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    Systems and methods for phase measurements
    3.
    发明授权
    Systems and methods for phase measurements 有权
    相位测量的系统和方法

    公开(公告)号：US08334982B2

    公开(公告)日：2012-12-18

    申请号：US12494605

    申请日：2009-06-30

    申请人： Christopher Fang-Yen ,  Gabriel Popescu ,  Changhuei Yang ,  Adam Wax ,  Ramachandra Dasari ,  Michael Feld

    发明人： Christopher Fang-Yen ,  Gabriel Popescu ,  Changhuei Yang ,  Adam Wax ,  Ramachandra Dasari ,  Michael Feld

    IPC分类号： G01B11/02

    CPC分类号： G01B9/02091 ,  A61B5/14532 ,  A61B5/1455 ,  A61B5/7232 ,  G01B9/02002 ,  G01B9/02007 ,  G01B9/02011 ,  G01B9/02057 ,  G01B9/02063 ,  G01B9/02067 ,  G01B9/02069 ,  G01B9/02071 ,  G01B9/02072 ,  G01B9/02078 ,  G01B9/02083 ,  G01B9/0209 ,  G01B2290/45 ,  G01B2290/60 ,  G01B2290/70 ,  G01J9/04 ,  G01N21/45

    摘要： Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active stabilization and differential measurement. Embodiment are directed to optical devices for imaging small biological objects with light. These embodiments can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code. The structure and dynamics of sub-cellular constituents cannot be currently studied in their native state using the existing methods and technologies including, for example, x-ray and neutron scattering. In contrast, light based techniques with nanometer resolution enable the cellular machinery to be studied in its native state. Thus, preferred embodiments of the present invention include systems based on principles of interferometry and/or phase measurements and are used to study cellular physiology. These systems include principles of low coherence interferometry (LCI) using optical interferometers to measure phase, or light scattering spectroscopy (LSS) wherein interference within the cellular components themselves is used, or in the alternative the principles of LCI and LSS can be combined to result in systems of the present invention.

    摘要翻译： 本发明的优选实施例涉及用于相位测量的系统，其使用多种策略的组合来解决相位噪声问题，包括但不限于公共路径干涉测量，相位参考，主动稳定和差分测量。 实施例涉及用于用光成像小生物物体的光学装置。 这些实施方案可以应用于例如细胞生理学和神经科学领域。 这些优选实施例基于相位测量和成像技术的原理。 使用相位测量和成像技术的科学动机源于例如亚微米级别的细胞生物学，其可以包括但不限于成像发育异常起源，细胞通讯，神经元传播和遗传密码的实现。 亚细胞组分的结构和动力学目前不能使用现有的方法和技术（例如x射线和中子散射）在其天然状态下研究。 相比之下，具有纳米分辨率的基于光的技术使得能够以其天然状态研究细胞机械。 因此，本发明的优选实施例包括基于干涉测量和/或相位测量的原理的系统，并且用于研究细胞生理学。 这些系统包括使用光学干涉仪来测量相位的低相干干涉测量（LCI）原理，或使用其中使用细胞部件本身内部的干扰的光散射光谱（LSS），或者替代地，LCI和LSS的原理可以组合以产生 在本发明的系统中。

    Real-time scanner-nonlinearity error correction for HDVSI
    4.
    发明授权
    Real-time scanner-nonlinearity error correction for HDVSI 有权
    HDVSI的实时扫描仪 - 非线性误差校正

    公开(公告)号：US07898672B1

    公开(公告)日：2011-03-01

    申请号：US12082846

    申请日：2008-04-15

    申请人： Dong Chen

    发明人： Dong Chen

    IPC分类号： G01B11/02

    CPC分类号： G01B9/02079 ,  G01B9/02071 ,  G01B9/02083 ,  G01B9/0209 ,  G01B11/2441

    摘要： An error correction for scanner position is implemented by adjusting the filter parameters of the quadrature demodulation module of an HDVSI algorithm using a reference signal from an independent position measurement device (PMD). The step size generated by the PMD at each scanner step is substituted for the nominal scanner step in the quadrature demodulation algorithm calculating phase and in the coherent envelope algorithm calculating peak. This substitution eliminates all errors produced by scanner nonlinearities. Furthermore, over the large number of steps carried out during a normal scanning range, random scanner-position errors (such as produced by vibration and other system noise) are automatically corrected by integration over their normal distribution around the noise-free position value. Therefore, a complete correction of scanner-position error may be achieved using the reference signal.

    摘要翻译： 通过使用来自独立位置测量装置（PMD）的参考信号调整HDVSI算法的正交解调模块的滤波器参数来实现扫描器位置的纠错。 由PMD在每个扫描步骤产生的步长代替正交解调算法计算阶段中的标称扫描步长，以及相干包络算法计算峰值。 此替代消除了扫描仪非线性产生的所有错误。 此外，在正常扫描范围内执行的大量步骤中，通过在其无噪声位置值周围的正态分布上的积分自动校正随机扫描仪位置误差（例如由振动和其他系统噪声产生的）误差。 因此，可以使用参考信号来实现扫描仪位置误差的完全校正。

    System and Method for Optical Coherence Tomography
    5.
    发明申请
    System and Method for Optical Coherence Tomography 有权
    光学相干断层扫描的系统和方法

    公开(公告)号：US20100091295A1

    公开(公告)日：2010-04-15

    申请号：US12527287

    申请日：2008-02-20

    申请人： Rainer Nebosis ,  Rainer Scheunemann ,  Edgar-Gerald Kopp

    发明人： Rainer Nebosis ,  Rainer Scheunemann ,  Edgar-Gerald Kopp

    IPC分类号： G01B9/02

    CPC分类号： G01B9/02012 ,  G01B9/02002 ,  G01B9/02063 ,  G01B9/02071 ,  G01B9/02072 ,  G01B9/02091

    摘要： The invention relates to a system and to a corresponding method for optical coherence tomography having an interferometer (10) for emitting light with which a specimen (1) is irradiated, the interferometer (1) comprising a beam splitter (13) and at least one reflector (12) the optical distance (I) of which from the beam splitter (13) is changeable, and a detector (30) which has a plurality of detector elements arranged in an area by means of which the light which is reflected by the specimen (1) is collected.In order to simplify and speed up the recording of three-dimensional images of the specimen (1) provision is made such that the optical distance (I) between the reflector (12) and the beam splitter (13) is changed by an optical path (L) which is substantially greater than an average wavelength (λ0) of light (14) which is injected into the interferometer (10): L>>λ0, during the change of the optical distance (I) between the reflector (12) and the beam splitter (13) by the optical path (L) the light reflected by the specimen (1) being collected a number of times by the detector elements of the detector (30), by means of which the light reflected by a number of two-dimensional sections at different depths of the specimen (1) is collected.

    摘要翻译： 本发明涉及一种用于光学相干断层摄影的系统和相应的方法，该方法具有用于发射照射样本（1）的光的干涉仪（10），包括分束器（13）的干涉仪（1）和至少一个 反射器（12），来自分束器（13）的光学距离（I）可以改变;以及检测器（30），其具有多个检测器元件，所述检测器元件布置在通过该区域反射的光的区域中， 收集样品（1）。 为了简化和加快样本的三维图像的记录（1），提供反射器（12）和分束器（13）之间的光学距离（I）由光路 （L），其在反射器（12）之间的光学距离（I）的改变期间基本上大于注入到干涉仪（10）中的光（14）的平均波长（λ0）：L >>λ0 并且通过光路（L）的分束器（13）被检体（1）反射的光被检测器（30）的检测器元件收集多次，通过该检测器元件反射数量 收集样品（1）不同深度的二维截面。

    Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device
    6.
    发明申请
    Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device 有权

    公开(公告)号：US20060262315A1

    公开(公告)日：2006-11-23

    申请号：US11431182

    申请日：2006-05-09

    申请人： Erwin Spanner

    发明人： Erwin Spanner

    IPC分类号： G01B9/02

    CPC分类号： G01D5/26 ,  G01B9/02007 ,  G01B9/02012 ,  G01B9/02071 ,  G01B9/0209 ,  G01B2290/15 ,  G01B2290/30 ,  G01B2290/45 ,  G01D5/366

    摘要： A position-measuring device for determining the positions of two objects movable with respect to each other along a measuring direction includes a first radiation source for emitting an electromagnetic beam of rays, a beam splitter, which splits each beam of rays emitted by the radiation source into at least one first and one second partial beam of rays, a reference reflector arranged in the beam path of the first partial beam of rays, a measuring reflector, movable with respect to the reference reflector along the measuring direction, which is arranged in the beam path of the second partial beam of rays, a device for superposing the two partial rays of beams after their reflecting at the respective reflector, for generating a measuring signal, a second radiation source for emitting additional electromagnetic beams of rays and a combining device for combining the additional electromagnetic beams of rays into the beam path of the electromagnetic beam of rays generated by the first radiation source. In the position-measuring device, a detection device is arranged such that it receives a reference signal formed by superposition of the beams of rays emitted by the first radiation source and the additional beams of rays, and an evaluation device is assigned to the detection device, which is equipped and provided for evaluating the reference signal formed by the superposition of the beams of rays of the two radiation sources for generating a reference pulse.

    Single and double superimposing interferometer systems
    9.
    发明授权
    Single and double superimposing interferometer systems 失效
    单和双重叠加干涉仪系统

    公开(公告)号：US6115121A

    公开(公告)日：2000-09-05

    申请号：US963682

    申请日：1997-10-31

    申请人： David J. Erskine

    发明人： David J. Erskine

    IPC分类号： G01B9/02

    CPC分类号： G01J3/453 ,  G01B9/02028 ,  G01B9/02038 ,  G01B9/02045 ,  G01B9/02071 ,  G01B9/0209 ,  G01B2290/25 ,  G01B2290/35 ,  G01B2290/70

    摘要： Interferometers which can imprint a coherent delay on a broadband uncollimated beam are described. The delay value can be independent of incident ray angle, allowing interferometry using uncollimated beams from common extended sources such as lamps and fiber bundles, and facilitating Fourier Transform spectroscopy of wide angle sources. Pairs of such interferometers matched in delay and dispersion can measure velocity and communicate using ordinary lamps, wide diameter optical fibers and arbitrary non-imaging paths, and not requiring a laser.

    摘要翻译： 描述了可以在宽带未延迟的光束上印记相干延迟的干涉仪。 延迟值可以独立于入射光线角度，允许使用来自诸如灯和光纤束之类的常见扩展源的未经准直的光束进行干涉测量，并促进广角光源的傅立叶变换光谱。 这种在延迟和分散度上匹配的这种干涉仪的对可以测量速度并使用普通灯，宽直径光纤和任意非成像路径进行通信，并且不需要激光。

    SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS
    10.
    发明申请
    SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS 审中-公开

    公开(公告)号：US20190187660A1

    公开(公告)日：2019-06-20

    申请号：US16218902

    申请日：2018-12-13

    申请人： MITUTOYO CORPORATION

    发明人： Shinichiro YANAKA ,  Masayuki NARA

    IPC分类号： G05B19/401 ,  G01B9/02

    CPC分类号： G05B19/401 ,  G01B9/02071 ,  G01B9/02072 ,  G05B2219/39033 ,  G05B2219/50057

    摘要： A spatial accuracy correction apparatus performs a spatial accuracy correction of a positioner displacing a displacer to a predetermined set of spatial coordinates using a measurable length value measured by an interferometer and a measurable value of the set of spatial coordinates of the displacement body that is measured by the positioner. The measured length value and the measured value for each measurement point are acquired by displacing the displacement body to a plurality of measurement points in order, one or more repeated measurements are conducted for at least one of the plurality of measurement points being measured after conducting measurement of the measured length value and the measured value for each of the plurality of measurement points, and the plurality of points are measured again when a repeat error of the measured length value is equal to or greater than a threshold value.