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公开(公告)号：US11477388B2
公开(公告)日：2022-10-18
申请号：US17545651
申请日：2021-12-08
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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公开(公告)号：US20210112203A1
公开(公告)日：2021-04-15
申请号：US16951297
申请日：2020-11-18
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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3.发明授权公开(公告)号：US10777380B2
公开(公告)日：2020-09-15
申请号：US16653162
申请日：2019-10-15
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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4.发明授权公开(公告)号：US10192714B2
公开(公告)日：2019-01-29
申请号：US15608823
申请日：2017-05-30
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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公开(公告)号：US20180372672A1
公开(公告)日：2018-12-27
申请号：US16013990
申请日：2018-06-21
Applicant: PROTOCHIPS, INC.
Inventor： Franklin Stampley Walden, II , Ian Patrick Wellenius , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner
IPC: G01N27/403
Abstract: An electrochemistry device for electrically measuring a sample during electron microscope imaging includes: a planar chip having a first longitudinal end along which at least three laterally spaced contact electrodes are positioned; a laterally extending working electrode in electrical communication with a first of the three contact electrodes; a counter electrode spaced from and at least partially encircling the working electrode, the counter electrode in electrical communication with a second of the three contact electrodes; and a reference electrode in electrical communication with a third of the three contact electrodes, the reference electrode positioned outside of an area defined between the working electrode and counter electrode.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20180097307A1
公开(公告)日：2018-04-05
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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7.发明申请公开(公告)号：US20170278670A1
公开(公告)日：2017-09-28
申请号：US15608823
申请日：2017-05-30
Applicant: Protochips, Inc.
Inventor： John Damiano, JR. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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公开(公告)号：US20250053594A1
公开(公告)日：2025-02-13
申请号：US18926390
申请日：2024-10-25
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Elizabeth Marusak
IPC: G06F16/535 , G06F16/51 , G06F16/538 , G06F16/58 , G06T1/00 , G06T7/20 , G06T11/60
Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
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公开(公告)号：US11514586B1
公开(公告)日：2022-11-29
申请号：US17817248
申请日：2022-08-03
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US10986279B1
公开(公告)日：2021-04-20
申请号：US16951297
申请日：2020-11-18
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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