摘要:
The phase grating of the present invention includes a substrate with a reflective, continuous layer disposed thereon on which a structured spacer layer 3 of dielectric material is applied. To form a phase grating that can be used as a scale in photoelectric position measuring instruments, a further thin reflective surface layer is located solely on the reflective, continuous surfaces, parallel to the layer, of the structured spacer layer.
摘要:
An interferometer having a light source that generates a beam of light. The beam of light is directed to a beam splitter where it is split into a reference beam and a measuring beam. A pair of reflectors reflect the reference and measuring beams towards an interference point. A beam merging element is positioned at the interference point so that the reference and measuring beams interfere with each other at the interference point so that at least two pairs of partial beams which are phase-shifted in relation to each other and interfere with one another are generated. The two pairs of partial beams are received by a plurality of detectors which form directionally dependent measured values.
摘要:
A polarizing optical arrangement wherein a linearly polarized signal beam cluster is generated. The signal beam cluster is created from interfering partial beam clusters and is linearly polarized. The azimuth of oscillation of the linearly polarized signal beam cluster is dependent on the mutual phase relationship of the aforementioned partial beam clusters. A splitter grating splits the linearly polarized signal beam cluster into partial beam clusters that are analyzed by analyzers, detected by photoelectric transducers and phase-shifted electrically from one another.
摘要:
An optical assembly of an interferometer that includes a beam splitter for dividing the beams emitted by a radiation source into at least one measuring and one reference beam and at least one measuring and one reference mirror, on which the measuring and the reference beams impinge, wherein at least one of the mirrors can be displaced along a measuring axis. The optical assembly further includes a beam deflector, as well as a retro-reflector, wherein the measuring and the reference beams reflected at the measuring and the reference mirrors via the beam deflector and the retro-reflector are guided at least a second time in the direction toward the measuring and the reference mirrors and wherein the beam deflector is embodied as a plane-parallel plate.
摘要:
A beam splitter assembly and an interferometer using the beam splitter assembly are described. The beam splitter assembly splits an incoming beam of rays that impinges thereon into at least one first outgoing beam and at least one second outgoing beam parallel thereto. To accomplish this, the beam splitter assembly includes a beam splitter element and a compensating element. The beam splitter element includes a transparent plate having two parallel boundary surfaces. The compensating element is arranged with respect to the beam splitter element so that the two outgoing beams propagate parallel to one another, and have essentially traveled the same optical path lengths in the beam splitter element as in the compensating element.
摘要:
A position measuring system for the determination of the relative positions of two objects which can be moved with respect to each other, as well as a process for operating the same are disclosed, which in case of a relative movement provides at least one pair of phase-shifted analog incremental signals, and which makes possible a definite variation of the signal periods (SP) by at least one signal period variation factor (n) of the analog incremental signals transmitted to an evaluation unit arranged behind it by a signal period variation unit. The signal period variation unit furthermore comprises correction means for eliminating most varied errors in the output signals (SIN′, COS′). Among these are counted errors possibly resulting during the signal period variation, as well as measurement arrangement-specific errors.
摘要:
An integrated optical interferometer is provided having a substrate located on one object and a measuring reflector or measuring diffraction grating located on another object. A beam impinging upon the substrate is split into two partial beams by a coupling grating and is coupled into a beam waveguide and supplied to another coupling grating. A second partial beam is routed by the measuring reflector to the second coupling grating and there interferes with the first partial beam. The second coupling grating is divided into a plurality of gratings which are phase-shifted with respect to each other so that signals that are phase-shifted with respect to each other can be generated by a plurality of detectors.
摘要:
A position-measuring device for determining the positions of two objects movable with respect to each other along a measuring direction includes a first radiation source for emitting an electromagnetic beam of rays, a beam splitter, which splits each beam of rays emitted by the radiation source into at least one first and one second partial beam of rays, a reference reflector arranged in the beam path of the first partial beam of rays, a measuring reflector, movable with respect to the reference reflector along the measuring direction, which is arranged in the beam path of the second partial beam of rays, a device for superposing the two partial rays of beams after their reflecting at the respective reflector, for generating a measuring signal, a second radiation source for emitting additional electromagnetic beams of rays and a combining device for combining the additional electromagnetic beams of rays into the beam path of the electromagnetic beam of rays generated by the first radiation source. In the position-measuring device, a detection device is arranged such that it receives a reference signal formed by superposition of the beams of rays emitted by the first radiation source and the additional beams of rays, and an evaluation device is assigned to the detection device, which is equipped and provided for evaluating the reference signal formed by the superposition of the beams of rays of the two radiation sources for generating a reference pulse.
摘要:
A position measuring system for the determination of the relative positions of two objects which can be moved with respect to each other, as well as a process for operating the same are disclosed, which in case of a relative movement provides at least one pair of phase-shifted analog incremental signals, and which makes possible a definite variation of the signal periods (SP) by at least one signal period variation factor (n) of the analog incremental signals transmitted to an evaluation unit arranged behind it by a signal period variation unit. The signal period variation unit furthermore comprises correction means for eliminating most varied errors in the output signals (SIN', COS'). Among these are counted errors possibly resulting during the signal period variation, as well as measurement arrangement-specific errors.
摘要:
A position measuring apparatus includes an optical instrument placed in a first plane, a first diffraction grid placed in a second plane, parallel to the first plane, a retro-reflecting element, a second diffraction grid, and an optical element, preferably placed in the first plane. The optical instrument splits a beam of light into at least two divergent partial beams which are diffracted by the first diffraction grid into parallel partial beams. The parallel partial beams are conducted through the retro-reflecting element and then impinge onto the second diffraction grid. The second diffraction grid diffracts the partial beams and causes them to interfere with each other at the optical element. A detection device measures a change (.DELTA.OPD) of path difference of the partial beams which is directly proportional to the change in distance between the first and second planes. This change (.DELTA.OPD) of the path difference can be detected by the detection device as a light-dark modulation at the optical element.