪和写入命令之间的经过时间。 该信息可用于显示直方图和/或在存储设备执行修剪命令时和/或当主机设备发出修剪命令时进行优化。

    Method and Host Device for Assessing Execution of Trim Commands
    2.
    发明申请
    Method and Host Device for Assessing Execution of Trim Commands 审中-公开
    评估执行修剪命令的方法和主机设备

    公开(公告)号:US20130326161A1

    公开(公告)日:2013-12-05

    申请号:US13524924

    申请日:2012-06-15

    IPC分类号: G06F12/00

    摘要: A method and host device for assessing execution of trim commands are provided. In one embodiment, a trace of trim and write commands sent to a storage device are obtained. For each trim command in the trace, a subsequent write command to a same logical block address (LBA) as the trim command is identified, and an elapsed time between the trim and write commands is calculated. This information can be used to display a histogram and/or to optimize when the storage device executes trim commands and/or when the host device issues trim commands.

    摘要翻译: 提供了一种用于评估修剪命令的执行的方法和主机设备。 在一个实施例中,获得发送到存储设备的修剪和写入命令的跟踪。 对于跟踪中的每个修剪命令,识别与修剪命令相同的逻辑块地址(LBA)的后续写入命令,并计算修剪和写入命令之间的经过时间。 该信息可用于显示直方图和/或在存储设备执行修剪命令时和/或当主机设备发出修剪命令时进行优化。

    Method and Storage Device for Assessing Execution of Trim Commands
    3.
    发明申请
    Method and Storage Device for Assessing Execution of Trim Commands 有权
    评估执行修剪命令的方法和存储设备

    公开(公告)号:US20130326096A1

    公开(公告)日:2013-12-05

    申请号:US13524913

    申请日:2012-06-15

    IPC分类号: G06F13/14

    摘要: A method and storage device for assessing execution of trim commands are provided. In one embodiment, a trace of trim and write commands sent to a storage device are obtained. For each trim command in the trace, a subsequent write command to a same logical block address (LBA) as the trim command is identified, and an elapsed time between the trim and write commands is calculated. This information can be used to display a histogram and/or to optimize when the storage device executes trim commands and/or when the host device issues trim commands.

    摘要翻译: 提供了一种用于评估修剪命令执行的方法和存储装置。 在一个实施例中,获得发送到存储设备的修剪和写入命令的跟踪。 对于跟踪中的每个修剪命令,识别与修剪命令相同的逻辑块地址(LBA)的后续写入命令,并计算修剪和写入命令之间的经过时间。 该信息可用于显示直方图和/或在存储设备执行修剪命令时和/或当主机设备发出修剪命令时进行优化。

    Advanced cell-to-cell inspection
    5.
    发明授权
    Advanced cell-to-cell inspection 有权
    先进的细胞间细胞检查

    公开(公告)号:US07869643B2

    公开(公告)日:2011-01-11

    申请号:US11700408

    申请日:2007-01-31

    IPC分类号: G06K9/00 G06K9/68

    摘要: Inspection of objects such as semiconductor wafers may proceed on a cell-to-cell or die-to-die basis. An image of a wafer may be obtained and the cells or dies shown therein can be inspected using any combination of appropriate die-to-die or cell-to-cell inspection methods. For example, one or more areas may be designated for cell-to-cell inspection. For each cell type, a reference image can be generated by obtaining an image of the area and displacing the image by an amount equal to the repetition vector for that cell type in opposite directions. The displaced images and the original image can be combined into a single reference image. The original image can then be compared to the reference image. In some embodiments, the displaced images are also compared to the reference image to statistically determine the presence or absence of defects.

    摘要翻译: 诸如半导体晶片的物体的检查可以在细胞间或细胞死亡的基础上进行。 可以获得晶片的图像,并且可以使用适当的芯片到芯片或细胞间细胞检查方法的任何组合来检查其中所示的细胞或裸片。 例如,可以将一个或多个区域指定用于细胞到细胞检查。 对于每个单元格类型,可以通过获得该区域的图像并且将图像移位相当于相反方向上该单元格类型的重复向量的量来产生参考图像。 移位图像和原始图像可以组合成单个参考图像。 然后将原始图像与参考图像进行比较。 在一些实施例中,也将移位的图像与参考图像进行比较,以统计确定缺陷的存在或不存在。

    Defect detection through image comparison using relative measures
    7.
    发明授权
    Defect detection through image comparison using relative measures 有权
    通过图像比较使用相对措施进行缺陷检测

    公开(公告)号:US07369236B1

    公开(公告)日:2008-05-06

    申请号:US11590650

    申请日:2006-10-31

    申请人: Erez Sali Oren Cohen

    发明人: Erez Sali Oren Cohen

    IPC分类号: G01B11/00 G01N21/00 G06K9/00

    摘要: Inspection of objects such as semiconductor wafers can include comparisons of shapes between inspection and reference images. As part of the inspection process, relative values may be assigned to pixels within each image based on comparison of such pixels to neighboring pixels. For instance, the pixels may be ranked by relative brightness in each image. Alternatively, directional vectors may be defined based on slopes between pixels and their neighbors. Various comparison metrics may be utilized to determine the degree of correlation between the relative values for pixels in the inspection image and corresponding pixels in the reference image. Relative values may be combined with conventional techniques as part of an inspection process. The inspection may be performed using an optical inspection tool that uses conventional techniques to identify defect candidates, with relative value analysis performed on areas containing defect candidates to confirm or deny the existence of a defect.

    摘要翻译: 检查诸如半导体晶片的物体可以包括检查和参考图像之间的形状的比较。 作为检查过程的一部分,可以基于这些像素与相邻像素的比较将相对值分配给每个图像内的像素。 例如,像素可以通过每个图像中的相对亮度进行排序。 或者,可以基于像素与其邻居之间的斜率来定义方向向量。 可以使用各种比较度量来确定检查图像中的像素和参考图像中的对应像素的相对值之间的相关度。 作为检查过程的一部分,相对值可以与常规技术相结合。 可以使用使用常规技术来识别缺陷候选的光学检查工具进行检查,对包含缺陷候选的区域进行相对值分析以确认或拒绝存在缺陷。

    Method and system for speed dating
    10.
    发明申请
    Method and system for speed dating 审中-公开
    快速约会的方法和系统

    公开(公告)号:US20080228875A1

    公开(公告)日:2008-09-18

    申请号:US11716971

    申请日:2007-03-13

    申请人: Oren Cohen

    发明人: Oren Cohen

    IPC分类号: G06F15/16 G06F3/00

    CPC分类号: G06Q30/08 G06Q50/10

    摘要: This computer software program provides way for people from all over the world of all ages and sex, to participate in a matchmaking experience over the internet in real time. This application includes a graphical user interface which displays a table containing say, ten people (5 pairs per session). It is based on what is known as “blind dating” that takes place in physical locations around the world and is incorporated into the World Wide Web. However, in this program the participants will only see the person they are chatting with, while the other participants remain anonymous until the completion of the first round comprising of an initial chat. The program will use a dating website profile database accordingly to the users who play the game.

    摘要翻译: 该计算机软件程序为来自世界各地的年龄和性别的人们提供了实时的互联网参与体验。 该应用程序包括一个图形用户界面,显示包含说话的表,10个人(每个会话5对)。 它基于所谓的“盲目约会”,发生在世界各地的物理位置,并被并入万维网。 然而,在这个节目中,参与者只能看到他们正在聊天的人,而其他参与者保持匿名,直到第一轮的完成包括初始聊天。 该程序将相应地使用约会网站配置文件数据库给玩游戏的用户。